Nova afm software

Changes in surface morphology of paper samples were analyzed by Atomic force microscope (AFM) Solver PRO (NT-MDT, Moscow, Russia) in non-contact mode in air. Samples were cut into small pieces, and the surface was scanned by a standard Si cantilever with a force constant of 22 Nm⁻¹ and at a resonance frequency of 325 kHz. The cantilever’s tip radius was 10 nm, the tip length was 95 µm, and the scan rate was set at 1.2 Hz. Every measurement was repeated at least five times. Average surface roughness (Sa) was measured from representative images on 5 × 5, 2 × 2, and 1 × 1 µm² areas with the Nova AFM software (NT-MDT, Moscow, Russia). Paper 2 in untreated state was too rough to be analyzed with our AFM device.

Changes in surface morphology of tubes were analyzed by Atomic Force Microscope Solver PRO (NT-MDT, Moscow, Russia) in tapping mode in air. Samples were cut in small pieces and the inner surface was scanned by a standard Si cantilever with a force constant of 22 N m⁻¹ and at a resonance frequency of 325 kHz. The cantilevers’ tip radius was 10 nm, the tip length was 95 µm and the scan rate was set at 1.3 Hz. Every measurement was repeated at least 5 times. Average surface roughness (Sa) was measured from representative images on 10 × 10, 5 × 5, 2 × 2, and 1 × 1 µm² areas with the Nova AFM software (NT-MDT, Moscow, Russia). Only 1 × 1 area results are shown in Table 3. Prior to this study, treatment parameters were optimized and AFM measurements were performed on different depths of gaseous plasma treated tube to confirm that treatment effects are even.