Scanning electron microscopy (SEM) observations of the plasmonic paper substrates were carried out in a Carl Zeiss AURIGA Crossbeam (FIB-SEM) Workstation equipped for EDS measurements. Transmission electron microscopy (TEM) specimens were prepared by placing one drop of the nanoparticles solution on a carbon-coated copper grid and drying at room temperature. TEM was performed with a HITACHI H-8100 microscope operated at 200 kV.
H 8100 microscope
Manufactured by Hitachi
Sourced in Japan
The Hitachi H-8100 microscope is a high-performance transmission electron microscope (TEM) designed for advanced materials analysis. It features a large specimen chamber, high-resolution imaging capabilities, and versatile image acquisition modes.
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Lab products found in correlation
Auriga crossbeam fib sem workstation, by Zeiss (1 mentions)
Dxr raman microspectrometer, by Thermo Fisher Scientific (1 mentions)
Nicolet is20 spectrometer, by Thermo Fisher Scientific (1 mentions)
Phenom prox, by Thermo Fisher Scientific (1 mentions)
Jsm 6700f, by JEOL (1 mentions)
Ir 2000 spectrometer, by Thermo Fisher Scientific (1 mentions)
Jem 2100 tem, by JEOL (1 mentions)
6 protocols using h 8100 microscope
1
Plasmonic Paper Substrate SEM and TEM
2
Multimodal Nanostructure Characterization
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A DXR Raman micro-spectrometer (Thermo Scientific, Waltham, MA, USA) was used for Raman spectra collection. The 532 nm laser was employed with a power output of 2.0 mW, 10 × 10 s scan periods using 900 lines/mm grating, and a 50 μm aperture.
For additional spectral analysis, Fourier transform infrared spectra were recorded using a KBr pellet technique in the 4000–400 cm−1 range. The 32 scans per spectrum were collected, enabling a 4 cm−1 resolution on the Nicolet iS20 spectrometer (Thermo Scientific, Waltham, MA, USA).
The morphology of prepared samples was analyzed using a field emission scanning electron microscope (FESEM) (JSM-6700F (JEOL)) and a Phenom ProX equipped with an energy-dispersive X-ray spectrometer (EDX) (Thermo Scientific, Waltham, MA, USA).
To confirm the nanostructures of synthesized samples, the transmission mode was also employed using an ultra-high resolution imaging H-8100 microscope (Hitachi Ltd., Chiyoda, Tokyo, Japan) with a LaB6 thermionic emission gun.
For additional spectral analysis, Fourier transform infrared spectra were recorded using a KBr pellet technique in the 4000–400 cm−1 range. The 32 scans per spectrum were collected, enabling a 4 cm−1 resolution on the Nicolet iS20 spectrometer (Thermo Scientific, Waltham, MA, USA).
The morphology of prepared samples was analyzed using a field emission scanning electron microscope (FESEM) (JSM-6700F (JEOL)) and a Phenom ProX equipped with an energy-dispersive X-ray spectrometer (EDX) (Thermo Scientific, Waltham, MA, USA).
To confirm the nanostructures of synthesized samples, the transmission mode was also employed using an ultra-high resolution imaging H-8100 microscope (Hitachi Ltd., Chiyoda, Tokyo, Japan) with a LaB6 thermionic emission gun.
3
Multimodal Characterization of Materials
4
Magnetic Characterization of Protists and MTB
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The DIC system was used to observe the morphology and movement of individual protists and MTB exposed to the magnetic field, and images and videos were used for analysis.
For transmission electron microscopy (TEM) observations a 5-μl purified sample of MTB or protists was placed on a carbon-coated TEM grid. To increase cell adhesion, the grids were placed on the S pole of a magnet. As the drops of water were about to dry, the grids were washed 23 times using Milli-Q water, then left to air dry at room temperature (Pan et al., 2019) (link).
The morphological characteristics of the MTB and MRP were observed using a Hitachi H8100 microscope operating at 100 kV. High resolution transmission electron microscopy (HRTEM), selected area electron diffraction (SAED), and X-ray energy-dispersive spectroscopy (XEDS) were carried out using a JEOL JEM-2100 TEM operated at 200 kV at the Institute of Geology and Geophysics, Chinese Academy of Sciences (IGGCAS).
For transmission electron microscopy (TEM) observations a 5-μl purified sample of MTB or protists was placed on a carbon-coated TEM grid. To increase cell adhesion, the grids were placed on the S pole of a magnet. As the drops of water were about to dry, the grids were washed 23 times using Milli-Q water, then left to air dry at room temperature (Pan et al., 2019) (link).
The morphological characteristics of the MTB and MRP were observed using a Hitachi H8100 microscope operating at 100 kV. High resolution transmission electron microscopy (HRTEM), selected area electron diffraction (SAED), and X-ray energy-dispersive spectroscopy (XEDS) were carried out using a JEOL JEM-2100 TEM operated at 200 kV at the Institute of Geology and Geophysics, Chinese Academy of Sciences (IGGCAS).
5
Nanoparticle Morphology Analysis by TEM
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The morphology of the nanoparticles was examined by transmission electron microscopy (TEM) on a H-8100 microscope (Hitachi High-Technologies Corporation, Tokyo, Japan). Nanoparticles were deposited in 200 mesh Cu formvar/carbon support film grids (Pelco® Tem grid Support Films, Ted Pella, Inc., Redding, CA, USA), dried for 10 min and further analyzed.
6
Nanoparticle Morphology Examination by TEM
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The morphology of NP was examined by TEM on a H-8100 microscope (Hitachi High-Technologies Corporation, Tokyo, Japan). Nanoparticles were deposited in 200 mesh Cu formvar/carbon support film grids (Pelco® Tem grid Support Films, Ted Pella, Inc., Redding, CA, USA), dried for 10 min and then further analysed.
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