Nova nanosem 450

Samples were characterized by Ultra high resolution field emission scanning electron microscopy (fe-sem, Nova NanoSEM 450) and transmission electron microscopy (TEM, Tecnai G2 F30) at an accelerating voltage of 200 kV. X-ray diffraction (XRD) patterns of the as prepared samples were recorded on a SHIMADZU XRD-7000S diffractometer with Cu K as the radiation source in the a range of 10-90° with a scan speed of 5° min⁻¹. The Brunauer–Emmett–Teller (BET) specific surface areas were measured by JW-BK132F at −196 °C. The pore volumes and pore diameter distributions were calculated with the Barrett–Joyner–Halenda (BJH) model. Particle sizes were acquired on a Malvern Zeta sizer Nano ZS. X-ray irradiation was performed using BJI-1 (Xianwei, Shanghai, China) at a voltage of 60–75 kV and a current of 0.15–0.35 mA. Confocal laser scanning microscopy (CLSM) images were recorded on a Leica TCS SP8 inverted confocal microscope. DOX loading and release studies were carried out in a Shimadzu UV-1800 spectrophotometer. The determination of ROS was measured using Hitachi F-7000 fluorescence spectrophotometer. The cell cytotoxicity was assessed by BioTek SynergyH1 Full-featured microplate detector.