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Em ace600 coating device

Manufactured by Leica

The EM ACE600 is a coating device designed for sample preparation in electron microscopy. It is capable of depositing a thin conductive coating on the surface of samples, which is necessary for imaging with scanning electron microscopes. The device uses vacuum deposition techniques to apply the coating, helping to preserve the sample's structure and properties.

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2 protocols using em ace600 coating device

1

Platinum-Coated Cell Dehydration for SEM Imaging

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Samples were dehydrated in a graded ethanol series at RT. For further chemical drying, the samples were first incubated in a 1:1 mixture of 100% ethanol and hexamethyldisilazane (HMDS) for 30min at RT and then transferred to 100% HMDS for 1h at RT. Access HMDS was removed with a pipette followed by overnight evaporation at RT. The cover slips with the dried cells were coated with platinum to a thickness of 5nm using an EM ACE600 coating device (Leica Microsystems). The samples were observed with a FE-SEM Merlin compact VP scanning electron microscope (Zeiss) at 5kV using a secondary electron detector.
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2

Serial Sectioning and Electron Microscopy

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Embedded samples were trimmed with an Ultratrim diamond knife (Diatome) to a rectangle (70μm x ∼1mm) with a slanted side for orientation using an EM UC7 ultramicrotome (Leica Microsystems). Prior to serial sectioning, a 25 x 25mm silicon wafer was plasma treated using an ELMO glow discharge cleaning system (Agar Scientific) for increasing the hydrophilicity of the wafer. Serial sections were cut at a thickness of 80 nm using a 4mm Leica AT-4 35° diamond knife (Diatome). Section ribbons were collected onto a plasma treated wafer using the water drain device of the knife. Then the wafer with the serial sections was coated with carbon to a thickness of 5nm using an EM ACE600 coating device (Leica Microsystems) to ensure conductivity. The serial sections were observed under a FE-SEM Merlin compact VP scanning electron microscope (Zeiss) equipped with the Atlas 5.3.2.9 Array Tomography software (Zeiss). The images were acquired using a backscattered (5nm pixel size) and a secondary electron detector (7nm pixel size) at 5kV.
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