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9 protocols using jsm 6700f

1

Comprehensive Materials Characterization

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The crystal structures of the materials were studied by XRD (Brucker D8 X‐ray diffractometer) with Cu Kα radiation (λ = 1.5418) at room temperature. IR spectra were measured with KBr pellets on a Bruker IFS‐66 V/S FTIR spectrometer. Thermogravimetric measurement was performed on preweighed samples in a nitrogen stream using a Netzsch STA 449C apparatus with a heating rate of 10 °C min−1 under N2 atmosphere. The morphologies of the materials were investigated using a field emission SEM (JEOL JSM‐6700F) and TEM (FEI Tecnai G2 F20 S‐TWIN). XPS was performed on ESCALAB 250 with Mg Kα as the X‐ray source. The Raman spectroscopy was tested using a Renishaw in via Raman microscope with Ar‐ion laser excitation (λ = 514.5 nm). MALDI‐TOF mass spectroscopy was recorded on a Bruker Autoflex II spectrometer. PAQS was measured in positive ion mode using trans‐2‐[3‐(4‐tert‐butylphenyl)‐2‐methyl‐2‐propenylidene]malononitrile (DCTB) as the matrix.
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2

Multi-Technique Characterization of Catalysts

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A Bruker D8 Advance X-ray diffractometer was used to analyze the crystal structures of the prepared catalysts. A Cary 500 ultraviolet-visible (UV-vis) diffuse reflectance spectrophotometer (DRS) was utilized to investigate the optical properties of the catalysts. A field-emission scanning electron microscope (FESEM; JSM-6700F) and a transmission electron microscope (TEM; JEM-2010, FEI, Tecnai G2 F20 FEG TEM) were used to determine the micromorphology of the as-synthesized samples. X-ray photoelectron spectroscopy (XPS) was performed using a Thermo Scientific ESCA Lab250 spectrometer consisting of monochromatic Al Kα as the X-ray source. All binding energies were calibrated to the C 1 s peak of surface adventitious carbon at 284.6 eV. The surface area of the samples was measured by the Brunauer–Emmett–Teller (BET) method using nitrogen adsorption and desorption isotherms on a Micrometrics ASAP 2020 system. PFM analysis was performed on a commercial piezoresponse force microscope (Oxford Instruments, MFP-3D). The photothermal effect of the sample was recorded by a Fotric IR thermal imager. Theoretical calculation and additional characterization have been provided in the Supplementary Methods.
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3

Scaffold Characterization via Microscopy

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The PD5 scaffold was analyzed using an ultraviolet spectrophotometer (NanoDrop2000, Thermofly, USA). Fabricated scaffolds were then scanned with a micro-CT (skyscan-1276, Bruker, Belgium) under the following scanning conditions: exposure (ms) = 360, voltage (kV) = 43, current (µA) = 200. A field emission scanning electron microscope (JSM-6700F, Japan) and an environmental scanning electron microscope (FEI QuANTA 200, Czech Republic) were used for surface characterization. An energy dispersive spectrometer (EDS, JSM-6700F, Japan) was employed to analyze the components.
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4

Characterization of Co9S8@Carbon Nanofibers

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A Rigaku D/max-2550 diffractometer with Cu Kα radiation was utilized to collect X-ray diffraction (XRD) characterizations. Microscopic morphologies of Co9S8@carbon nanofiber were evaluated by a field emission scanning electron microscope (JEOL JSM-6700F) and TEM (FEI Tecnai G2F20S-TWIN). The thermogravimetric analysis (TGA) was measured by SDT Q600. X-ray photoemission spectrum (XPS) was carried out on a VG scientific ESCALAB-250 spectrometer.
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5

Characterization of Bi-Nb-O Powders

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The structures of the Bi-Nb-O powders were characterized by X-ray diffraction (XRD; Rigaku-D/Max 2000) using Cu Kα radiation. The scanning electron microscope (SEM; JSM-6700F) and transmission electron microscope (TEM; Tecnai F20 S-Twin, FEI) were used to examine the morphologies and grain sizes of the powders. The specific surface area was measured on a surface area apparatus (Micromeritics TriStar 3000, Shamidzu) at 77 K by N2 adsorption/desorption method (BET method). The photoluminescence (PL) spectra were detected using an F-280 fluorescence spectrophotometer with excitation wavelength of 320 nm. X-ray photoelectron spectroscopy (XPS) analysis was performed on Thermo Fisher K-Alpha equipment.
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6

Comprehensive Characterization of Synthesized Products

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The
phase composition of the as-synthesized products was characterized
by XRD (Shimadzu XRD-6000, Cu Kα radiation). The surface composition
of the products was evaluated by XPS (PerkinElmer model PHI 5600).
FESEM (JEOL, JSM-6700F) and TEM (FEI TF20 and JEM-2100F) were applied
to analyze the surface and microstructure. TG analysis was carried
on an instrument (Pyris Diamond TG-DTA) in air or N2. Fourier
transform infrared and Raman spectra were recorded on an Agilent Cary
660 Fourier transmission infrared and a Renishaw Raman spectrometer,
respectively. The pore volume and surface area of the as-obtained
products were estimated on a Micromeritics ASAP 2020 by the BET method
by nitrogen adsorption–desorption at 77 K.
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7

Characterization of Material Samples

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The morphology of the samples was characterized by scanning electron microscopy (SEM) (JEOL JSM-6700F and FEI Sirion 200). The composition of samples was evaluated with Fourier transform infrared spectroscopy (FTIR, Nicolet 8700) and X-ray photoelectron spectroscopy (XPS, ESCALAB 250). The mechanical property of the samples was measured by a compression test (Instron 5565A) with the compressive strain from 0 to 95% in each cycle.
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8

Characterization of Defective ZrS3 Nanoblades

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UV-Vis-NIR spectrometer (Hitachi U4100), field emission SEM (FE-SEM, JEOL JSM6700F), TEM (FEI Titan 80-300, operated at 200 kV), XRD (Bruker D8 Advance), XPS (ESCALAB 250Xi) with Al Ka X-ray as the excitation source, EPR (JEOL FA200), tapping-mode AFM (MPF-3D, Asylum Research, CA, USA), and Raman spectroscopy (Horiba Jobin Yvon Modular Raman Spectrometer) with 514 nm laser excitation were employed to characterize different properties of the defective ZrS3 NBs, e.g. atomic and energy band structure. In particular, the samples for the TEM measurements were suspended in ethanol and supported onto a holey carbon film on a Cu grid.
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9

Morphology and Elemental Analysis of PP Composites

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The morphology of untreated PP, FPP and ER-FPP was characterized with a scanning electron microscope (JEOL JSM6700F, Japan) in a field-emission FEI Inspect F operated at 3 kV. Samples were suspended in ethanol for ultrasonic dispersion, dried, and fixed onto silicon wafers. The samples were then immediately sputter-coated with platinum before observation.
The changes of elemental components on the surface of FPP and FPP-ER were analyzed by peripheral energy dispersive spectroscopy (EDS, JEOL JSM-7800F/ Oxford X-Max 80 SDD Detector).
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