Jsm 5400 scanning electron microscope
The JSM-5400 is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to produce high-resolution images of sample surfaces by scanning them with a focused beam of electrons. The JSM-5400 can magnify samples up to 300,000 times and provides detailed information about the topography, composition, and other characteristics of the specimen.
Lab products found in correlation
2 protocols using jsm 5400 scanning electron microscope
Morphological Characterization of Lyophilized Films
Scanning Electron Microscopy Protocol
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