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Jem 1200ex tem

Manufactured by Ametek

The JEM-1200EX TEM is a transmission electron microscope (TEM) manufactured by Ametek. It is designed to provide high-resolution imaging and analysis of materials at the nanometer scale. The JEM-1200EX TEM is capable of generating and transmitting a focused electron beam through a thin sample, allowing for detailed examination of the sample's internal structure and composition.

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2 protocols using jem 1200ex tem

1

Transmission Electron Microscopy Imaging

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Multiple ultrathin sections (of 70–80 nm) were cut on a Reichart Ultracut E, collected on Formvar coated copper slot grids, post-stained with uranyl acetate (saturated solution) and Reynold’s lead citrate, and initially imaged at a JEOL JEM-1200EX TEM with a 1k CCD camera (GATAN) in order to get overview maps of the sections and localize the cells of interest. Then, for high-resolution images of these cells, we imaged them at a 200 kV Tecnai F20 intermediate voltage TEM (FEI, Inc., Hillsboro, OR, USA) with a 4k CCD camera (GATAN), at 19,000× magnification (1.12 nm pixel size). For large overviews of the cells at medium magnification, we acquired montages of overlapping images in an automated fashion using the microscope control software SerialEM.60 (link)
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2

Morphological Analysis of Phage vB_SbaS_Y11

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The morphological characteristics of vB_SbaS_Y11 were observed through TEM. Firstly, 20 µL of the concentrated phage solution was dispensed onto a copper grid and then let stand for 15 minutes without light. The negative stain was performed with phosphotungstic acid (2 wt%, pH 7.5) for 5 minutes (45 (link)). The JEOL model JEM-1200EX TEM, containing the GATAN INCCCD image transfer system, was utilized to capture clear electron micrographs at 100 kV. Subsequently, electron micrographs were used to estimate the phage dimensions.
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