TEM analysis was performed using a Philips CM300 microscope operating at 300 kV. A droplet of the samples was cast on a 200-mesh copper grid for 2 min before the excess solvent was blotted away using sterile paper. Samples were negatively stained by applying 5 μL 1% (w/v) uranyl acetate in MilliQ water onto the grid for 30 s and removed afterwards.
Cm300 microscope
Manufactured by Philips
The Philips CM300 microscope is a high-performance electron microscope designed for advanced materials analysis and research. It features a stable and reliable electron column, delivering exceptional image quality and resolution. The CM300 is capable of operating in both transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) modes, providing versatile imaging and analytical capabilities.
Automatically generated - may contain errors
Lab products found in correlation
Db235, by Thermo Fisher Scientific (1 mentions)
Avance drx 500 spectrometer, by Bruker (1 mentions)
D5000 diffractometer, by Siemens (1 mentions)
Xl30 sem, by Philips (1 mentions)
Nicolet avatar 360 ft ir spectrometer, by Thermo Fisher Scientific (1 mentions)
X pert pro mpd diffractometer, by Malvern Panalytical (1 mentions)
6 protocols using cm300 microscope
1
TEM Analysis of Nanoparticle Samples
2
Composition and Characterization of NiMoW Thin Films
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The chemistry of the as-deposited films was measured using energy-dispersive spectroscopy in a CM300 TEM (fig. S1A) and wavelength-dispersive x-ray spectroscopy in JEOL 8600 SuperProbe, with pure Ni, Mo, and W crystals serving as standards. Operating conditions for WDS included a 40° takeoff angle, a beam energy of 20 keV, a beam current of 40 nA, and a beam diameter of 2 μm. Sixteen point measurements were made at different regions of the film, and the average chemical composition of the alloy was determined to be Ni83.6Mo14W2.4 (atomic percent). A Struers twin-jet electropolisher and an electrolyte of 15 volume % perchloric acid and 85 volume % ethanol were used for in-plane TEM sample preparation, and FIB (FEI Strata DB235) lift-out was used to obtain cross-sectional TEM foils. TEM images were acquired using a Philips CM300 microscope at 300 kV. The crystal orientation of the films was assessed using XRD and further confirmed using TEM orientation mapping technique based on collection of automated crystal orientation mapping.
3
HRTEM and EDX Analysis of Functionalized Particles
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For high resolution TEM (HRTEM) and energy-dispersive X-ray analysis (EDX), the functionalized particles were dispersed in MeOH and transferred to carbon-coated TEM grids. The samples were analyzed using a Philips CM 300 microscope, operated at 300 kV.
4
Characterization of Catalyst Synthesis
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All of the chemical materials used in this work were purchased from Merck and Fluka and were used without further purification. Melting points were determined using Electrothermal 9100 apparatus. IR spectra were obtained using an ABB FT-IR (FTLA 2000) spectrometer. 1H NMR and 13C NMR spectra were recorded using a Bruker DRX-500 AVANCE spectrometer at 500 and 125 MHz, respectively, using TMS as an internal standard and DMSO-d6 as a solvent. Elemental analyses were carried out using Foss-Heraeus CHN–O-rapid analyzer instruments. Powder X-ray diffraction data were obtained with a Rigaku D-max C III X-ray diffractometer using Cu Kα radiation (λ = 1.54 Å). The microscopic morphology of the catalyst was revealed using a scanning electron microscope (SEM, Philips, XL-30) equipped with energy dispersive X-ray analysis (EDX) apparatus. The microscopic morphology of the catalyst was studied using transmission electron microscopy (TEM) techniques on a Philips CM300 microscope operating with a 100 kV electron beam accelerating voltage.
5
Characterization of Nanomaterials via Spectroscopy and Microscopy
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Optical sensor spectroscopy
measurements
were performed using a solid-state 2100-UV-vis Shimadzu spectrometer.
SEM is an effective method for investigating the morphological characteristics
of NPs; thus, it was evaluated using Philips XL-30 SEM. TEM images
of TiO2 NPs and polymeric nanocomposites were obtained
using a Philips CM-300 microscope. TGA and studying thermal stability
of the synthesized materials were carried out using TGA/DTA BAHR:
STA503. Patterns of XRD were obtained using Siemens D5000 diffractometer,
and a 2θ scan was done in the range of 2θ = 10°–80°
with monochromatic Cu Kα (λ = 1.54060 A). The FT-IR measurements
were performed using a BOMEM MB-Series FT-IR spectrometer in the form
of KBr pellets. On a Bruker, 300 and 500 advance instruments in CDCl3 and DMSO; δ in ppm, J in Hz, H and 13C NMR spectra were obtained.
measurements
were performed using a solid-state 2100-UV-vis Shimadzu spectrometer.
SEM is an effective method for investigating the morphological characteristics
of NPs; thus, it was evaluated using Philips XL-30 SEM. TEM images
of TiO2 NPs and polymeric nanocomposites were obtained
using a Philips CM-300 microscope. TGA and studying thermal stability
of the synthesized materials were carried out using TGA/DTA BAHR:
STA503. Patterns of XRD were obtained using Siemens D5000 diffractometer,
and a 2θ scan was done in the range of 2θ = 10°–80°
with monochromatic Cu Kα (λ = 1.54060 A). The FT-IR measurements
were performed using a BOMEM MB-Series FT-IR spectrometer in the form
of KBr pellets. On a Bruker, 300 and 500 advance instruments in CDCl3 and DMSO; δ in ppm, J in Hz, H and 13C NMR spectra were obtained.
6
Comprehensive Characterization of Powder Samples
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The X-ray diffraction patterns of powder samples were obtained by a PANalytical X’pert PRO MPD diffractometer using Cu-Ka radiation with a wavelength of 1.5406 Å. The Fourier-transform infrared (FT-IR) spectra were collected in transmission mode with a Thermo Nicolet AVATAR 360 FT-IR spectrometer in the spectral range of 400–4000 cm−1 at room temperature. FT-IR powder samples were dried at 50 °C before the fabrication of the KBr pellet. X-ray photoelectron (XPS) spectroscopy was carried out with a monochromatic Al Ka X-ray source using chamber pressures of about 10–8 Pa. Conventional transmission electron microscopy (TEM) observations were done using a Philips CM300 microscope to determine the average particle size and morphology of the powder on an accelerating voltage of 200 kV. The surface morphology of the sample was observed by the Tescan MIRA3 scanning electron (SEM) microscope. In addition, an MDK-VSM system was used for magnetic characterizations. The optical properties were evaluated using the Cary Eclipse photoluminescence (PL) spectrometer.
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