For SEM analysis, bacterial cultures of control and gyr(-) were pelleted and washed twice with 0.1 M phosphate buffer (pH 7.4), followed by single cell suspension of pellets in fixative buffer (2% paraformaldehyde and 2.5% glutraldehyde in 0.1 M phosphate buffer). After overnight incubation at 4°C, cells were washed twice with 0.1 M phosphate buffer and observed under Zeiss EVO40 microscope at the Advanced Instrumentation Research Facility in the Jawaharlal Nehru University, India (https://www.jnu.ac.in/airf ).
Evo40 microscope
Manufactured by Zeiss
Sourced in Germany
The EVO40 is a versatile scanning electron microscope (SEM) designed for a wide range of applications. It features high-resolution imaging, a user-friendly interface, and advanced analytical capabilities. The EVO40 is suitable for various research and industrial applications that require detailed surface analysis and characterization of materials at the microscopic level.
Automatically generated - may contain errors
Lab products found in correlation
U 3900 uv vis spectrophotometer, by Hitachi (1 mentions)
2100f electron microscope, by JEOL (1 mentions)
F 4700 fluorescence spectrometer, by Hitachi (1 mentions)
Alpha300 ra system, by WITec (1 mentions)
Eclipse e400, by Nikon (1 mentions)
Zetasizer nano z, by Malvern Panalytical (1 mentions)
Sta 449 f3 jupiter analyzer, by Netzsch (1 mentions)
Vertex 70 spectrometer, by Bruker (1 mentions)
Mastersizer 2000 instrument, by Malvern Panalytical (1 mentions)
Axis ultra dld, by Shimadzu (1 mentions)
D8 advance davinci, by Bruker (1 mentions)
Tristar 2 plus, by Micromeritics (1 mentions)
5 protocols using evo40 microscope
1
SEM Analysis of GyrA-Deficient Bacteria
2
Nanoscale Characterization of Quantum Dots
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The XRD pattern
of the powder samples was obtained using a Rigaku Miniflex-600 diffractometer
having a Cu (Kα, λ = 1.5418 Å) source.
TEM images were obtained by a JEOL-2100F electron microscope (operating
voltage 200 KeV) by drop-casting the dispersed sample in toluene on
a carbon-coated copper grid (300 mesh). Raman spectra were obtained
by a Wi-Tec alpha300 RA system having an Ar laser source with wavelength
532 nm. For this measurement, QDs were dispersed in toluene solution
and drop-cast on a glass substrate. EDX analysis was carried out by
SEM, Zeiss EVO40 microscope in which an energy dispersive X-ray analyzer
was attached. UV–vis absorption spectra were observed using
a Hitachi U-3900 UV–vis spectrophotometer. PL and PLE spectra
were obtained by a Hitachi F-4700 fluorescence spectrometer. Fluorescence
decay spectra were acquired by time-correlated single-photon counting
(TCSPC) FL920, Edinburg Instruments, U.K. setup.
of the powder samples was obtained using a Rigaku Miniflex-600 diffractometer
having a Cu (Kα, λ = 1.5418 Å) source.
TEM images were obtained by a JEOL-2100F electron microscope (operating
voltage 200 KeV) by drop-casting the dispersed sample in toluene on
a carbon-coated copper grid (300 mesh). Raman spectra were obtained
by a Wi-Tec alpha300 RA system having an Ar laser source with wavelength
532 nm. For this measurement, QDs were dispersed in toluene solution
and drop-cast on a glass substrate. EDX analysis was carried out by
SEM, Zeiss EVO40 microscope in which an energy dispersive X-ray analyzer
was attached. UV–vis absorption spectra were observed using
a Hitachi U-3900 UV–vis spectrophotometer. PL and PLE spectra
were obtained by a Hitachi F-4700 fluorescence spectrometer. Fluorescence
decay spectra were acquired by time-correlated single-photon counting
(TCSPC) FL920, Edinburg Instruments, U.K. setup.
