CNPs 3–5 nm in size were synthesized by a microemulsion method as previously described.22 –24 (link) Briefly, surfactant sodium bis(2-ethylhexyl) sulfosuccinate was dissolved in 100 mL toluene, followed by the addition of 5 mL of 0.1 M aqueous cerium nitrate solution. The reaction mixture was stirred for 45 minutes before 10 mL of 1.5 M ammonium hydroxide aqueous solution was added dropwise. The reaction proceeded for 1 hour, and the mixture was allowed to separate into two layers, with the upper layer consisting of toluene containing non-agglomerated CNPs. CNPs were washed six times with acetone and distilled water to remove the surfactant and other impurities, and size distribution and morphology were examined using a JEM-2100 high-resolution transmission electron (TE) microscope (JEOL Ltd., Tokyo, Japan) equipped with an energy-dispersive analyzer by depositing drops of suspended particle solution onto a carbon-coated copper grid.25 Broad peaks in the X-ray diffraction spectrum (Ultima-3; Rigaku, Tokyo, Japan) confirmed the crystallinity of the CNPs.26
Ultima 3
Manufactured by Rigaku
Sourced in Japan, United States
The Rigaku Ultima III is an X-ray diffractometer designed for versatile and high-performance powder and thin film analysis. It features a stable and precise goniometer, advanced X-ray optics, and a high-efficiency detector to provide reliable and accurate data.
Automatically generated - may contain errors
Lab products found in correlation
Jsm 6701f, by JEOL (3 mentions)
S 4800, by Hitachi (3 mentions)
Ultra 55, by Zeiss (2 mentions)
Pda s 3100 uv vis spectrophotometer, by Scinco (2 mentions)
Optima 5300 dv, by PerkinElmer (2 mentions)
Sta 449c, by Netzsch (1 mentions)
D8 discover, by Bruker (1 mentions)
Leo 1550, by Zeiss (1 mentions)
Phi 5000 versaprobe, by Physical Electronics (1 mentions)
Themis z, by Thermo Fisher Scientific (1 mentions)
Dimension 3100, by Veeco (1 mentions)
Fp 8500 fluorescence spectrometer, by Jasco (1 mentions)
Fe sem su8230, by Hitachi (1 mentions)
Nicolet 6700 spectrometer, by Thermo Fisher Scientific (1 mentions)
Nicolet 5700 ftir spectrometer, by Thermo Fisher Scientific (1 mentions)
Invia reflex raman spectrometer, by Renishaw (1 mentions)
Tecnai f30 microscope, by Thermo Fisher Scientific (1 mentions)
Escalab 250 spectrometer, by Thermo Fisher Scientific (1 mentions)
Supra 55 microscope, by Zeiss (1 mentions)
Asap 2460 surface area and porosity analyzer, by Micromeritics (1 mentions)
73 protocols using ultima 3
1
Synthesis and Characterization of Cerium Oxide Nanoparticles
2
Characterization of OFGC Nanomaterials
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The morphology of the OFGC-500/600/700 was observed by scanning electron microscope (SEM, Ultra 55, Zeiss, Germany), Transmission electron microscope (TEM, Titan G2 60-300), and energy dispersive X-ray spectrometry (EDX) mapping. The chemical bonds were analyzed by X-ray photoelectron spectroscopy (XPS, ESCALAB 250Xi). Raman spectra were collected by Renishaw Raman Spectroscopy with a 633 nm laser as a source. The crystal phases were identified by X-ray diffraction (XRD, ULTIMA-3, Rigaku, Japan). The NOVA 1000e was used to measure the specific surface area of the OFGC-500/600/700 samples. In situ electrochemical impedance spectroscopy (EIS) was tested by the electrochemical workstation (IVIUM-VERTEX. C, Netherlands) with the frequency range from 0.01 to 100 kHz at a current density of 100 mA g−1. The cyclic voltammogram (CV) and the ex-situ EIS were measured by Electrochemical Workstation (CHI 660E, CHENHUA, Shanghai). And all electrochemical performances were tested by the Neware battery testing system (BTSCT-3008-TC).
