S 3400n scanning electron microscope
The S-3400N is a scanning electron microscope (SEM) manufactured by Hitachi. As an SEM, its core function is to produce high-resolution images of sample surfaces by scanning them with a focused beam of electrons. The S-3400N is designed to provide a wide range of magnification capabilities and high-quality imaging performance.
Lab products found in correlation
169 protocols using s 3400n scanning electron microscope
Scanning Electron Microscopy of Atherosclerotic Aorta
Stomatal Closure Imaging in Poplar Leaves
Microscopic Examination of 2017A Alloy
Bone Resorption Assay with RAW 264.7 Cells
SEM Examination of Leaf Micromorphology
Scanning Electron Microscopy Analysis of MPs Gel
Scanning Electron Microscopy of Leaf Ultrastructure
Specimens were mounted on aluminum stubs with carbon double-sided adhesive disks, coated with gold/palladium in a SC7640 sputter coater (Quorum Technologies Ltd, Newhaven, U.K.) and examined under a S-3400N scanning electron microscope (Hitachi High-Technologies Corporation, Tokyo, Japan) at an accelerating voltage of 5 kV.
Concrete Rebar Microstructure Analysis
Advanced tests on the specimen structure at selected points were performed with HITAHI S-3400N scanning electron microscope (SEM) (Hitachi, Tokyo, Japan) at an accelerating voltage within the range of 15–25 kV. Tests on chemical composition at selected micro-areas of the specimens were performed with the energy dispersive spectroscopy (EDS) using the spectrometer by THERMO NORAN company with SYSTEM SIX software (Thermo Fisher Scientific Inc., Waltham, MA, USA). As microscopic tests are invading into the structure of the specimen material, they were performed after the final stage of electrochemical tests. Therefore, those tests should be only related to results obtained after the last, 792 day of measurements.
Microstructural Analysis of RFSSW Specimens
Crystallization and Characterization of Oxalates
Samples were analyzed by powder X-ray diffraction using Rigaku Miniflex II and Hitachi S3400N Scanning Electron Microscope (SEM) (The analysis was performed at the Department of Chemical Engineering, University of the Philippines Diliman, Quezon City, Philippines). Magnification and electron beam voltage were adjusted accordingly.
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