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16 protocols using ols5000

1

Characterization of Polymer Composite Films

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Dynamic light scattering (DLS) (Malvern Zetasizer Nano ZSP) was used to measure the average diameter and zeta potential of the PU, PU/PEI and PU/PMANa colloidal dispersions.
UV-vis diffuse reflectance spectroscopy (UV-Vis) (Lambda 1050) was performed to measure the visible light (400 nm–800 nm) transmittance of PU/PEI and PU/PMANa films in the dry and wet states. Tensile tests were conducted with a universal mechanical tester (UMT)
(T1377, Center for Tribology Inc.) at a speed of 2 mm/s using a 10 kg load cell. 180-degree peeling tests were completed with UMT at a speed of 0.5 mm/s using a 1 kg load cell. A backing Scotch tape with 19 mm width was adhered on samples for peeling. Scratch tests were performed with UMT by using a 1 mm diameter stainless steel ball indenter that was fixed on a 10 kg load cell. The indenter was moved horizontally along the film surface for 20 mm at 0.5 mm/s while the normal force linearly increased from 2 g to 5000 g. A digital microscope (AD4113ZT, Dino-Lite) was used to observe the scratch track. A 3D laser microscope (OLS5000, Olympus) was applied to measure the thickness of PU/PEI and PU/PMANa coatings on PU film. The morphology of PU/PEI and PU/PMANa films was observed using a SEM (ZEISS Ultra) at 10 kV accelerating voltage. 5 μL of DI water was used for measuring the water contact angle of PU/PEI and PU/PMANa films.
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2

Wear Scar Topography Analysis

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After the wear experiment, the samples were photographed with an OLS5000 laser confocal microscope (Olympus Corporation, Japan) to analyze the 3D topography and profile of the wear scar, and the wear scar morphology under different DOCs was observed.
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3

Laser-Textured Cell Culture Dish Analysis

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The morphologies of the laser-textured culture dishes were investigated using a scanning electron microscope (SEM, Inspect F50, FEI Company, Hillsboro, OR, USA). The samples were mounted onto stubs and coated with gold with the use of a sputter coater for 5 min. The laser-textured cell culture dishes were examined with the use of a three-dimensional (3D) laser confocal scanning microscope (OLS5000, Olympus, Japan). Elemental compositions that might have changed owing to laser ablation on the surface were investigated using X-ray photoelectron spectroscopy (Sigma Probe, Thermo VG Scientific, UK) to identify the differences before and after laser texturing.
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4

Corrosion Analysis of AZ91 Magnesium Alloy

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The surface and cross-section morphology of the corroded samples was observed by scanning electron microscope (SEM, Regulus 8100, HITACHI, Tokyo, Japan), energy dispersive spectrometer (EDS), metallographic microscope (Axio Vert.A1, Hanover, Germany), and laser confocal scanning microscopy (LCSM, OLS5000, Olympus, Tokyo, Japan). Phase composition was analyzed by X-ray diffraction (XRD, Ultime IV, Rigaku, Tokyo, Japan) with a Cu target and a monochromator, at 40 kV and 150 mA with a scanning rate of 10°/min and a step size of 0.02°. The element types and valence states of the corrosion products were analyzed by X-ray photoelectron spectroscopy (XPS, ESCALAB 250Xi, Thermo, Waltham, MA, USA).
The corrosion products were removed using 200 g/L CrO3 + 10 g/L AgNO3 immersed for 5–10 min at 25 °C, and then the samples were rinsed with distilled water and alcohol, dried for 24 h, and weighted. The samples before and after exposure were weighed using an analytical balance with an accuracy of 0.1 mg.
The corrosion rate of AZ91 magnesium after exposure for different duration was calculated using the equation as follows:
In the above formula, v is the corrosion rate of AZ91 Mg alloys. w0 and w1 are the initial and final mass (after removing the corrosion products), respectively. S represents the surface area. T is the exposure time, and ρ is the density of AZ91 Mg alloy.
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5

Polishing Dimple-Microtextured Copper Substrate

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The dimple-microtextured copper substrate was polished using 1 µm polishing paste for 1 min at 50 rpm to remove any resolidified material on the copper substrate. The surface morphology and roughness of the dimple-microtextured surface copper substrate were then imaged using a 3D measuring laser microscope (Model Olympus OLS5000, Shinjuku, Japan).
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6

