Jps 9010trx

The background subtraction and the peak deconvolution for the XPS spectra were performed using the SpecSurf, which is the original analysis software of the JPS‐9010TRX (JEOL) spectrometer. The other statistical tests in this study were performed using igor PRO (WaveMetrics).

We analyzed the surface of each sample by field emission SEM (JEOL, Tokyo, Japan) and XPS (JPS-9010TRX, JEOL, Tokyo, Japan) using Mg-Kα radiation at 10 kV and 10 mA. The average pore size was determined with the software CTAn (Skyscan, Bruker, MA).

The XRD patterns of the R/S/rac‐MBA_MoS₂ nanostructures were obtained using a MiniFlex600 + D/teX Ultra (Rigaku) diffractometer at 40 kV and 15 mA with a Cu‐K_α radiation source (λ = 1.54056 Å). Raman spectroscopy was performed on an NRS‐4100 (JASCO) spectrometer with a 20.1 mW laser (λ = 532 nm) from 100–1000 cm^–1. XPS measurements for Mo 3d, S 2p, N 1s and valence band region were recorded on a JPS‐9010TRX (JEOL) spectrometer with an Al‐K_α X‐ray at 12 kV and 25 mA. The peaks were resolved using the Shirley background and Voigt functions to identify the corresponding bonds. SEM and field‐emission (FE)‐TEM were performed using LSM‐7001F (JEOL) and JEM‐2100F(G5) (JEOL) microscopes, respectively. FE‐TEM was performed at an accelerating voltage of 200 kV using samples prepared on a carbon‐reinforced collodion film 250 square‐mesh copper grid (COL‐C10, Oken Shoji).