3
Evaluating Hybrid Filler Microstructures
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For the monitoring of the microstructure and assessment of the dispersibility of different hybrid fillers and pristine lignin, an optical microscope Eclipse E 400 was utilized (Nikon, Tokyo, Japan). Thin films were cut from long sheets and subjected to microscopic observation in transmittance mode. Moreover, scanning electron microscopy (SEM) was carried out for the examination of aggregate sizes and shapes using the EVO40 microscope (Zeiss, Jena, Germany). Prior to microscopic observations, the samples were coated with Au using a Balzers PV205P sputtering magnetron (Oerlikon Balzers Coating, Brügg bei Biel, Switzerland).
4
Characterization of Hybrid Materials
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Dispersive and microstructural properties were evaluated using scanning electron microscopy (SEM) and recorded using an EVO40 microscope (Zeiss, Jena, Germany).
The particle size range was determined using a Mastersizer 2000 instrument (Malvern Instruments Ltd., Malvern, UK) by laser diffraction technique. Additionally, Zetasizer Nano ZS (Malvern Instruments Ltd.) was used to determine the particle size distributions, based on the noninvasive backscattering (NIBS) method.
The efficiency of obtaining hybrid materials was confirmed using Fourier transform infrared spectroscopy (FTIR). For this purpose, the Vertex 70 spectrometer (Bruker Optik GmbH, Ettlingen, Germany) was used. The designed hybrid materials and pure components were analyzed in the form of potassium bromide tablets. The FTIR analysis was performed at a wavenumber range of 4000–400 cm−1.
The thermogravimetric analysis (TGA) of the samples was determined using a Jupiter STA449F3 analyzer (Netzsch GmbH, Selb, Germany). Measurements were conducted at a heating rate of 10 °C/min over the temperature range of 25–600 °C under nitrogen flow (10 mL/min).
The particle size range was determined using a Mastersizer 2000 instrument (Malvern Instruments Ltd., Malvern, UK) by laser diffraction technique. Additionally, Zetasizer Nano ZS (Malvern Instruments Ltd.) was used to determine the particle size distributions, based on the noninvasive backscattering (NIBS) method.
The efficiency of obtaining hybrid materials was confirmed using Fourier transform infrared spectroscopy (FTIR). For this purpose, the Vertex 70 spectrometer (Bruker Optik GmbH, Ettlingen, Germany) was used. The designed hybrid materials and pure components were analyzed in the form of potassium bromide tablets. The FTIR analysis was performed at a wavenumber range of 4000–400 cm−1.
The thermogravimetric analysis (TGA) of the samples was determined using a Jupiter STA449F3 analyzer (Netzsch GmbH, Selb, Germany). Measurements were conducted at a heating rate of 10 °C/min over the temperature range of 25–600 °C under nitrogen flow (10 mL/min).
5
Comprehensive Characterization of Synthesized Powders
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The chemical composition
and the morphology of the synthesized powders were investigated by
energy-dispersive X-ray spectroscopy (EDX) and scanning electron microscopy
(SEM), using a Zeiss EVO 40 microscope. Gas porosity and specific
surface area of the powders were explored using a Micromeritics TriStar
II Plus automated gas sorptometer. X-ray powder diffraction (XRPD)
data were collected at room temperature on a Bruker D8 Advance Da
Vinci diffractometer. X-ray photoelectron spectroscopy (XPS) analyses
were performed using a Kratos AXIS Ultra DLD. XPS quantification was
performed using the instrument sensitivity factors and high-resolution
scans.
All specifications about instruments, equipment, data
collection, and evaluation are reported in theSupporting Information .
and the morphology of the synthesized powders were investigated by
energy-dispersive X-ray spectroscopy (EDX) and scanning electron microscopy
(SEM), using a Zeiss EVO 40 microscope. Gas porosity and specific
surface area of the powders were explored using a Micromeritics TriStar
II Plus automated gas sorptometer. X-ray powder diffraction (XRPD)
data were collected at room temperature on a Bruker D8 Advance Da
Vinci diffractometer. X-ray photoelectron spectroscopy (XPS) analyses
were performed using a Kratos AXIS Ultra DLD. XPS quantification was
performed using the instrument sensitivity factors and high-resolution
scans.
All specifications about instruments, equipment, data
collection, and evaluation are reported in the
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