The structural-functional group of compounds in the extract was obtained using IRSpirit Fourier Transform Infrared spectrophotometer (Shimadzu, Japan). A drop of the extract was placed on the diamond crystal to form a thin film. The spectral scanning was taken at the frequency range of 4000 to 400 cm−1 at 4 cm−1 at room temperature.
Ir spirit fourier transform infrared spectrophotometer
The IR Spirit Fourier-Transform Infrared spectrophotometer is a laboratory instrument designed for the analysis of molecular structures using infrared spectroscopy. It measures the absorption of infrared radiation by a sample, providing information about the chemical composition and characteristics of the material.
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4 protocols using ir spirit fourier transform infrared spectrophotometer
Spectroscopic Analysis of Botanical Extract
The structural-functional group of compounds in the extract was obtained using IRSpirit Fourier Transform Infrared spectrophotometer (Shimadzu, Japan). A drop of the extract was placed on the diamond crystal to form a thin film. The spectral scanning was taken at the frequency range of 4000 to 400 cm−1 at 4 cm−1 at room temperature.
Comprehensive Characterization of Coumarin Probe
Physicochemical Characterization of Compounds
The FT-IR spectra were recorded in the region of 4000 cm−1 to 450 cm−1 on a Shimadzu IR Spirit Fourier-Transform Infrared spectrophotometer equipped with an ATR adapter (Shimadzu, Kyoto, Japan).
Mass spectrometry analysis was performed on Shimadzu 8030 ESI-Triple Quad mass spectrometer (Shimadzu, Kyoto, Japan).
Comprehensive Nanomaterial Characterization
analysis was carried out on a SHIMADZU UV-1900i UV–vis spectrophotometer.
Absorption spectra were recorded at a resolution of 1 nm within 200–800
nm. The hydrodynamic size was measured through DLS analysis conducted
on a Malvern (Malvern, UK) Zetasizer Nano ZS instrument. FTIR spectra
were recorded on a SHIMADZU (Tokyo, Japan) IRSpirit Fourier transform
infrared spectrophotometer using a KBr pellet with a scan rate of
approximately 4 cm–1 s–1 at 25
°C. SEM measurements and EDX analysis were conducted on a Hitachi
SU-8000 microscope at accelerating voltages of 10 and 15 kV. TEM measurements
were conducted on a TEM-2100F (JEOL, Tokyo, Japan) field emission
electron microscope. XRD analysis was conducted on a Rigaku SmartLab
spectrometer with Cu-Kα radiation. Magnetic behavior was examined
by a VSM 8604, Lakeshore Crytronics Inc., USA at room temperature.
TGA was carried out on a SHIMADZU (Tokyo, Japan) TGA-50 at a heating
rate of 10 °C min–1 under N2.
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