3
Microstructural Analysis of Thermally-Sprayed TiO2-x
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Cross-section microstructure of as-sprayed deposits and surface microstructure of splats and fractured deposits were investigated by field-emission scanning electron microscopy (FE-SEM, LEO 1550, Zeiss). X-ray diffraction of the feedstock, and deposits was carried out on X-ray diffractometer (XRD, D8 Discover, Bruker) in vertical Bragg-Brentano geometry (2.5° Soller slits in both primary and secondary beam and 0.5° divergence slit in primary path) with filtered CuKα radiation (Ni β filter in secondary path). Since linear 1D detector was used, beam knife was placed above the samples in order to minimize the detection of air scattering. Additional measurement using High resolution XRD (Ultima III, Rigaku) was performed, with a Cu-Kα radiation source at 40 kV and 44 mA between 2 θ values of 10° and 80°. Thermogravimetric analysis was performed in order to measure stoichiometry of powder, and the deposits using a thermal balance (TG/DSC, STA 449C, Netzsch) while heating TiO2−x deposits up to 1073 K at 10 K min−1, holding it for 30 minutes in air to fully oxidize. The weight of the TiO2−x deposits was approximately 30 mg.
4
Camel Dung Biochar Characterization
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The camel dung biochar
surface morphology as well as elemental analysis was determined using
scanning electron microscopy and energy-dispersive X-ray spectroscopy
(SEM–EDX), with a TESCAN VEGA (LMU INCax-act (Oxford Instruments))
device operating at 20kV. Functional groups on the surfaces of the
biochar and biochar after the adsorption of the metal ions were analyzed
using Cary 630 Fourier transform infrared spectroscopy (FTIR, Agilent
technologies, Danbury, Conn) with a scanning range between 400 and
4000 cm–1. Furthermore, the surface area characteristics
of the biochar were assessed through the utilization of a Brunauer–Emmett–Teller
(BET) micromeritics analyzer obtained from Micromeritics Instrument
Corp (Norcross, GA). The crystallographic properties of both the original
biochar and the biochar after metal ion adsorption were investigated
using X-ray diffraction analysis (XRD/Rigaku Ultima III) employing
a CuKa radiation source (40 kV/30 mA) and a NaI detector.
surface morphology as well as elemental analysis was determined using
scanning electron microscopy and energy-dispersive X-ray spectroscopy
(SEM–EDX), with a TESCAN VEGA (LMU INCax-act (Oxford Instruments))
device operating at 20kV. Functional groups on the surfaces of the
biochar and biochar after the adsorption of the metal ions were analyzed
using Cary 630 Fourier transform infrared spectroscopy (FTIR, Agilent
technologies, Danbury, Conn) with a scanning range between 400 and
4000 cm–1. Furthermore, the surface area characteristics
of the biochar were assessed through the utilization of a Brunauer–Emmett–Teller
(BET) micromeritics analyzer obtained from Micromeritics Instrument
Corp (Norcross, GA). The crystallographic properties of both the original
biochar and the biochar after metal ion adsorption were investigated
using X-ray diffraction analysis (XRD/Rigaku Ultima III) employing
a CuKa radiation source (40 kV/30 mA) and a NaI detector.
5
Characterization of Crystalline Phase and Morphology
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The crystalline phase of the sample was obtained on a Rigaku Ultima III diffractometer using X-ray diffraction (XRD) with CuKα radiation (λ = 0.154178 nm). The scan range was 5–40° and the scan speed was 2.4 degrees per minute. The morphology and energy-dispersion X-ray spectroscopy (EDX) of the various samples was observed with scanning electron microscopy (SEM) and performed with an S-3400 N II instrument. X-ray photoelectron spectroscopy (XPS, PHI 5000 Versa Probe UlVAC-PHI, Japan) was used to obtain the XPS data of the materials, with reference to C 1s (binding energy of 284.8 eV).
6
Characterization of Quantum Dots
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Electron micrographs of the QDs were obtained on a carbon-coated Cu mesh grid using a Tecnai F30 Super-Twin system (FEI Co., Hillsboro, OR, USA; Yun-Chang Park, KAIST NanoFab). The XRD patterns were obtained using a Rigaku Ultima III diffractometer equipped with a rotating anode and a Cu-Kα radiation source (λ = 0.15418 nm).
