where Ra is the arithmetic mean of the absolute values of the profile deviations within the base length (middle line of the profile), N is the number of points where the deviation is measured, and rj is the deviation of the absolute value from the midline of the profile at a point.
Nsg01 probes
NSG01 probes are scanning probe microscopy (SPM) tips designed for high-resolution imaging and characterization of nanoscale samples. They feature a sharp silicon nitride (Si3N4) tip with a radius of curvature less than 10 nanometers, optimized for use in atomic force microscopy (AFM) and other SPM techniques. The probes are suitable for a variety of applications, including materials science, life sciences, and nanotechnology research.
Lab products found in correlation
2 protocols using nsg01 probes
Surface Morphology Analysis of LB SA Coatings
where Ra is the arithmetic mean of the absolute values of the profile deviations within the base length (middle line of the profile), N is the number of points where the deviation is measured, and rj is the deviation of the absolute value from the midline of the profile at a point.
Morphological Examination of Cells by AFM
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