Hyperion 2000 ir microscope

Spectro-microscopic measurements of carbohydrate, protein and fat fingerprint regions of LP and RH were achieved by a recently used procedure²⁰ . The measurements were made by synchrotron radiation (SR)-FTIR micro-spectroscopy (Hyperion 2000IR microscope coupled with VERTEX70 spectrometer, Bruker Optics, Germany) at beamline 4.1 at the Synchrotron Light Research Institute (SLRI), Nakhon Ratchasima 30,000, Thailand. The Samples were completely dried and grounded. Spectra collection were performed using OPUS8.0 software (Bruker Optics, Germany). Spectra acquisition were obtained with 36X objective lens using the transmission mode. All spectra were record from 4000 to 400 cm⁻¹ with diamond compression cell at an aperture size of 20 × 20 µm; spectral resolution of 4 cm⁻¹; 64 scans for background and sample.

Fabrication of our structures starts with commercial SOI wafers consisting of 500 μm thick highly doped handle layer silicon substrate at the bottom with resistivity range of ρ = 0.002–0.005 Ω-cm, 800 nm thick silicon dioxide in the middle and 2 μm thick highly doped device layer silicon at the top with resistivity range of ρ = 0.001–0.0015 Ω-cm. We first thinned the device layer silicon from 2 μm to 1.2 μm by using an SF₆ based isotropic RIE process. After thinning the device layer of the SOI to the desired thickness of 1.2 μm, we used standard photolithography procedures to define the desired patterns. First, we spun a positive photoresist (AZ 5214E) at 4000 r.p.m. and baked the photoresist at 110 °C for 50 seconds. Then, we exposed the photoresist with a contact aligner and developed the photoresist with DI water diluted AZ 400 K developer. Using a BOSCH process recipe that is SF₆ based RIE at the etch step, and C₄F₈ based deposition at the passivation step, the 1.2 μm thick Si is patterned till the 800 nm silicon dioxide surface is reached. Then, the remaining photoresist is removed by an oxygen plasma cleaning recipe. In order to measure the reflection of the fabricated structures, Bruker HYPERION 2000 IR microscope and Bruker Vertex 70 v Fourier transform infrared (FTIR) spectrometer are used. The measurements are referenced to a gold-coated flat silicon mirror.

Infrared optical measurements were performed with a Bruker Hyperion 2000 IR microscope (Schwarzschild-objective with 15× magnification, NA = 0.4) coupled to a Fourier-transform Bruker Vertex 80v spectrometer with a liquid-nitrogen-cooled mercury cadmium telluride detector. Reflection and transmission spectra were collected at normal incidence from a sample area of about 80 × 80 μm² with 2 cm⁻¹ resolution. All spectra were obtained with CaF₂ IR polarizer in two principle orientations with the electric field polarization parallel and perpendicular to the nanorods long axis. A plane gold mirror was used as a reference in the reflection configuration experiment. Broad band absorption spectra were calculated from the measured reflection and transmission spectra. Reflection spectra in visible spectrum range were collected at normal incidence using a 20× magnification objective (Nikon, NA = 0.45), directed to a fiber-coupled spectrometer and normalized with reflection from a standard dielectric-coated silver mirror.

The SIRM spectra of the retinal samples were acquired using the Infrared Microspectroscopy (IRM) beam line at the Australian Synchrotron (Clayton, VIC, Australia). Measurements were taken on a Bruker Vertex V80v FTIR spectrometer coupled to a Hyperion 2000 IR microscope controlled via Bruker Opus 7.0 software (Bruker Optic, Etlingen, Germany). To reduce the influence of water in the air, the chamber was connected to a purging system. An aperture of 10 μm x 10 μm was selected to acquire a single spectrum. SIRM spectra were acquired in transmission mode with a spectral resolution of 4 cm^-1 across a spectral range of 4000 to 600 cm^-1, with 64 scans per spectrum. The recorded spectra were first processed with rubber band baseline correction, which was then followed by normalization to the amide I peak using Bruker OPUS 7.2 software (Bruker Optics) as has been described [18 (link)].

Five microliters of mycelia suspension were placed on a calcium fluoride (CaF₂) window for synchrotron radiation-based Fourier transform infrared (FTIR) microspectroscopy investigation. The CaF₂ windows were dried in a class II biological safety cabinet (BSC) for 30 min and kept in the desiccator until FTIR investigations to avoid the influence of water absorption on the infrared spectra. FTIR spectra were acquired using a Hyperion 2000 IR microscope coupling with a Vertex 70 spectrometer (BRUKER Optics GmbH, Ettlingen, Germany). The internal light source was replaced by synchrotron light delivered from the front-end of Beamline 4.1: IR at Synchrotron Light Research Institute (Thailand). The spectra were recorded in transmission mode using a 15x objective, 64 accumulations per sample, a spectral resolution of 4 cm^− 1, and a spectral range of 4000–900 cm^− 1. Before the samples were measured, the background spectrum of the CaF₂ window was recorded and then subtracted from the sample signal. Pre-processing of infrared spectra included the region 4000–900 cm^− 1, all spectral data were extracted by OPUS software (version 7.2, Bruker Optics GmbH, Ettlingen, Germany).

Solvated Sm@C₉₀ microrods were prepared on a glass substrate by evaporating a saturated Sm@C₉₀/m-xylene solution at room temperature. The samples were solvated crystals which have been characterized by IR and Raman. The solvated and pristine Sm@C₉₀ were loaded separately in 100 μm diameter hole drilled in the T301 stainless steel gasket that was compressed in a diamond anvil cell (DAC). The pressure was calibrated by the ruby fluorescence technique. For the IR measurements, KBr was used as pressure medium and no pressure medium was used in the Raman measurements. The Raman spectra were recorded using a Renishaw 1000 notch filter spectrometer equipped with 514 nm exciting laser. The IR spectra was collected in transmission mode by a Bruker Vertex 80 v FTIR spectrometer and Hyperion 2000 IR microscope equipped with a nitrogen-cooled MCT detector. The microstructure of the sample decompressed from high pressure was analyzed by transmission electron microscopy (JEM-2200FS). The XRD measurement was performed at Shanghai Synchrotron Radiation Facility.
All first-principles calculations (including geometry optimizations and vibrational frequencies) were carried out by the DMOL³ method within the gradient-corrected approximation (GGA).