7
Characterization of Nanostructured Materials
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The crystal structures of the samples were analyzed by X-ray diffraction (XRD) (Rigaku-Ultima III with Cu Kα radiation, λ = 1.5418 Å). The microstructures of as-prepared samples were revealed using a field-emission scanning electron microscope (FESEM; JEOL JSM-6701F, 5.0 kV), transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM) (JEM-2100, 200 kV). Nitrogen adsorption–desorption isotherms were measured on a Gemini VII 2390 Analyzer at 77 K, and the specific surface area was calculated by the Brunauer-Emmett-Teller (BET) method.
8
Comprehensive Nanomaterial Analysis by XRD, SEM, and TEM
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The samples were examined by X-ray diffraction (XRD) analysis with a Rigaku Ultima III diffractometer system using a graphite-monochromatized Cu-Kα radiation at 40 kV and 40 mA. The field emission scanning electron microscopy (FE-SEM) was used to examine morphology of the samples using a JEOL JSM-7001F machine. Transmission electron microscopy (TEM) and high-resolution TEM (HR-TEM) images were taken with a TECNAI G2 20 S-Twin operated at 200 kV and TECNAI G2 F30 operated at 300 kV, respectively.
9
Synthesis and Characterization of U3O8 Powders
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Twenty-nine samples of triuranium
octoxide (U3O8) were synthesized using two pathways:
UNH and UO3. U3O8 originating from
UNH was prepared at
different calcination temperatures, calcination times, and cooling
rates. About 150 mg of UNH were placed in a Pt crucible in the furnace
preheated to 650–850 °C for 0.5–168 h. Several
cooling rates, from 750 to 25 °C, were applied. The synthesis
conditions are detailed inTable 2 .
X-ray diffraction (XRD) was
applied to determine the structural
phase of the uranium oxides. XRD analyses (Rigaku, Ultima III) were
conducted on samples weighing several milligrams under an atmosphere
environment by continuous scanning at 40 kV/40 mA in the range of
10–80° at a rate of 2°/min.
octoxide (U3O8) were synthesized using two pathways:
UNH and UO3. U3O8 originating from
UNH was prepared at
different calcination temperatures, calcination times, and cooling
rates. About 150 mg of UNH were placed in a Pt crucible in the furnace
preheated to 650–850 °C for 0.5–168 h. Several
cooling rates, from 750 to 25 °C, were applied. The synthesis
conditions are detailed in
X-ray diffraction (XRD) was
applied to determine the structural
phase of the uranium oxides. XRD analyses (Rigaku, Ultima III) were
conducted on samples weighing several milligrams under an atmosphere
environment by continuous scanning at 40 kV/40 mA in the range of
10–80° at a rate of 2°/min.
10
Structural Characterization of High-Entropy Alloy Nanoparticles
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The morphology of as-prepared samples was examined by transmission electron microscopy (TEM, Tacnai G2 F20, FEI). Energy-dispersive X-ray spectroscopy (EDS, Elite T EDS System) equipped on the TEM was employed to record the element distribution of HEAs on graphene. Aberration-corrected high-angle-annular-dark-filed scanning transmission electron microscope (HAADF-STEM) analysis is characterized using Thermofisher Themis Z (FEI) with 200 kV. An EDS instrument with the SuperX detector equipping the HAADF-STEM was used to obtain the element distribution of HEAs at the atomic scale. Geometric phase analysis (GPA) was conducted with Digital Micrograph software to obtain the strain information on the surface of HEA NPs. The crystal structures of the samples were measured by a powder X-ray diffractometer (XRD, Ultima III, Rigaku Corp., Japan) using Cu-Kα radiation (λ = 1.54178 Å, 40 kV, 40 mA). The atomic ratios of HEM NPs were analyzed by PerkinElmer AVIO500 ICP-MS. The solutions were prepared by digesting the samples in aqua regia followed by dilution with 2% hydrochloric acid. The surface composition of the samples was performed by X-ray photoelectron spectroscopy (XPS, ESCALAB 250) with the non-monochromatic Al Kα X-ray as the X-ray source. The binding energy of C1s (284.6 eV) was used to calibrate the other binding energies.
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