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Su8100 microscope

Manufactured by Hitachi
Sourced in Japan

The SU8100 is a high-resolution scanning electron microscope (SEM) manufactured by Hitachi. It is designed to provide detailed imaging and analysis of a wide range of samples, including materials, semiconductors, and biological specimens. The SU8100 features advanced electron optics and a high-performance electron gun, enabling the microscope to achieve a high resolution and magnification.

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4 protocols using su8100 microscope

1

Multi-Technique Analysis of Nanomaterials

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Scanning electron microscopy (SEM) investigation was performed on a SU8100 micro-scope (Hitachi, Japan). The applied acceleration voltage was 10 kV. UV-visible absorption spectroscopy (UV-vis) was obtained by UV-2450 spectrophotometer (Shimadzu, Japan). Transmission electron microscope (TEM) measurement was performed at an acceleration voltage of 200 kV (JEM-2100, JEOL, Japan). Fourier transform infrared spectroscopy (FT-IR) was measured by a Vertex 70 spectrometer (Bruker, Germany) at room temperature on power-pressed KBr pellets. X-ray photoelectron spectroscopy (XPS) analysis was carried out using Mg Kα radiation (250 W, 14 kV) on a PHI5300 electron spectrometer (PE Ltd, USA). Atomic force microscopic (AFM) image was obtained on a Bruker Multimode 8 (Bruker. Inc, USA). All electrochemical experiments included cyclic voltammetry (CV) and differential pulse voltammetry (DPV) were performed on the electrochemical workstation (Autolab PGSTAT302N, Metrohm, Switzerland) using the traditional three electrode system. Briefly, the working electrode adopted bare or modified glassy carbon electrode (GCE). The reference electrode was a silver/silver chloride (Ag/AgCl) electrode saturated with potassium chloride, and the counter electrode was a platinum wire electrode. Raman spectra was measured using a 960FT-Raman spectrometer (Thermo Nicolet, USA).
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2

Characterization of Electrochemical Devices

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Scanning electron microscopy (SEM) images were collected on a SU8100 microscope (Hitachi, Japan) at an acceleration voltage of 5 kV. Transmission electron microscope (TEM) investigation was performed on a JEM-2100 microscope (JEOL Ltd., Japan) using an acceleration voltage of 200 kV. Electrochemical investigations including electrochemical impedance spectroscopy (EIS) and cyclic voltammetry (CV) were carried out on an Autolab electrochemical workstation (PGSTAT302N, Metrohm, Switzerland). Electrochemiluminescence (ECL) measurements were performed in a quartz cell using an MPI A multifunctional ECL analyzer (Xi’an Remax Electronic Science and Technology Co. Ltd.). The voltage of the photomultiplier tube was set at 400 V. A conventional three-electrode system was used for both electrochemical and ECL measurements. Briefly, a bare or modified ITO electrode was applied as the working electrode. A platinum disk (1 cm × 1 cm) was used as the counter electrode, and an Ag/AgCl electrode (saturated with KCl) was used as the reference electrode.
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3

Characterization of 3D Graphene Materials

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Scanning electron microscopy (SEM) investigation was performed on a SU8100 microscope (Hitachi Ltd., Tokyo, Japan) at an acceleration voltage of 10 kV. The Raman spectrum was recorded using the CRM200 Raman system (WITeck, Ulm, Germany) when excited using 514 nm laser. X-ray photoelectron spectroscopy (XPS) was obtained with Mg Ká radiation (Perkin Elmer, Waltham, MA, USA). All electrochemical measurements, including cyclic voltammetry (CV) and differential pulse voltammetry (DPV) were performed on the Autolab PGSTAT302N electrochemical workstation (Metrohm, Herisau, Switzerland). A conventional three electrodes system was employed. Briefly, a 3DG or p-3DG was applied as the working electrode and platinum wire was used as the counter electrode. The reference electrode was an Ag/AgCl electrode (saturated with KCl). For DPV measurement, the experimental parameters used were as follows: step, 0.005 V; modulation amplitude, 0.025 V; modulation time, 0.05 s; interval time, 0.2 s.
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4

Microscopic and Electrochemical Characterization of VMSF

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Transmission electron microscopy (TEM) images were obtained on a JEM-2100 microscope (JEOL, Japan) at an acceleration voltage of 200 kV. VMSF was mechanically peeled off from the ITO electrode surface, dispersed into ethanol, and finally dropped onto copper grids, to obtain TEM specimen. Scanning electron microscopy (SEM) images were collected from the SU8100 microscope (Hitachi, Japan) at an acceleration voltage of 10 kV. Cyclic voltammetry (CV) was taken on an Autolab PGSTAT302N electrochemical workstation (Metrohm, Switzerland). A conventional three electrodes system was employed with bare ITO or modified ITO electrode as the working electrode, an Ag/AgCl electrode (saturated with KCl) as the reference electrode, and a platinum electrode as the counter electrode.
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