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Jem 1400 tem instrument

Manufactured by JEOL
Sourced in United States

The JEM-1400 is a transmission electron microscope (TEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of microscopic samples. The instrument uses an electron beam to illuminate the specimen and create a magnified image, allowing for detailed observation and study of the sample's structure and composition.

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4 protocols using jem 1400 tem instrument

1

Characterization of HA-Dox Nanoparticles

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The size and morphology of HA‐Dox were examined by transmission electron microscopy. Briefly, 2.0 μl of HA‐Dox suspensions were allowed to air‐dry on Formvar carbon‐coated cupper grids. Transmission electron microscopy (TEM) was performed on a JEOL JEM‐1400 TEM instrument, operating at a voltage of 100 kV (JEOL USA, Inc.). Particle zeta potential was measured by dynamic light scattering (DLS) on Malvern Zetasizer (Malvern). The mean particle size of HA‐Dox was estimated with a NanoSight NS3000 (Malvern Panalytical Inc., Westborough, MA).
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2

Characterizing Cellulose Nanofiber Morphology

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To ensure the fiber
morphology of the CNF dispersions, transmission electron microscopy
(TEM) experiments were performed at the Center of Functional Nanomaterials,
Brookhaven National Laboratory. The equipment used was a JEOL JEM-1400
TEM instrument with a Ruby camera with operating voltage set to 120
kV. The CNF dispersions were diluted to ≈0.01 wt % and a small
droplet (≈2.2 μL) was dropped on a carbon-coated copper
grid. To obtain sufficient contrast, the samples were stained using
a 2 wt % aqueous uranyl acetate solution. A total of 5–10 images
were taken per sample, where an example image for each sample is provided
in the Supporting Information.
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3

Characterization of Nanoparticle Physicochemical Properties

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The average hydrodynamic diameter and polydispersity index (PDI) of TEB NPs were measured with a NICOMP 380 ZLS at 0 °C, 25 °C, 38 °C, and 54 °C with a scattering angle of 90° multiple times43 (link). The average of three measurements was reported. The size of SC, and WP were measured with a NICOMP 380 ZLS with a scattering angle of 90° multiple times.
The dried samples were ground into a fine powder with potassium bromide (KBr) and pressed into thin slices and scanned 32 times within the wavenumber range of 400 to 4000 cm−1 through a Spectrum 100 Fourier transform infrared spectrometer (Perkin Elmer Inc., USA).
The morphology of NPs was observed on a JEOL JEM-1400 TEM instrument with an acceleration voltage of 200 kV. One drop of the TEB NPs solution was deposited on a carbon-coated copper grid. The droplet was allowed to dry at room temperature.
Zeta potentials (from electrophoretic mobility) of NPs were measured using a Malvern Zetasizer Nano ZEN3700 (Malvern Instruments, Worcestershire, UK). The pH of the sample solution was fixed at 6.0 and three replicate measurements per sample were performed.
TGA simultaneous thermal analyzer (STA 449 F3) was used for thermogravimetric analysis to record the weight-loss data of the material with temperature changes. The temperature was increased from 30 °C to 600 °C at a heating rate of 10 °C/min and a nitrogen flow rate of 20 mL/min.
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4

Physicochemical Characterization of Drug-Loaded Mesoporous Silica

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Transmission electron microscopy (TEM) was done using a JEM-1400 TEM instrument (JEOL, Ltd., Tokyo, Japan) to determine the shape and physical appearance of samples.
The Brunauer-Emmett-Teller (BET) specific surface area, pore volume, and pore size of the prepared samples were recorded from nitrogen adsorption desorption isotherms by a TriStar II 3020 V1.02 instrument (Micromeritics Instrument Corp., Norcross, GA, USA).
A differential scanning calorimeter (DSC) (NETZSCH-Geratebau GmbH, Selb, Germany) was also used to determine the physical state of the drug in the carriers. DSC scans were performed at 40–200°C with a heating rate of 10°C/min.
X-ray diffraction (XRD) analysis of BRE-MSNs was done using a D8 Advance X-ray diffractometer (Bruker, Karlsruhe, Germany) at an operating voltage of 40 kV and a current of 30 mA. Samples were scanned over the range of 7–50° 2θ at a step size of 0.02° and a scan speed of 5°/min.
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