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Jfc 1300 automatic fine platinum coater

Manufactured by JEOL
Sourced in Japan

The JFC-1300 is an automatic fine platinum coater designed for sample preparation in scanning electron microscopy (SEM) and transmission electron microscopy (TEM) applications. The device applies a thin, uniform layer of platinum onto the surface of samples, enhancing their conductivity and improving the quality of microscopic imaging.

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5 protocols using jfc 1300 automatic fine platinum coater

1

Characterization of H40-PLA Nanoparticles

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Particle size and zeta potential were measured by Malvern Mastersizer 2000 (Zetasizer Nano ZS90, Malvern Instruments Ltd., UK). Zeta potential is an indicator of the surface charge and colloidal stability of particles. Before measurement, freshly prepared NPs were appropriately diluted. All measurements were carried out at room temperature after 10 min of equilibration. The data were the averages of three measurements. Surface morphology of the nanoparticles was examined by field emission scanning electron microscopy (FESEM, JEOL JSM-6301F, Tokyo, Japan). To prepare samples for FESEM, the H40-PLA NPs were fixed on a stub by a double-sided sticky tape and then coated with platinum layer by JFC-1300 automatic fine platinum coater (JEOL, Tokyo, Japan) for 60 s. The H40-PLA NPs were further observed by transmission electron microscopy (TEM, Tecnai G2 20, FEI Company, Hillsboro, Oregon, USA). Sample was dropped onto a copper grid coated with a carbon membrane. The grid was allowed to dry before characterization.
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2

Characterization of Nanoparticle Properties

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The nanoparticle size and zeta potential were determined by Malvern Mastersizer 2000 (Zetasizer Nano ZS90, Malvern Instruments Ltd., Malvern, Worcestershire, UK). All measurements were measured at room temperature after equilibration for 10 min. Average size and zeta potential of different NPs were analyzed using a dynamic light-scattering detector (Zetasizer Nano ZS90, Malvern Instruments Ltd., Malvern, Worcestershire, UK). The data were obtained with the average of three measurements.
The surface morphology of nanoparticles was examined by a field emission scanning electron microscopy (FESEM, JEOL JSM-6301 F, JEOL, Tokyo, Japan). To prepare samples for FESEM, the nanoparticles were fixed on the stub by a double-sided sticky tape and then coated with a platinum layer by JFC-1300 automatic fine platinum coater (JEOL, Tokyo, Japan). Morphological examination of FA-PLA-TPGS-NPs was performed using transmission electron microscopy (H600, Hitachi, Tokyo, Japan).
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3

Nanoparticle Surface Morphology Analysis

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Samples were dropped onto double-sided sticky tape on the stub. The particles were then coated with a platinum layer using a JFC-1300 automatic fine platinum coater (JEOL, Tokyo, Japan) for 30 seconds in a vacuum. The surface morphologies of the NPs were observed by a field emission scanning electron microscope (JSM-6700F system; JEOL).
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4

Liposome Surface Morphology Imaging

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Surface morphologies of liposomes (DOC-L, C6-L, PEG-DOC-L, PEG-C6-L, TPOS-DOC-L, TPOS-C6-L) were imaged by a Su8010 scanning electron microscope (Hitachi, Japan). After sonication, sample suspensions were diluted and dried on a copper tape for 5 min. Before imaging, samples were coated with a platinum layer for 45 s using JFC-1300 automatic fine platinum coater (JEOL, Tokyo, Japan) for 40 s at 20 mA. The morphologies of liposomes were observed using transmission electron microscopy (TEM, JEM-2000EX, JEOL, Japan). The samples were negatively stained with 4% phosphotungstic acid and dried on carbon-coated grids for observation.
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5

Nanoparticle Characterization: Size, Zeta Potential, and Morphology

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Zeta potential and particle size were detected by Malvern Mastersizer 2000 (Zetasizer Nano ZS90; Malvern Instruments Ltd., Malvern, UK). Freshly prepared NPs were diluted appropriately before measurements that were performed at room temperature after 10 min of equilibration. The average of three independent measurements was recorded. Surface morphology was observed by field emission scanning electron microscopy (FESEM; JEOL JSM-6301F; JEOL, Tokyo, Japan). For sample preparation, the particles were fixed with a double-sided sticky tape on a stub and thereafter coated by a platinum layer for 60 s using JFC-1300 automatic fine platinum coater (JEOL).
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