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357 protocols using jsm 7001f

1

Implant Surface Characterization by Electron Microscopy

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The study of the morphology and elemental composition of the implant surfaces depending on the cleaning method compared to the control implants was performed by electron microscopic methods. Electron microscopy studies were carried out in the laboratory of electron microscopy of the Center for Collective Use of the Siberian Federal University on a scanning electron microscope (SEM) JEOL JSM 7001F (JEOL Ltd., Akishima, Japan). The surface morphology was studied in the secondary electron mode (sei) at ×1500 and ×5000 magnifications.
The JEOL JSM 7001F is equipped with an INCAPentaFETx3 energy-dispersive spectrometer (Oxford Instruments, Oxford, UK), which allows for analyzing chemical elements from B (boron) to U (uranium). The X-ray spectral microanalysis (EDX) method with a high degree of locality makes it possible to determine the elemental composition of an object. Before studying the elemental composition of the samples, the spectrometer was calibrated against Co at an operating accelerating voltage of 15 kV. X-ray spectral microanalysis was carried out at an accelerating voltage of 15 kV, a beam current of 7 × 10−9 A, and a working distance of 10 mm.
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2

Surface Characterization of TiO2 by SEM, EDX, and XPS

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In order to examine the difference in the surface structure, surface analysis was carried out by scanning electron microscopy (SEM, JSM‐7001F, JEOL Ltd, Japan), energy dispersive X‐ray (EDX, JSM‐7001F, JEOL Ltd, Japan), and X‐ray photoelectron spectroscopy (XPS, ESCALAB 220i‐XL, VG Scientific Instruments). In addition, the surface hydrophilicity of TiO2 was studied by measuring the static contact angle with a sessile drop of distilled water deposited on the sample surface.35 The volume of the liquid was kept constant (10 μl), and each contact angle value was the average of five measurements at room temperature.
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3

Characterizing Chelyabinsk Meteorite Melt Veins

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We selected several fragments of Chelyabinsk meteorite containing shock-melt veins. They were embedded in epoxy and cut at the center. The cut surface was polished with diamond abrasive and isopropyl alcohol. The polished samples were carbon-coated and observed with scanning electron microscopes (Hitachi S-3400N and JEOL JSM-7001F). Accelerating voltage and probe current were 15 kV and 1.4 nA, respectively. Chemical compositions of the constituent phases were determined with an energy-dispersive X-ray spectrometer attached to the SEM, JEOL JSM-7001F. Phase identification of materials was conducted with a micro-Raman spectrometer (JASCO NRS-5100). Wavelength and power of the laser were 532 nm and 6.5 mW, respectively. The laser beam was focused to ~1 μm in diameter on the sample through an attached ×100 objective lens. Raman signals from the sample were collected for 60–240 seconds and accumulated twice for each spectrum. Raman shift was calibrated with the strong peak of silicon standard at 520 ± 0.5 cm−1.
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4

Spherical Particle Size Analysis by SEM

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The spheres were sonicated for 5 min in an ultrasonic water bath, and 3 μL of the sphere suspension was placed on a cover glass to dry. The samples were subsequently sputtered with an Au layer using a Quorum Sputter Coater Q150T ES (Quorum Technologies, Ringmer, UK), and then, the samples were analyzed under a JEOL JSM-7001F (JEOL. Ltd, Tokyo, Japan) field emission scanning electron microscope at a 15 kV accelerating voltage. Energy-dispersive X-ray spectroscopy was performed using an X-Max silicon drift detector (Oxford Instruments, Abingdon, UK) and analyzed using INCA Energy software (Oxford Instruments Analytical, High Wycombe, UK).
At least 70 individual spheres were measured on several randomly selected SEM images to calculate an average particle size. The particle sizes were determined with ImageJ 1.46r software by measuring the diameter of separated particles. The values represent the mean from three independent experiments.
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5

Characterization of Fabricated Films

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The fabricated films were subsequently imaged by scanning electron microscope (SEM) JEOL JSM-7001F (JEOL Ltd., Tokyo, Japan). The thickness of the films and their roughness were measured by an atomic force (AFM) neaSNOM Microscope (neaspec GmbH, Munich, Germany). Electrical measurements were carried out using a 4-probe station (Jandel Engineering Ltd., Linslade, UK) from Jandel with a collinear geometry of the location of the probes and started with 10 nA, gradually increasing the current to 100 μA.
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6

