Arrow ncr 50

Morphology
was investigated with atomic force microscope Tosca 400, Anton Paar
(Graz, Austria). The images were scanned in tapping mode with silicon
SPM-Sensor (Arrow-NCR-50, Nanoworld, Switzerland) with a resonance
frequency of 285 kHz and a force constant of 42 N/m. AFM images were
acquired for thin films deposited either on silicon substrates or
gold-coated quartz crystals. Image sizes of 10 μm × 10
μm, 5 μm × 5 μm, and 1 μm × 1 μm
were scanned at a speed of 0.9 lines per second. Measurements were
performed at room temperature. Image processing was done using the
Gwyddion program.^{46 (link)}

Drops of aqueous suspensions (0.2 wt.%) of BNC, VNC, AcBNC, and AcVNC were placed on a mica support and analyzed using a Nanoscope V-Multimode atomic force microscope (Veeco, Santa Barbara, CA, USA) in tapping mode (intermittent contact) using a silicon nitride probe Arrow-NCR-50 (Nano World, Neuchâtel, Switzerland). The resonance frequency of the cantilever was 258 kHz, with a constant force of 42 N m⁻¹ and a tip radius ranging from 5 to 10 nm. Scanning frequencies typically ranged from 1.0 to 1.5 Hz.