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312 protocols using invia raman microscope

1

Characterization of Carbon Fibers

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A field emission scanning electron microscope (FE-SEM, S-4800, Hitachi High-Technologies Co., Ltd., Tokyo, Japan) was used to observe the morphology of the carbon fibers with an acceleration voltage of 15 kV. The crystallinity was observed using X-ray diffraction equipment (XRD, Rigaku Co., Ltd., Smartlab, Tokyo, Japan) with monochromatic Cu Kα radiation (λ = 0.154 nm) operating at 45 kV and 200 mA. Raman analysis was measured by a spectrometer (Renishaw InVia TM Raman microscope) with a laser excitation wavelength of 532 nm. Specific surface area, pore volume, and average pore size of the carbon fibers were measured by the Brunauer–Emmett–Teller (BET) method, with N2 as adsorbate gas at liquid nitrogen temperature (77 K) using a BELSORP mini II analyzer (MicrotracBEL Corp, Nagoya, Japan) and analysis software BELMASTER TM v 5.3.3.0, provided by BEL Japan Inc., Nagoya, Japan.
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2

Birefringence Imaging of Crystalline Deposits

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For in situ analysis, the flow cell device could be placed below the ultra-long working distance objectives of an Olympus BX60 PLM. A gypsum 1st-order red WP retarder was used to image and identify crystalline and amorphous formations of interest on test surfaces. With the additional retardation added by the λ-plate, amorphous material can be seen and should exhibit the same magenta color as the non-birefringent background, while crystalline matter will be birefringent blue and yellow/orange (at this thickness). All 37 °C flow experiments were also analysed using the PLM after cleaning of residual salts or purification from collected solutions. A FEI Nova NanoSEM 430 with EDS detector at 10 kV with a 5 mm working distance and 5 nm spot-size was used to image test surfaces and to confirm CaOx and CaP chemistry. Prior to SEM, the entire flow-cell assembly bottom slide was coated with 10 nm AuPd to prevent surface charging. A Renishaw inViaTM Raman microscope equipped with a 632 nm laser was used to identify and characterize individual crystalline deposits at 500x magnification with 30 sec laser exposure. All crystallization experiments/time-points reported were performed in triplicate.
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3

Spectroscopic Analysis of Powder Samples

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Infrared spectra were acquired using a PerkinElmer Frontier FT-IR/FIR spectrometer (Coventry, UK) equipped with an Attenuated Total Reflectance (ATR) accessory. Powder samples were loaded directly onto the diamond crystal stage and secured by a compressor rod. Blanks were performed prior to each sample submission, and all data were acquired at a resolution of 64 cm−1 using the built-in software ‘IRWinLab’ and 32 scans were collected.
Raman spectra were obtained by utilising a Renishaw InVia Raman microscope (Gloucestershire, UK) and associated WiRE 3.4 software supplied by the manufacturer. All measurements were performed by means of the 785 nm excitation wavelength and a 2 mW power laser. Powder samples were presented on a microscope slide with an approximate examined area of 20 × 20 µm2 and each measurement was taken after an average of 20 scans. The data were further analysed using the BioRed® (Philadelphia, PA, USA) program and all visible Raman shifts were studied against the references supported by the database within the program.
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4

Raman Spectroscopy of Neptunium Samples

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Raman spectra of Np containing solid samples and solutions were collected on a Renishaw inVia Raman Microscope with a circularly polarized excitation line of 532 nm. Due to the radiological hazards associated with 237Np, each solid sample or 2 μL solution sample was placed on a glass drop slide covered with a transparent coverslip, which was sealed to the slide using epoxy. Numerous spectra from multiple spots were collected on multiple samples for each compound and on each solution to ensure sample homogeneity. All Np solutions used for Raman spectral analysis were prepared individually by mixing an aliquot of the 0.24 M NpV stock solution with appropriate volumes of ACl stock solutions and H2O.
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5

SERS Spectroscopy Protocol with Raman Microscope

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SERS spectra were collected using an inVia Raman microscope (Renishaw plc, Wotton-under-Edge, UK) in the range of 400e1800 cm À1 . The instrument is equipped with 785 nm NIR diode laser (Toptica Photonics AG, Germany) delivering 120 mW of power at the sample. The spectrograph with a 1800 l/mm grating yielded a spectral resolution of 4 cm À1 . A Â 10 microscope objective (numerical aperture 0.25) was used for data acquisition. Calibration of spectrograph was done with the lines of a Neon lamp, and the calibration was checked prior to each measurement using the 520 cm À1 band of a silicon reference sample. Data were acquired using the software WiRE 3.4 (Renishaw).
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6

