The mixture of Co, Cr, Fe, Ni, and Ti with purity of at least 99.9% (weight percent, wt.%) was prepared by arc-melting. Under a Ti-gettered argon atmosphere, the sample was cast into an 85 × 10 × 2 mm3 copper mould and CoCrFeNiTi0.2 (atomic percent, at.%) alloy ingots were prepared. A stable uniform structure was obtained at 1200 °C homogenized for 5 h. The sliced samples were cold-rolled to 75% of the total reduction ratio, and then aged at 800 °C for 3 h, 5 h, 8 h, 10 h, 24 h and 48 h respectively, followed by water quenching. The phase identification was carried out by X-ray diffraction (XRD) using Cu Kα radiation. Then, optical microscopy (OM), scanning electron microscopy (ZEISS SUPRA55 SEM) operated at 20 kV, with the working distance of 9.1 mm, energy dispersive spectrometer (EDS), and JEM-2010 transmission electron microscopy (TEM) were used to observe the surface microstructures. Dog-bone-like tensile specimens with a gauge length of 10 mm, a gauge width of 2 mm and a thickness of 0.5 mm were prepared from aged specimens by electrical discharge machining. Instron 5969 universal testing machine was used to carry out quasi-static tensile tests at room temperature at a constant strain rate of 1 × 10−3 s−1 greater than or equal to five times.
Supra55 sem
Manufactured by Zeiss
Sourced in Germany
The Supra55 SEM is a scanning electron microscope (SEM) manufactured by Zeiss. It provides high-resolution imaging capabilities for a variety of applications. The Supra55 SEM utilizes an electron beam to generate detailed images of samples, allowing for the examination of surface features and morphology at the micro- and nanoscale.
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Lab products found in correlation
5969 universal testing machine, by Instron (1 mentions)
Smartlab3, by Rigaku (1 mentions)
Uc7 ultramicrotome, by Leica (1 mentions)
Desk 4, by Denton (1 mentions)
X max 150, by Zeiss (1 mentions)
Evo ma10 electron microscope, by Zeiss (1 mentions)
Supra 55 field emission scanning electron microscope, by Zeiss (1 mentions)
Iris intrepid 2 xsp, by Thermo Fisher Scientific (1 mentions)
Tecnai g2 f20 s twin tem, by Thermo Fisher Scientific (1 mentions)
Smartlab x ray diffractometer, by Rigaku (1 mentions)
Easydrop dsa20e, by Krüss (1 mentions)
19 protocols using supra55 sem
1
Microstructure and Mechanical Properties of CoCrFeNiTi0.2 High-Entropy Alloy
2
Comprehensive Characterization of Nanomaterials
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The prepared samples were investigated with scanning electron microscopy (SEM), Brunauer–Emmett–Teller (BET) surface area analysis, X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FTIR), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS) and inductively coupled plasma optical emission spectrometry (ICP-OES). SEM was performed on a Zeiss SUPRA55 SEM. The XRD patterns were acquired with a Rigaku Smartlab(3) diffractometer with Cu Kα radiation (λ = 0.15406 nm). FTIR spectra were collected on a PerkinElmer spectrum GX. The TEM characterizations were made on a JEOL JEM-2200FS and an FEI ETEM Titan G80-300. XPS measurements were made on a PHI5000 Versaprobe III X-ray photoelectron spectrometer using Al Kα as the excitation source (hν = 1486.6 eV). ICP-OES measurements were performed on an American Agilent 5110. BET surface area data were obtained using a pore size analyzer (Tristar II 3020).
3
Ultrastructural Analysis of Cortical Tissue
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The STEM experiments were adapted from previously described experiments (Kuipers et al, 2015 (link)). Briefly, paraffin embedded cortical sections of AM and AM;Serf2br−/− were deparaffinized and postfixed with 1% osmium tetroxide/1.5% potassium ferrocyanide in 0.1 M sodium cacodylate, dehydrated through ethanol, and embedded in EPON (Serva) using a tissue processor (EM TP 709202; Leica). Ultrathin sections (80 nm) were cut using the Leica uc7 ultramicrotome and collected on formvar-coated cupper grids (electron microscopy sciences). A large area scan using scanning transmission detection was made using a Zeiss supra55 SEM with ATLAS. STEM detection with a four-quadrant STEM detector was used in inverted dark-field mode, at 28 kV with 30 μm aperture at 3.5 mm working distance. All images were recorded at the same scan speed (cycle time 1.5 min at 3,072 × 2,304 pixels). Contrast and brightness were set based on a live histogram. High-resolution large-scale STEM images at 2.5 nm pixel size were generated with the external scan generator ATLAS (Fibics), individual tiles were stitched in VE viewer (Fibics), exported as a html file, and uploaded to the website www.nanotomy.org .
