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X pert 1710

Manufactured by Philips

The Philips X-pert 1710 is a laboratory equipment designed for X-ray diffraction analysis. It is capable of performing various X-ray diffraction techniques to identify and characterize crystalline materials.

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3 protocols using x pert 1710

1

Characterization of Nanoparticle Synthesis

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Material requirements were met by purchasing materials from Aldrich (China) and Merck (Germany) companies without any further purification. Thin-layer chromatography was used to monitor the reaction. Using silica-gel 60 F-254 as a matrix, TLC was conducted on glass plates. A Nicolet FT-IR 100 spectrometer was used to obtain infrared (IR) spectra. A Philips X-pert 1710 was used at room temperature to obtain X-ray diffraction (XRD) data. In addition, an energy-dispersive X-ray (EDAX) analysis of the nanoparticles was performed using a TESCAN MIRA III FE-SEM to determine their size and morphology. A Philips EM 208S at 120 kV was used to perform transmission electron microscopy (TEM). In the range of 25–800 °C, a thermal gravimetric analyzer was used to perform thermogravimetric analysis (TGA).
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2

Comprehensive Characterization of Synthesized Products

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The characterization of obtained products was carried out using scanning electron microscope (SEM), energy dispersive x-ray spectroscopy (EDS), transmission electron microscope (TEM), X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FT-IR) and, vibrating sample magnetometer (VSM). SEM images were observed using SEM (PhilipsXL30 and S-4160) with gold coating equipped with EDS. TEM measurements were done at 120 kV (Philips, model CM120). Powder XRD spectrum was recorded at room temperature by a Philips X'pert 1710 diffractometer using Cu Kα (α¼ 1.54056 Å) in Bragg-Brentanogeometry (θ-2θ). FT-IR spectra were obtained over the region 400–4000 cm−1 with NICOLETIR 100 FT-IR and spectroscopic grade KBr. The magnetic properties of catalyst were attained by Vibrating Sample Magnetometer/Alternating Gradient Force Magnetometer (VSM/AGFM, MDK Co., Iran, http://www.mdk-magnetics.com).
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3

Synthesis and Characterization of Nanoparticles

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All required materials were purchased from Aldrich and Merck companies and were used without any further purification. The reaction was monitored by thin-layer chromatography. TLC was performed on glass plates incorporated with silica-gel 60 F-254. Infrared spectrums (IR) were determined by grade KBr on a Nicolet FT-IR 100 spectrometer. X-ray diffraction (XRD) data were obtained at room temperature by a Philips X-pert 1710. The size and morphology of the nanoparticles were determined by scanning electron microscopy (SEM) using a TESCAN MIRA III FE-SEM. Also, the elemental composition of the nanoparticles was studied by energy-dispersive X-ray (EDAX). Transmission electron microscopy (TEM) was performed using a Philips CM 120 at 120 kV. Thermal gravimetric analysis (TGA) was performed by a thermal analyzer with a heating rate of 10 °C min−1 in the range of 25–800 °C under the following air.
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