The JEOL JSM 7001F is equipped with an INCAPentaFETx3 energy-dispersive spectrometer (Oxford Instruments, Oxford, UK), which allows for analyzing chemical elements from B (boron) to U (uranium). The X-ray spectral microanalysis (EDX) method with a high degree of locality makes it possible to determine the elemental composition of an object. Before studying the elemental composition of the samples, the spectrometer was calibrated against Co at an operating accelerating voltage of 15 kV. X-ray spectral microanalysis was carried out at an accelerating voltage of 15 kV, a beam current of 7 × 10−9 A, and a working distance of 10 mm.
Jsm 7001f
The JSM-7001F is a field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It is designed for high-resolution imaging and analysis of a wide range of materials and samples. The JSM-7001F provides exceptional image quality and analytical capabilities.
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357 protocols using jsm 7001f
Implant Surface Characterization by Electron Microscopy
The JEOL JSM 7001F is equipped with an INCAPentaFETx3 energy-dispersive spectrometer (Oxford Instruments, Oxford, UK), which allows for analyzing chemical elements from B (boron) to U (uranium). The X-ray spectral microanalysis (EDX) method with a high degree of locality makes it possible to determine the elemental composition of an object. Before studying the elemental composition of the samples, the spectrometer was calibrated against Co at an operating accelerating voltage of 15 kV. X-ray spectral microanalysis was carried out at an accelerating voltage of 15 kV, a beam current of 7 × 10−9 A, and a working distance of 10 mm.
Surface Characterization of TiO2 by SEM, EDX, and XPS
Characterizing Chelyabinsk Meteorite Melt Veins
Spherical Particle Size Analysis by SEM
At least 70 individual spheres were measured on several randomly selected SEM images to calculate an average particle size. The particle sizes were determined with ImageJ 1.46r software by measuring the diameter of separated particles. The values represent the mean from three independent experiments.
Characterization of Fabricated Films
Characterization of Fluorinated Hydroxyapatite Coatings
Spherical Morphology Analysis by SEM
Bioblend Morphology Analyzed by SEM
Surface Wettability and AgNPs Characterization
The presence of AgNPs on the Ti-AgNPs and Ti-Ag/PLATF samples was evaluated with a SEM coupled with an EDS detector (JEOL JSM-7001F, Jeol Ltd., Japan). SEM images were analyzed to determine the average size of the AgNPs deposited through ImageJ software (1.53q, NIH, Bethesda, MD, USA) by binarization and the posterior automatic quantification of quasi-spherical particles.
The surface chemical composition of all samples was evaluated with XPS, acquired with a non-monochromatic Mg anode X50 source, operating at 150 W, and a Phoibos 150 MCD-9 detector (D8 advance, SPECS Surface Nano Analysis GmbH, Berlin, Germany). Casa XPS software (Version 2.3.16) was used to analyze the spectra. Peaks were fitted in relation to the C1s signal at 284.8 eV. Two samples per condition were evaluated.
Hydrogel Microstructural Characterization
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