4
Scanning Electron Microscopy of Fibers
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Fibers were first sputter coated with a thin layer of platinum (Denton Desk IV, Moorestown, NJ) in preparation for scanning electron microscopy (SEM). The edges of the fibers were then fixed onto the SEM sample holder using carbon tape. SEM images were taken using a Carl Zeiss Supra55 SEM (Thornwood, NY) at an accelerating voltage of 2 kV. Images were taken at 5000x and 15000x magnification.
5
Scanning Electron Microscopy Protocol for Islet Analysis
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A large area scan using Scanning Transmission Detection (STEM) was made using a Zeiss supra55 SEM with Atlas as described before18 (link). From this dataset smaller areas covering several cell types were selected for EDX analysis. Pre-exposure to stabilize samples was carried out at low magnification, depending on sample area. Typically, for the complete islets, 80 kV was used for 1 hour in a TEM. We note that after careful pre-exposure, we analyzed samples without signs of electron-beam induced damage or carbon deposition visible when comparing SEM images obtained before and after inspection, even after EDX maps acquisition times exceeding 1,5 hours, i.e., pixel exposure times >1 ms (excluding time for drift correction procedures), and after spectral point acquisition times of ~30 s.
6
EDX Characterization of Nanomaterial Samples
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Energy dispersive X-ray (EDX) spectroscopy was performed using an Oxford XMax150 detector on a Zeiss Supra 55 SEM. For EDX measurements, 250 × 250 nm2 squares were deposited, thick enough to minimize the signal from the Si substrate during the analysis with a 5 keV beam. The beam current during EDX was 5 nA and the sample was mounted at a working distance of 7.5 mm and tilted by 35° to maximise the EDX signal. The system was plasma cleaned before the EDX measurements were taken to minimize carbon contamination.
7
Characterizing Carbon Surface Fiber Morphology
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The carbon surface fiber morphology was investigated in a Zeiss Supra 55 SEM with primary electron energies of 5 keV and 15 keV and an in-lens detector.
8
High-resolution SEM Imaging and Analysis
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A SUPRA 55 SEM (Carl Zeiss, Oberkochen, Germany) equipped with an energy-dispersive X-ray spectrometer (Bruker SDD detector) was used to perform the observations and chemical analyses. This field-effect “gun” microscope (FE-SEM) operates at 0.5–30 kV with an energy of 25 kV. High-resolution observations were obtained by 2 secondary electron detectors: an in-lens SE detector and an Everhart-Thornley SE detector. The acquisition mode only permits qualitative analysis because no control sample was used.
9
Residual Char Morphology and Structure
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The morphology of the residual chars, obtained from the samples after limiting oxygen index testing, was observed by a Carl Zeiss (SUPRA 55) SEM (Carl Zeiss Company, Jena, Germany) instrument with an acceleration voltage of 15 kV at working distance ranging from 10 to 15 mm. Meanwhile, the residual chars’ structure was characterized by a Raman microspectrometer (Renishaw Company, London, UK) with excitation by a 514.5 nm helium-neon laser with scanning range of 100–3500 cm−1 at room temperature.
10
Investigating Structural Changes in F. prausnitzii
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To investigate cell structure changes in F. prausnitzii A2‐165 without or with either 0.003 or 0.01 mg/ml CP, and YCFAG without propionic acid followed by a 2‐h treatment with 0.03 mg/ml CP, STEM images were taken using a Zeiss Supra55 SEM equipped with an external scan generator (ATLAS, Fibics, Canada). Large area scans enabled the analysis of many bacteria within one data set. Sample preparation was based on a protocol described by Silva (Silva et al., 2014 ) with some modifications. For details, refer to the Appendix .
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