Sr 500i b1 r

The scattering and luminescence spectra contain three different stages (stage 1: Si NS on glass/Si substrates; stage 2: system-1/-2; stage 3: system-1/-2 (annealed)), which were measured by using a dark-filed optical microscope (BX53, Olympus, Tokyo, Japan) equipped with a spectrometer (SR-500i-B1-R, Andor) and a color charge coupled device (CCD) (01-QIClick-R-F-CLR-12, QIMAGING, Surrey, BC, Canada). The 100× objective lens with a numerical aperture of 0.8 was utilized to collect the scattering light and the luminescence signal excited by an fs oscillator (Mira-HP, Coherent, San Francisco, CA, USA). The integration time for the scattering spectra measurement was 0.6 s. The integration time for the luminescence spectra measurement was 2 s and the gain coefficient was set to 20 times. The surface morphology and the element mapping distribution images of the samples were analyzed using the scanning electron microscope (SEM, ZEISS Ultra 55, Carl Zeiss, Oberkochen, Germany) and energy-dispersive spectroscopy (EDS, ZEISS Ultra 55, Carl Zeiss, Oberkochen, Germany). The crystallinity of the sample was analyzed using the transmission electron microscope (TEM, JEM-2100F, JEOL, Tokyo, Japan).

The PL spectrum was excited by a-532nm solid-state laser, collected by a confocal microscope (LEICA DM 2700 M), and recorded by a spectrometer (ANDOR SR-500i-B1-R) equipped with a CCD detector. The spatially resolved PL mapping was acquired by scanning the excitation beam with a 2D galvanometer, with a spatial resolution of ~0.3 μm.