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Toledo thermal analyzer

Manufactured by Mettler Toledo
Sourced in United States

The Toledo thermal analyzer is a precision instrument designed for thermal analysis of materials. It provides accurate measurement of thermal properties such as melting point, crystallization, and decomposition temperatures. The core function of this product is to enable researchers and analysts to characterize the thermal behavior of various substances through controlled temperature programs and sensitive detection of physical and chemical changes.

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3 protocols using toledo thermal analyzer

1

Thermal Analysis of CePO4 Samples

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Simultaneous differential thermal and thermogravimetric analysis (DTA/TG) of as-prepared reference CePO4 and C12GA-CePO4 dried samples (60 °C) was carried out with a Mettler Toledo thermal analyzer (under air conditions, using Pt crucibles and with a constant 10 °C/min heating from 25 up to 1000 °C, Columbus, OH, USA).
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2

Characterization of Synthesized Materials

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All reagents and solvents employed for this synthesis were purchased from commercial sources and used as received without further purification. The elemental analyses (C, H, and N) were determined with a PerkinElmer 240C elemental analyzer. Infrared spectra were recorded with a Varian 640 FT-IR spectrometer over the range of 500–4000 cm−1 with the use of KBr pellets as sample matrices. Powder X-ray diffraction (PXRD) data was collected using a Rigaku diffractometer with Cu Kα radiation. Thermogravimetric analysis (TGA) measurements were performed with a METTLER TOLEDO thermal analyzer at a heating rate of 5 °C min−1 under a N2 atmosphere. The morphology and structure of the sample was characterized via scanning electron microscopy (SEM, Nova Nano SEM 430) and high resolution transmission electron microscopy (HRTEM, JEOL 2010 at 200 kV). The specific surface area and pore structure of the sample was investigated with an automatic volumetric sorption analyzer (ASAP 2020 M) using N2 as the adsorbate at −196 °C. X-ray photoelectron spectroscopy (XPS) was performed using an Escalab 250 with an Al Kα radiation. UV-Vis absorption spectra were recorded with the use of an SP-1900 UV-Vis spectrophotometer.
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3

Comprehensive NMR and Thermal Analysis of Silicate Materials

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Corresponding 29 Si MAS NMR data were also measured at 7.05 T (Larmor frequency ν 0 = 59.59 MHz) on a Bruker Avance HD-300 Spectrometer. A Bruker 7 mm dual channel HX MAS probe was utilized to facilitate MAS frequencies (ν r ) of ~5 kHz for all measurements. The single pulse experiments consisted of a π / 2 excitation pulse of 4.0 µs duration, 100 kHz of 1 H decoupling during acquisition, and a measured recycle delay of 10s. All 29 Si chemical shifts were indirectly referenced to TMS (δ iso = 0.0 ppm) via a kaolinite secondary (solid) reference (δ iso = -93 ppm with respect to TMS), and the 29 Si pulse length calibration was undertaken on the kaolinite secondary reference.
Both 13 C and 29 Si solution state NMR experiments were performed at 7.05 T in a Bruker 7 mm MAS NMR probe; the excitation pulse parameters mirrored those implemented in the solid experiments, however no 1 H decoupling or magic angle spinning were utilized.
Thermogravimetric Analysis (TGA) was carried out using a Mettler Toledo thermal analyzer over the temperature range of 25°C to 800°C at a heating rate of 10 °K/min under nitrogen. Electrical conductivity measurements were performed using a two-point probe method on hydraulic pressed pellets. An electrometer (Keithley, Ohio, USA, model 6517B) was used to measure the volume resistivity using an applied voltage of 1V.
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