The field emission scanning electron microscope (FESEM, Carl Zeiss, Germany) operated at a voltage of 5 kV with energy dispersive X-ray (EDX, Aztec Analysis Software, England) was used to determine the elemental components.
Universal atr spectrometer
The Universal ATR spectrometer is a versatile laboratory instrument designed for infrared (IR) spectroscopy analysis. It employs the attenuated total reflection (ATR) technique to collect infrared spectra of solid, liquid, and semi-solid samples without specialized sample preparation. The core function of the Universal ATR spectrometer is to provide users with a convenient and efficient way to obtain high-quality IR data for a wide range of materials.
Lab products found in correlation
10 protocols using universal atr spectrometer
Characterization of HAART-AgNPs Conjugates
The field emission scanning electron microscope (FESEM, Carl Zeiss, Germany) operated at a voltage of 5 kV with energy dispersive X-ray (EDX, Aztec Analysis Software, England) was used to determine the elemental components.
Comprehensive Characterization of Novel Compounds
Characterization of HAART-AgNPs Conjugates
Characterization of Nanoconjugates for HAART
Infrared Analysis of TiO2–HAP and HAP
Spectroscopic Characterization of Organic Compounds
Multi-Technique Characterization of EB-TiO2
X-Ray Diffraction analysis. The crystallinity of the modified Eb-TiO 2 was assessed using X-Ray Diffraction (XRD). The XRD diffractometer (PANalytical-Empyrean instrument; Co radiation 1.54056 A o ) was calibrated with a voltage of 40 kV, current of 40 mA, and time of 1 s and analyzed between 0° and 90 o (2 theta).
Transmission Electron Microscopy analysis. Transmission Electron Microscopy (TEM) was used to observe the particle size, shape, and distribution of EB-TiO 2 . Some amounts of the samples were dispersed in 5 ml ethanol and sonicated at 10 kV for 20 min. Then, thin cross-sections of cryo-microtomed specimens were prepared using a Leica microtome (South Africa) and placed on carbon copper grids. Analysis was conducted using a transmission electron microscope (TEM-Philips CM 120 model) at 120 kV.
FTIR Spectroscopy of EPAM
Spectroscopic Characterization of Compounds
Structural Characterization of Eggshell-Derived Biomaterials
X-ray diffraction. X-ray diffraction (XRD) analysis was performed to observe the possible changes in crystallinity between the eggshell powder, calcined eggshell powder, and EnHAp. The XRD patterns were recorded using a diffractometer (PANalytical-Empyrean instrument; Co radiation 1.54056 Å) and analyzed between 0 and 90° (2θ). The voltage, current, and pass time used were 40 kV, 40 mA, and 1 s, respectively.
Field emission scanning electron microscopy. An SEM (field emission, Carl Zeiss) operating in controlled atmospheric conditions at 20 kV was used to examine the surface morphology of the samples. Prior to SEM observation, the surface was coated with a thin, electric conductive gold film to prevent a build-up of electrostatic charge.
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