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Desk 5 sputter coater

Manufactured by Denton
Sourced in United States

The Desk V sputter coater is a laboratory equipment designed for depositing thin films onto substrates. It operates by sputtering, a physical vapor deposition process where atoms are ejected from a target material and then deposited onto a substrate, creating a thin coating. The core function of the Desk V sputter coater is to facilitate this thin film deposition process in a controlled environment.

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20 protocols using desk 5 sputter coater

1

Particle Size and Degradation Analysis

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Initial
assessment of the particle size and degradation process in the chip
was observed under a Leica Model DMIL LED Inverted Phase Contrast
(IPC) Microscope at 10/20×. The mean diameters of average 50
microparticles in each sample were analyzed using ImageJ software
(v1.53a, NIH, USA).
To observe the particle sizes and degradation
products in the bulk and chip methods, scanning electron microscopy
(SEM) (Zeiss Gemini 500 Field Emission, Germany) was used at an accelerating
voltage of 1.0 kV. The SEM samples were coated with a 15 nm layer
of Au–Pd via the Denton Desk V sputter coater (Moorestown,
NJ, USA) before the test.
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2

Hydrogel Morphology and Porosity Visualization

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Scanning electron microscopy
was performed on hydrogels to observe gel morphology and porosity.
Hydrogels were frozen for 24 h at −80 °C and lyophilized
for 24 h. A cross-section of the hydrogel sample was mounted to aluminum
stubs with carbon tape. Samples were sputter coated at 25% for 60
s using a Denton Desk V sputter coater with a platinum target. Hydrogel
samples were imaged using a Zeiss SUPRA 55 FESEM with an accelerating
voltage of 3 kV.
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3

SEM Imaging of Fixed Tissue Samples

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SEM samples were prepared following the method described in Landis et al. (2012) (link). Fresh tissues were collected and fixed using the same method as above. Samples were dehydrated, processed in a Tousimis critical point dryer (Rockville, Maryland, USA), and sputter-coated using a Denton Desk V sputter coater (Denton Vacuum, Moorestown, New Jersey, USA). Samples were then imaged using a Hitachi S-4000 FE-SEM (Minato-Ku, Tokyo, Japan).
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4

Electron Microscopy Sample Preparation

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Samples were dehydrated through a graded series of ethanol; critical point dried using a LADD CPD3 critical point dryer and coated with 7 mm gold using a Denton Desk V sputter coater. Samples were imaged in an Apreo S by ThermoFisher Scientific using the Everhart–Thornley secondary electron detector at 2.0 keV under a high vacuum.
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5

Morphological Analysis of Polyurethane-Sawdust Composites

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For the morphological analysis, a JEOL JSM 5600LV (Jeol, Tokyo, Japan) Scanning Electron Microscope (SEM) was used. The structure of the six new materials was analyzed by the SEM method to observe the influence of the percentage of sawdust and the type of polyurethane foam used. The morphology of materials with 0%, 35%, and 50% fir sawdust were analyzed for both systems: the flexible polyurethane foam. The samples’ morphology was studied in cross section of pure polyurethane foams and composites. The samples were cut perpendicular to the foaming direction. All the samples were analyzed using a secondary electron detector, at an accelerating voltage of 15 kV, under high vacuum. The samples were collected in a way to preserve the wood features and the images were recorded at low magnification to observe the important characteristics of the sample. To increase the resolution of the images, all the samples were coated with gold, using a DESK V sputter coater (Denton Vacuum, Moorestown, NJ, USA).
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6

Microencapsulated Phase Change Materials Characterization

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The chemical structures of microPCM and each of its components (i.e., PLA and PA) were analyzed using Fourier transform infrared (FTIR) spectroscopy (Bruker Alpha-P FT-IR Spectrophotometer). The spectra were collected by averaging signals from 32 scans at a resolution of 4 cm−1 in the range of 400–4000 cm−1.
Scanning electron microscopy (SEM) (FEI Company, Quanta 3D FEG) was used to observe the morphologies (i.e., surface features and sphericity) and sizes of microPCM. The fabricated microPCM were sputter coated with gold (Denton Vacuum, Desk V Sputter Coater) before the observation. The particle sizes were obtained by analyzing the SEM micrographs using ImageJ (NIH Image). The interior morphology of microPCM was exposed by microtoming microcapsules using a diamond knife.
The enthalpy of fusion and the melting point of microPCM were determined by a differential scanning calorimetry (DSC) (TA Instrument, DSC Q20). These measurements were performed in the temperature range from 40 to 90 °C at a heating rate of 10 °C min−1. In order to determine the thermal stability of the microPCM, the enthalpy of fusion was analyzed after samples [i.e., the base case (PCM0.6)] were subjected to 50 thermal cycles at the same temperature range and heating rate.
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7

