Senterra confocal raman microscope instrument

Analytical thin-layer chromatographies were performed using aluminium-coated Merck Kieselgel 60 F254 plates. NMR spectra were recorded on a Bruker Avance 400 (¹H: 400 MHz; ¹³C: 100 MHz) spectrometers at 298 K, using partially deuterated solvents as internal standards. Coupling constants (J) are denoted in Hz and chemical shifts (δ) in ppm. Electrospray ionization mass spectrometry and matrix-assisted laser desorption ionization (coupled to a time-of-flight analyzer) experiments were recorded on a HP1100MSD spectrometer and a Bruker REFLEX. TGA were performed using a TA Instruments TGAQ500 with a ramp of 10 °C min⁻¹ under air from 100 to 1000 °C. TEM images were obtained with JEOL-JEM 2100F instrument or a JEOL-JEM GRAND ARM300cF (AC-HRTEM). AFM images were acquired using a JPK NanoWizard II AFM working in dynamic mode. NT-MDT NSG01 silicon cantilevers, with typical values of 5.1 N m^–1 spring constant and 150 kHz resonant frequency, were employed under ambient conditions in air. TRXF analyses were performed on a TXRF 8030c - FEI Spectrometer. Raman spectra were acquired with a Bruker Senterra confocal Raman microscope instrument equipped with 532, 633, and 785 nm excitation lasers. UV-vis-NIR spectra were performed using a Shimadzu UV-VIS-NIR Spectrophotometer UV-3600. PLE intensity maps were obtained with NanoLog 4 HORIBA instrument.

Experiments are acquired with a Bruker Senterra confocal Raman microscope instrument equipped with a 532 nm excitation laser. Acquisition parameters are: 2 mW, 5 s integration time, 10 co-additions, 1–15 cm⁻¹ resolution.