Raman Spectroscopy Analysis of Untreated and Treated Samples

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To evaluate the molecular structure for the untreated and treated samples, Raman spectroscopy was performed using a commercial instrument (inVia Raman microscope, Renishaw, Wotton-under-Edge, UK). Raman spectra were generated using a 784 nm laser source with 10 s exposure on the surface of the sample with a 50× objective. The spectra were obtained over wavelengths from 100 to 3200 cm−1. Samples of material for Raman spectroscopy were sectioned from the grip sections of the fractured samples. Baseline correction, normalization and smoothing of the Raman spectra were achieved by data analysis software (Origin, OriginLab, Northampton, MA, USA). In addition, WiRE software (Version 5.2) was used to acquire and compare the Raman spectra for Ultem 1000 to the spectra for PC.
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7

Raman Mapping of Tissue Samples

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Raman maps were collected in back scattering geometry using the Renishaw InVia Raman microscope equipped with a 785 nm diode laser delivering 170mW of laser power at the sample. A 785 nm near infrared wavelength was used to limit tissue autofluorescence, which should interfere with Raman spectrum measurements. The CaF2 slide supporting the tissue sections was mounted on a ProScan II motorized stage (Prior, Cambridge, UK) under the microscope. A Leica 50 microscope objective (N.A. 0.85) focused the laser on the sample. A 1200 L/mm grating yielded a spectral resolution of 4 cm–1. A thermoelectrically cooled charge coupled device (CCD) camera was used for detection. The spectrograph was calibrated using the lines of a Ne lamp. Mapping was achieved collecting spectra with steps of 12 μm, with 10 sec exposure time for each spectrum, for a total of 5708 spectra, each consisting of 1203 data points. Spectra were obtained in the 600-1800 cm–1 region using the synchro mode of the instrument software WiRETM 3.2 (Renishaw), in which the grating is continuously moved to obtain Raman spectra of extended spectral regions. Data preprocessing and analysis were carried out using the hyperSpec package (Beleites and Sergo, hyperSpec: a package to handle hyperspectral data sets in R; http://hyperspec.r-forge.r-project.org/).
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8

Raman Spectroscopy of Samples

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Raman spectra were acquired at room
temperature with a Raman spectrometer (inVia Raman microscope; Renishaw)
equipped with a 532 nm diode laser through a 50×, 0.75 N.A. objective
(NPLAN EPI; Leica). Spectra were acquired in 100 s and processed using
WiRE software.
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9

Raman Spectroscopy of Nanocomposite Materials

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Raman microscopy was conducted on inorganic CND/host nanocomposites grown on glass substrates using a Renishaw inVia Raman Microscope (785 nm laser) with a 50× objective using MS20 encoded sample stage control through rollerball XYZ peripheral. Data acquisition was undertaken with Renishaw WiRE 3.4 with a laser intensity of 0.1% under three accumulated acquisitions (3 × scan time 30 s) between 1200 and 100 cm−1.
Raman spectroscopy of CNDs was conducted using a Renishaw inVia Raman confocal inverted microscope integrated with a Leica DMi8/SP8 laser scanning confocal microscope system, with a 785 nm diode laser (laser power of 4.5 mW on the sample, intensity of ~ 5.7 × 105 W cm−2) and a 1200 l mm−1 grating. Light was collected using a near infrared enhanced CCD array detector (1024 × 256 pixels). Prior to every experiment, a spectrum of a silicon sample was collected and the microscope was calibrated to the peak position (520.5 cm−1). The sample was drop cast onto a quartz slide from an aqueous suspension and dried under nitrogen. Spectra were collected with a 40× objective (NA 0.85 HCX PL APO CORR CS) acquiring for 200 s. Baseline subtraction was done using the Matlab function f_baseline_corr with bandwidth of 350, smoothwidth of 30 and 20 iterations50 (link). Spectra were analysed with reference to Raman spectra of folic acid51 (link) and riboflavin52 (link).
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10

Characterization of Ayurvedic Bhasma Formulations

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The as-prepared Bhasmas at each intermediate stage (i.e. Shodhana, Dhanyabhraka and Marana) was characterized by using sophisticated instruments. X-ray diffractometer SHIMADZU AA -7000, equipped with photo scintillation detector, between 2θ ranges 10–80°, rate of scanning was kept at 5°/min was used for XRD studies. The FTIR analysis was carried out using FTIR Model, SHIMADZU 8400. The spectra were recorded between 4000 and 400 cm−1. Raman spectroscopy was done using RENISHAW – Invia Raman Microscope in the region 2000-100 cm−1 at wavelength λ = 532 nm. Thermal analysis (TGA-DTA) was carried out using METTLER TOLEDO –DSC821 instrument. The heating rate was 10 °C/min over the range of 25°-1000 °C in air atmosphere. Brauner Emmet Teller method (BET) was used to calculate surface area using SURFER Thermo Scientific instrument. Scanning electron microscope (SEM) Model: NOVANANO SEM-450 equipped with Energy dispersive X-rays analysis (EDAX) was used to study the morphology and elemental analysis. TEM was carried out using PHILIPS model - CM 200 with accelerating voltage 20–200 kv and resolution 0.24 nm.
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