Powder X‐ray diffraction was measured by a Bruker D8 Advance X‐ray diffractometer with Cu Kα radiation. PL and luminescence decay were obtained on FSL‐1000 (Edinburgh Instruments Ltd.). PLQY was measured by FSL‐1000 (Edinburgh Instruments Ltd.) equipped with an integrated sphere. RL was recorded by an Edinburgh FS5 fluorescence spectrophotometer equipped with an external miniature X‐ray source (AMPEK, Inc.). X‐ray imaging was performed by a homemade setup with the use of an external miniature X‐ray tube, a CuI(py) cluster structure‐doped film, and a digital camera as excitation, scintillation screen, and detector, respectively.
Fsl1000
Manufactured by Edinburgh Instruments
Sourced in United Kingdom
The FSL1000 is a high-performance fluorescence spectrometer designed for a variety of laboratory applications. It features a monochromator-based optical system, a sensitive detector, and advanced data acquisition capabilities. The core function of the FSL1000 is to measure the fluorescence emission spectra of samples with high accuracy and precision.
Automatically generated - may contain errors
Lab products found in correlation
D8 advance, by Bruker (2 mentions)
D8 advance x, by Bruker (1 mentions)
Ht7700, by Hitachi (1 mentions)
Gemini 300 microscope, by Zeiss (1 mentions)
Uv 3600 spectrophotometer, by Shimadzu (1 mentions)
Sigma 300, by Zeiss (1 mentions)
D8 advance diffractometer, by Bruker (1 mentions)
Su3500, by Hitachi (1 mentions)
5 protocols using fsl1000
1
Multimodal Characterization of Luminescent Materials
2
Advanced Material Characterization Techniques
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Scanning electron microscopy was performed using a Zeiss Gemini 300 microscope at a voltage of 3 kV. Transmission electron microscopy was conducted on a Hitachi HT 7700 operating at 120 kV. Powder X-ray diffraction characterization was carried out using a Bruker D8 Advance X-ray diffractometer with Cu Kα radiation. Photoluminescence emission profiles and decay curves were obtained using an FSL-1000 (Edinburgh Instruments Ltd.). PLQY measurements were performed on a C9920-02G system (Hamamatsu). Radioluminescence emission profiles were acquired using an Edinburgh FS5 fluorescence spectrophotometer (Edinburgh Instruments Ltd.), equipped with an external miniature X-ray source from AMPEK, Inc.
3
Comprehensive Characterization of CsPbBr3 Microcapsules
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The particle size distribution of the microcapsules was measured using a Zetasizer Nano ZS90 laser particle size analyzer at room temperature. The morphologies of the CsPbBr3 microcapsules were characterized using a Zeiss Sigma 300 field emission scanning electron microscope (FE-SEM). The lead concentration in deionized water was measured by an inductively coupled plasma mass spectrometry (ICP-MS) (using Octopole reaction system, Agilent model 7500ce). Fourier-transform infrared spectra (FT-IR) were collected in the transmittance mode on a Nicolet IS10 FTIR spectrophotometer. X-ray diffraction (XRD) data were collected on a Bruker D8 Advance diffractometer. UV-Vis absorption spectra were recorded on a Shimadzu Corporation UV-3600 spectrophotometer. Photoluminescence (PL) spectra and sample PL decay curves were excited using a 405 nm LED fluorescence spectrophotometer (Edinburgh FSL1000).
4
Comprehensive Nanoparticle Characterization Protocols
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The crystal structure and morphology of the final nanoparticles were examined via the use of an X-ray diffractometer (Bruker D8 Advance, Cu Kα radiation, wavelength is 1.5406 Å, Bremen, Germany) and a field-emission scanning electron microscope (FE-SEM; HITACHI SU3500, Tokyo, Japan). The excitation and emission spectra of the designed nanoparticles were recorded through a fluorescence spectrometer (FS5, Edinburgh, UK), in which the surrounding temperature of nanoparticles was adjusted by a heating platform (Linkam HFS600E-PB2, Salfords, UK). Next, to measure the excitation spectrum, an optical filter with the cutoff wavelength of 510 nm (i.e., λ ≤ 510 nm), was adopted, whereas a cutoff filter (λ ≥ 400 nm) was employed to record the emission spectrum. Via the utilization of a fluorescence spectrometer (FSL1000, Edinburgh, UK), the decay time and luminescence efficiency of the resultant nanoparticles were tested. A multichannel spectroradiometer (SPEC-3000A; Measurefine; Hangzhou City, China) was applied to characterize the electroluminescence (EL) features of the developed white-LED.
5
Characterization of Nanocrystalline Photoluminescence
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The crystal structure, phase, crystal size and morphology of the nanocrystalline were characterized by powder X-ray diffraction (XRD, Miniflex 600) and transmission electron microscope (TEM, Talos-F200X). The photoluminescence spectra, decay curves, and fluorescence quantum yield were measured by using a fluorescence spectrophotometer (Edinburgh FSL1000). The radioluminescence spectra, radiation luminescence stability and X-ray sensitivity were recorded by photon counting equipped with X-ray source (W-target, 5 W). The SEM images of the films were obtained by field emission scanning electron microscopy (SU-8010). Radiation imaging of the Composites Films was acquired by our home made imaging device equipped with a digital camera (Canon 5D4 with Sigma 180 mm F2.8 Apo Macro DG HSM).
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