the synthesized materials was investigated
using high-resolution TEM (model: TECNAI G2 30ST; manufacturer: FEI
Company, The Netherlands). Crystallographic characteristics of the
materials were examined using an X-ray diffractometer with the Cu
Kα line (model: D8 ADVANCE; manufacturer: Bruker Corporation,
MA, USA) and XPS (model: PHI 5000 Versa probe II XPS system) having
a source of Al Kα and charge neutralizer at room temperature.
The nitrogen adsorption–desorption isotherms of the materials
are measured using Quantachrome Instruments version3.0. The base pressure
was maintained at 6 × 10–10 mbar with an energy
resolution of 0.6 eV. The Raman spectroscopic analysis was performed
using Renishaw Raman System 1000 calibrated using a silicon standard.
Mass spectroscopic results were obtained using liquid chromatography–mass
spectrometry (Waters 2695, USA) spectrometer.