Characterization of Coated Surfaces

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The microstructure of the coating surfaces was studied using scanning electron microscopy (SEM, ZEISS MERLIN Compact SEM, operated at a 20 kV acceleration voltage, Carl Zeiss Jena, Germany), and the surface roughness was measured with a laser confocal microscope (LCM, OLS5000, Olympus, Japan). The chemical modification and the end group changes on the surfaces was studied by Fourier transform infrared spectroscopy (FTIR, Nicolet iS50, Thermo Scientific, USA). The contact angles were measured at room temperature with an optical contact angle meter (DropMeterTM Element A-60, Maist, Ningbo, China), where the static CAs of the droplets (6 µL) placed onto the surfaces were measured five times at different locations.
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7

Detailed Bone Tunnel Analysis

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Twenty bone blocks (10 bone blocks for each device) were cut in half along the bone tunnel, remaining on the wall of the longer side. Photos of the tunnel wall were taken with the 3D laser confocal microscope (OLS5000, Olympus, Tokyo) and were assessed using the OLS5000 Analysis application (ver. 1.2.1.116, Olympus). Surface roughness of a 1.6 × 1.6 mm square at three areas at 2.4 mm intervals was calculated, whereas longitudinal and transverse linear roughness were also assessed on the center line of each side of the 1.6 × 1.6 mm square. (Fig. 4).

Roughness of tunnel wall was assessed at three areas. Drill and US device were moved from the upper side to the lower side

The remaining 20 samples were scanned using Scan Xmate-L090 (Comscantecno, Yokohama, Japan) with a voxel size of 21.47 μm. CSA of the tunnel was measured at three planes (at 24, 64, and 104 mm from the entrance of the tunnel) with ImageJ 1.50i, and the ratio of the measured CSA was calculated based on an expected CSA as the CSA ratio. (rectangular tunnel was 4 × 5 = 20 mm2; round tunnel was 2.5 × 2.5 × 3.14 = 19.625 mm2).
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8

Characterization of Printed Silver Electrodes

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The contact angles of substrate were measured by optical contact angle measurement (Biolin Theta, Espoo, Helsinki, Finland). The surface morphology was investigated by scanning electron microscopy (Nova nanosem 430, Hillsboro, Oregon, USA) and confocal laser microscopy (Olympus OLS 5000, Shinjuku-ku, Tokyo, Japan). X-ray photoelectron spectroscopy (XPS) was carried out on a X-ray photoelectron spectrometer (ThermoFisher ESCALAB XI+, Pudong New Area, Shanghai, China). Energy-dispersive X-ray spectrometry (EDS) was used to analyze the change of the microscopic particle distribution and composition of the silver electrode film after annealing. To investigate the electrical performance, the electrical conductivity of a silver electrode based on EHD printing was measured using a semiconductor parameter tester (Primarius FS-Pro, Pudong New Area, Shanghai, China). The test voltage range was 0–3 V and the step size was 0.1 V. The calculation formula of conductivity is as follows:
where R is the volt–ampere characteristics measured by a semiconductor parameter instrument and obtained by linear fitting; L is the electrode length fixed at 1 mm; and S is the cross-sectional area of the electrode measured by a confocal laser microscope.
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9

Selective Laser Ablation of Thin Films

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Characterization involved studies of damage to a PLA film (thickness: 50 µm) when ablating a top layer of Si (thickness: 500 nm) and damage to a Si membrane (thickness: 500 nm) when ablating a top layer of Mg (thickness: 300 nm). In both cases, after completely removing the top layer by ablation in a square pattern (5 mm × 5 mm), the samples were characterized using a 3D laser scanning microscope (OLS 5000; Olympus Corp., Tokyo, Japan) to obtain the thickness of the ablated surface region Tab. The difference between Tab and the thickness of top layer (Ttop) represented a useful metric to define the selectivity of the ablation process to the top layer.
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10

Morphological Analysis of Freeze-Dried Samples

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The specimens were gently rinsed with normal saline at room temperature and then freeze-dried. Briefly, the samples were sequentially refrigerated at 4°C for 30 min, −20°C for 12 h, and −80°C for 7 days. The freeze-drying apparatus (FD-1A-50, BiLon, Beijing) was used to prepare the samples for 24 h. After spraying gold, the morphology of the cutting surface was observed by scanning electron microscopy (SEM) (S-3400N, HITACHI, Japan). The surface roughness of the samples was examined by using a 3D laser confocal scanning microscope (OLS5000, Olympus, Japan), and the results were analyzed by multifile analyzer software. The surface roughness was measured for six different specimens, and the average values were recorded.
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