Jsm 6700f
The JSM-6700F is a field emission scanning electron microscope (FE-SEM) manufactured by Thermo Fisher Scientific. It is designed to provide high-resolution imaging and analysis capabilities for a wide range of applications. The JSM-6700F features a field emission electron source, which allows for high-quality imaging at low accelerating voltages, making it suitable for the analysis of sensitive samples.
Lab products found in correlation
9 protocols using jsm 6700f
Comprehensive Materials Characterization
Multi-Technique Characterization of Catalysts
Scaffold Characterization via Microscopy
Characterization of Co9S8@Carbon Nanofibers
Characterization of Bi-Nb-O Powders
Comprehensive Characterization of Synthesized Products
phase composition of the as-synthesized products was characterized
by XRD (Shimadzu XRD-6000, Cu Kα radiation). The surface composition
of the products was evaluated by XPS (PerkinElmer model PHI 5600).
FESEM (JEOL, JSM-6700F) and TEM (FEI TF20 and JEM-2100F) were applied
to analyze the surface and microstructure. TG analysis was carried
on an instrument (Pyris Diamond TG-DTA) in air or N2. Fourier
transform infrared and Raman spectra were recorded on an Agilent Cary
660 Fourier transmission infrared and a Renishaw Raman spectrometer,
respectively. The pore volume and surface area of the as-obtained
products were estimated on a Micromeritics ASAP 2020 by the BET method
by nitrogen adsorption–desorption at 77 K.
Characterization of Material Samples
Characterization of Defective ZrS3 Nanoblades
Morphology and Elemental Analysis of PP Composites
The changes of elemental components on the surface of FPP and FPP-ER were analyzed by peripheral energy dispersive spectroscopy (EDS, JEOL JSM-7800F/ Oxford X-Max 80 SDD Detector).
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