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20 mm parallel plate

Manufactured by TA Instruments
Sourced in United States

The 20-mm parallel plate is a lab equipment product from TA Instruments. It is designed to measure the rheological properties of liquid, semi-solid, or solid materials. The parallel plate configuration allows for the application of shear stress and the measurement of the resulting deformation or flow behavior of the sample.

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2 protocols using 20 mm parallel plate

1

Rheological Analysis of Yeastless Dough

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The dough developed without yeast was analyzed using a DHR-3 rheometer equipped with a 20-mm parallel plate (TA Instrument, New Castle, DE, US) as previously described with modification (Primacella, Wang, & Acevedo, 2018 (link)). Oscillation strains in the range of 0.001%–1.000% were applied within a 2.000-mm gap at a frequency of 1.0 Hz and 15 points per decade. In the curve of storage modulus vs. oscillation strain, the average storage modulus (G') within the linear viscoelastic region was recognized as a measure of dough strength. In the data table of storage modulus vs oscillation stress measured by the rheometer, yield stress (σ*) was obtained as oscillation stress where the G' reached a value of 90% average G' within linear region.
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2

Viscoelastic Characterization of Hydrogels

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Dynamic shear oscillation measurements at a 10% strain were used to characterize the viscoelastic properties of the Poly(HEMA-Am), standard dermal acrylamide filler (Aquafilling®) and human adipose tissue. The rheological measurements at oscillatory shear deformation were carried out with a DHR3 rheometer (TA instruments, New Castle, DE, US) using a 20-mm parallel plate (Peltier plate Steel) with a plate-to-plate distance of 2 mm. Thus, the loaded hydrogel using a 3 mL syringe (BD Science, Franklin Lakes, NJ, USA) and 21 G needle (KOVAX, Seoul, Korea) was about 2.51 mL as a final volume [25 (link)]. The mechanical spectra were recorded in the constant strain mode with a deformation of 0.1 maintained over a frequency range of 0.001–1000 Hz (rad/s) at 25 °C. The shear strain dependence of the storage modulus was determined by the oscillatory shear deformation with a shear strain scan ranging from 0.01–100% at a constant frequency (6.3 Hz).
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