Characterization of Fluorinated Hydroxyapatite Coatings

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The morphology of the developed coatings was evaluated using a scanning electron microscope JEOL-JSM7001F, at an operating voltage of 20 kV. The chemical composition of the coatings was determined using an X-ray energy dispersive spectrometer (EDS) analysis. The particle size of the F 0.1 coating was studied using a Transmission Electron Microscope (TEM) (Hitachi H-8100-NA with an acceleration voltage of 200 kV). Before imaging, F 0.1 coating particles were detached from the titanium substrate and dispersed in ethanol. Then, the suspension particles were placed on the carbon-coated copper grid and dried at room temperature. Attenuated total reflectance (FTIR-ATR) spectroscopy using a Nicolet (Thermo Electron) was used to characterize the functional groups and chemical composition of the HA, F 0.01, and F 0.1 coating over a range of 650–4000 cm−1 and a resolution of 8 cm−1. X-ray photoelectron spectroscopy (XPS; Kratos Axis Ultra HSA, Aluminum mono, Eo = 15 kV (90 W) 1 eV per step in a 300 μm × 700 μm area) was used for fluorine, calcium, and phosphorus content analysis at the surface of the F 0.1 coating.
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Spherical Morphology Analysis by SEM

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The morphology of the spheres was examined using SEM. The sphere suspension was placed on a cover slip and dried. Next, the samples were sputtered with an Au/Pd layer in a Quorum Sputter Coater Q150T ES (Quorum Technologies, Ringmer, UK) and analyzed with a JEOL JSM-7001F (JEOL Ltd, Tokyo, Japan) field emission scanning electron microscope at 10 kV accelerating voltage. The size was determined by measuring the diameter of spheres in three images captured at 10,000× magnification using the SmileView software program (JEOL Ltd). The experiment was repeated three times.
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8

Bioblend Morphology Analyzed by SEM

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Bioblend morphology was assessed using a JEOL JSM-7001F scanning electron microscope (JEOL Ltd., Tokyo, Japan). The accelerating voltage select was 2 kV. Samples were collected from cryogenic fractured compression molded plates under controlled impact energy. Due to its non-conductive nature, all the samples were coated with platinum/palladium 80/20 wt %.
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9

Surface Wettability and AgNPs Characterization

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Surface wettability was assessed by the sessile drop method in a goniometer (OCA 15, Dataphysics instrument, Filderstadt, Germany), where a 3.0 µL MilliQ water drop was deposited at 1 µL/s on the surface of each sample. Three drops per sample and three samples per condition were tested.
The presence of AgNPs on the Ti-AgNPs and Ti-Ag/PLATF samples was evaluated with a SEM coupled with an EDS detector (JEOL JSM-7001F, Jeol Ltd., Japan). SEM images were analyzed to determine the average size of the AgNPs deposited through ImageJ software (1.53q, NIH, Bethesda, MD, USA) by binarization and the posterior automatic quantification of quasi-spherical particles.
The surface chemical composition of all samples was evaluated with XPS, acquired with a non-monochromatic Mg anode X50 source, operating at 150 W, and a Phoibos 150 MCD-9 detector (D8 advance, SPECS Surface Nano Analysis GmbH, Berlin, Germany). Casa XPS software (Version 2.3.16) was used to analyze the spectra. Peaks were fitted in relation to the C1s signal at 284.8 eV. Two samples per condition were evaluated.
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10

Hydrogel Microstructural Characterization

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Discs (diameter 12 mm) of each type of hydrogel were fully hydrated in DD water for 24 h and thereafter, carefully blotted with absorbent paper, placed in a freezer at −80 °C for 30 min and lyophilized (ModulyoD-230, from Thermo Electron Corporation, Asheville, NC, USA) during 48 h. The resulting samples were coated with a thin layer (20 nm) of gold/palladium (Au:Pd = 80:20) using a Quorum Technologies (Q150T-ES) turbo-pumped sputter coater and analyzed in a Field Emission Gun-Scanning Electron Microscope (FEG-SEM, JEOL JSM-7001F, Tokyo, Japan) using an accelerating voltage of 3 kV. For comparison purposes, cylindrical specimens (diameter 12 mm) of HC were also coated with the conductive layer and evaluated.
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