The fracture surfaces of two tensile specimens per type were observed on a Zeiss EVO 50XVP Scanning Electron Microscope (SEM). A thin gold layer was sputtered on the observed surfaces prior to scanning to enhance the quality of the images due to the low electrical conductivity of the polyamide 6.
Evo 50 xvp scanning electron microscope
The Zeiss EVO 50 XVP is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of various materials. The instrument utilizes an electron beam to scan the surface of a sample, generating detailed images and providing information about the sample's composition and structure. The EVO 50 XVP is equipped with a variable pressure (VP) system, allowing for the examination of both conductive and non-conductive samples without the need for extensive sample preparation.
6 protocols using evo 50 xvp scanning electron microscope
Meso-structure Characterization of Polyamide 6
The fracture surfaces of two tensile specimens per type were observed on a Zeiss EVO 50XVP Scanning Electron Microscope (SEM). A thin gold layer was sputtered on the observed surfaces prior to scanning to enhance the quality of the images due to the low electrical conductivity of the polyamide 6.
Scanning Electron Microscopy of Protein Binding
Scanning Electron Microscopy of Oral Bacteria
Structural Analysis of Tick's Double Anus
SEM Visualization of Bacterial Samples
Scanning Electron Microscopy of P. gingivalis
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