Newton emccd

The measurement setup consisted of an inverted microscope coupled to a Spectrometer with CCD camera, and a broadband halogen lamp was used as a light source. The transmission measurements were calibrated with respect to free space. For visible wavelengths, Andor Spectrometer with Newton EMCCD is used. For the NIR measurements, SpectraPro 300i Spectrometer with NIRvana 640 is used.

The aforementioned sample preparation procedure was repeated for the Raman microscopy measurements, although without the addition of R6G in order to prevent interfering fluorescence. The Raman signal was measured on a confocal Raman microscope (Witec, Alpha 300 R) coupled to a CMOS camera (Andor, Newton EMCCD, DU970P-BVF-355). The laser wavelength used was 532 nm with a grating of $600{\text{g mm}}^{-1}$ . Each spectrum was averaged 25 times with an integration time of 30 s.

All the AFM-based experiments were carried on an INTEGRA SPM Controller of NT-MDT. After AFM charge writing, the surface potential of the charge patterns (relative to the surrounding uncharged polymer substrate) was measured by Kelvin Probe Force Microscopy (KPFM) in semi-contact mode. In the KPFM experiments, double path measurement was used, and the typical lift height was 10 nm. After NP assembling, the height images were obtained by tapping mode scanning (carrying an NSG10 tip of TipsNano).
The fluorescence images of quantum dot patterns were obtained using a fluorescence microscope (Newton EMCCD, ANDOR) with a 405-nm laser. The PL spectrum was measured using an SR-303i-B spectrograph of Andor (EU). The single point FL spectrums of low temperature were measured by Andor spectrograph at 4 K.
The SEM images were captured using a Zeiss Ultra55 field-emission SEM operated at 15 kV. X-ray photoelectron spectroscopy (XPS, K-Alpha, Thermo Scientific, UK) were in situ measured after writing dense charge lattice with 200 × 200 μm area. The TEM images were captured by FEI Tecnai F20 G2 TEM.