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System 1000

Manufactured by Renishaw
Sourced in United Kingdom

The Renishaw System 1000 is a versatile data acquisition system designed for high-performance measurement applications. It offers a modular and scalable architecture, enabling users to configure the system to meet their specific measurement requirements.

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4 protocols using system 1000

1

Characterization of Synthesized Materials

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The structural morphology of
the synthesized materials was investigated
using high-resolution TEM (model: TECNAI G2 30ST; manufacturer: FEI
Company, The Netherlands). Crystallographic characteristics of the
materials were examined using an X-ray diffractometer with the Cu
Kα line (model: D8 ADVANCE; manufacturer: Bruker Corporation,
MA, USA) and XPS (model: PHI 5000 Versa probe II XPS system) having
a source of Al Kα and charge neutralizer at room temperature.
The nitrogen adsorption–desorption isotherms of the materials
are measured using Quantachrome Instruments version3.0. The base pressure
was maintained at 6 × 10–10 mbar with an energy
resolution of 0.6 eV. The Raman spectroscopic analysis was performed
using Renishaw Raman System 1000 calibrated using a silicon standard.
Mass spectroscopic results were obtained using liquid chromatography–mass
spectrometry (Waters 2695, USA) spectrometer.
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2

Graphene Functionalization by Plasma Treatment

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The graphene sheet was functionalized by plasma treatment, employing a 50 kHz radio frequency plasma source at 50 W using a plasma generator (CUTE, Femto Science Co. Ltd., Hwaseong-Si, Korea). The plasma treatment was carried out at 28 °C (gas pressure fixed at 1 × 10−2 Torr) on the graphene gate channel in an O2 gas environment to oxidize for 10 s or in a C3F8 gas environment to fluorinate for 20 min. The O2 and C3F8 gas flow rates were maintained at 20 and 10 sccm, respectively. Thereafter, the fluorinated graphene gate channel was exposed to air at 28 °C and left to stabilize for 72 h.
A spatially resolved X-ray photoelectron spectroscope (XPS; Thermo Fisher, Waltham, MA, USA) was used for determining the surface composition and bonding state of the functionalized graphene sheets with a monochromatic Al Kα (1486.6 eV) X-ray source. The beam diameter was set to 400 μm, and survey scans using a resolution of 10 scans were performed on the graphene that was transferred onto the SiO2/Si substrate. The properties of the functionalized graphene were characterized by Raman spectroscopy (Renishaw, system1000, Gloucestershire, UK) using an argon-ion laser at an excitation wavelength of 514 nm and a spot size of 1 μm. All Raman measurements were performed at room temperature.
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3

Comprehensive Materials Characterization Protocol

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The microscopy studies were carried out using field emission scanning electron microscopy (FE-SEM) (Tescan MAIA 3 LM) and transmission electron microscopy (TEM) (Jeol JEM-2100), and the crystal structures were analyzed using an X-ray diffractometer (XRD) (SmartLab) with Cu–Kα radiation (λ = 1.5406 Å). Thermogravimetric analysis was performed using an Auto-TGA Q500 instrument (TA Instruments). Raman analysis was performed using System 1000 (Renishaw). The Brunauer–Emmett–Teller (BET) specific surface area and pore size distribution were measured by nitrogen adsorption and desorption experiments at −196 °C using an accelerated surface area and porosity analyzer (ASAP 2420, Micromeritics).
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4

In-Situ Raman Spectroscopy of Thermal Behavior

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Raman spectra were collected using a single monochromator Renishaw System 1000 equipped with a thermoelectrically cooled CCD detector (200 K) and an edge filter. A laser of 514 nm Ar line was used and the spectral resolution was 3 cm -1 and 0.9 mW laser power on sample. The Raman spectrometer was equipped with an in situ environmental cell (Linkam TS-1500) where both the temperature and the gaseous composition were controllable. Initially, the spectra of the samples were taken at room temperature. Then, the materials were maintained at 373 K for 1500 sec and further heated to 773 K at 10 K/min under an atmosphere of high purity grade He (99.999%) at 30 cm 3 /min, as reported elsewhere 11, 15 . The spectra were taken every 50 K along the temperature ramp.
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