Automated Serial Sectioning for SEM

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The sample block was mounted on an aluminum pin stub with a conductive silver paint and sputter-coated with a thin (<60 nm) layer of iridium by using a Denton DeskV sputter coater in order to electrically ground the sample and limit charging. To locate the region of interest (ROI), the block face was scanned at an acceleration voltage of 10 kV and a current of 0.2 nA on a scanning electron microscope using a concentric backscatter detector. The block was trimmed to the ROI with a Leica UC7 ultra-microtome fitted with a DiATOME knife. A relief was then milled into the block face by using a suitable ion beam current, and a protective cap was deposited using the carbon gas injection system. Fiducials were created to aid the computer vision pattern-placement algorithm. Regions of interest were imaged using the FEI Auto Slice and View software package to automate the serial-sectioning and data-collection processes.
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8

Nanofiber Scaffold Morphology Analysis

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The morphologies of nanofiber scaffolds were analyzed using a scanning electron microscope (SEM) (Tokyo, Japan, JEOL JSM-6510) and confocal laser scanning microscopy (CLSM) (Solms, Germany, Leica TCS SP8). The nanofibers containing GNRs and fluorescein were prepared and cut into circles of 1 cm diameter using a biopsy punch. The nanofiber samples were coated with 250 Å of gold via a Denton Desk V Sputter Coater. The SEM images were obtained at an accelerated voltage of 20 kV and 20 μm scale bar. Fiber diameter distribution histograms were quantified using the SEM micrographs. For each sample, 10 random field images were taken, and 10 fibers were measured in each image. The samples from the same nanofibers with a diameter of 1 cm were taken for CLSM. In this analysis, two samples were prepared that were the original dry nanofiber and water-treated nanofiber. The CLSM images were obtained under 63× magnification. All these characterizations were observed at room temperature.
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9

Hyphal Morphology Analysis of P. cinnamomi

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The hyphal morphology of P. cinnamomi, grown in indirect contact with isolate A8a for seven days, was observed and analyzed by scanning electron microscopy (SEM) in a JEOL JSM-IT300 microscope. Mycelial samples were fixed in a 4% glutaraldehyde solution for 24 h and washed with phosphate buffer (pH = 7.2). Mycelial samples were then dehydrated in a gradient of ethanol (70%, 80%, 90% and absolute ethanol). Samples were subsequently dried with liquid CO2 for 15 min in a Toussimis Autosamdri®-815, Series A, incorporated to aluminium stubs and sputter coated with 10-nm gold layer using Denton Desk V sputter coater. The scanning was performed with an accelerating voltage of 20 kV. Control mycelial samples, unexposed to isolate A8a, were processed similarly.
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10

Probing Gelatin Nanoparticle Morphology by FE-SEM

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Field Emission-Scanning electron microscopy (FE-SEM) was used for visualizing and probing the gelatin nanoparticles’ morphology, topology, and size. Samples were first prepared through a serial dilution to a final concentration of 1×109 particles/mL, followed with homogenization by light vortexing at 3000 rpm for 10 seconds, then directly aliquoted onto a 100% acetone-cleaned, Ted Pella aluminum pin stub mount (4595 Mountain Lakes Blvd, Redding, Ca 96003), and solution was allowed to evaporate completely. Immediately, the samples were sputter coated for 60 seconds with an Au/Pd target using a Denton Desk V Sputter Coater (1259 North Church St. Bldg 3 Mooretown, NJ USA 08057), and loaded into the Hitachi SU5000 Schottky Field-Emission Scanning Electron Microscope (20770 W. Nordhoff Street, Building 4, Chatsworth, CA 91311, United States) at a high negative vacuum pressure of 10−8 torr. An incident electron beam was applied onto the samples at 7 keV and beam current of 16.7 nA. Aperture and stigmata corrections were done before sample images were obtained.
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