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Nsg01 probes

Manufactured by NT-MDT

NSG01 probes are scanning probe microscopy (SPM) tips designed for high-resolution imaging and characterization of nanoscale samples. They feature a sharp silicon nitride (Si3N4) tip with a radius of curvature less than 10 nanometers, optimized for use in atomic force microscopy (AFM) and other SPM techniques. The probes are suitable for a variety of applications, including materials science, life sciences, and nanotechnology research.

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Lab products found in correlation

2 protocols using nsg01 probes

1

Surface Morphology Analysis of LB SA Coatings

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The surface morphology of the formed coatings based on LB SA films deposited onto the Si surface were studied by atomic force microscopy (AFM) using an NT-MDT Ntegra AFM probe microscope (NT-MDT, Zelenograd, Russia). Si substrate was chosen due to its availability, and it has a hydrophilic surface with a contact angle of less than 90°, like quartz. The scanning was carried out in a semi-contact mode with a frequency of 1 Hz. NSG01 probes (NT-MDT, Zelenograd, Russia) with a probe curvature radius of less than 10 nm were used for scanning. The obtained images with a resolution of 256 × 256 pixels were processed using the Gwyddion 2.61 software package [33 (link),34 (link)] to calculate the roughness and surface area of the film. The film roughness was calculated by the formula: Ra=1Nj=1N|rj|
where Ra is the arithmetic mean of the absolute values of the profile deviations within the base length (middle line of the profile), N is the number of points where the deviation is measured, and rj is the deviation of the absolute value from the midline of the profile at a point.
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2

Morphological Examination of Cells by AFM

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In order to perform morphological examination by AFM, the samples were fixed onto the surface of a coverslip by incubation with 2.5% glutaraldehyde in PBS for 1 h. The samples were further fixed with osmium tetroxide (0.1%) in PBS for 1 h. Osmium tetroxide was removed by washing twice in PBS. The drying of samples was performed with an increasing concentrations of ethanol (10%, 30%, 50%, 70%, 95% and 100%) and finally in acetone. Topographic AFM measurements were performed in the semi-contact mode under ambient conditions using the NTEGRA Prima system from NT-MDT (NT-MDT Co. Moscow, Russia). NSG01 probes from NT-MDT with a typical tip curvature radius of about 6 nm and a typical force constant of 5 N/m were used. Topographic images were processed using the instrument-equipped software by the plane subtraction or by the fitting with the first order lines. For the calculation of the root-mean-square (RMS) of the surface roughness, only cell surfaces were selected from AFM images and then RMS was directly generated by the instrument software, using a total of 10 cell measurements for each ghost preparations.
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