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X max 20 mm 2 detector

Manufactured by Oxford Instruments
Sourced in United Kingdom

The X-Max 20 mm 2 detector is a compact and versatile energy-dispersive X-ray (EDX) detector designed for use in scanning electron microscopes (SEMs) and other analytical instruments. The detector features a 20 mm2 active area and is capable of providing high-quality elemental analysis and mapping data.

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4 protocols using x max 20 mm 2 detector

1

Starch Granule Morphology Analysis

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Starch granule morphology was examined using the scanning electron microscopy. The samples were transferred onto double-sided conductive carbon tape and mounted onto an aluminum SEM stubs. A thin layer of gold was used to coat the stubs to enhance conductivity. Thereafter, the sample was loaded into a Zeiss MERLIN Field Emission Scanning Electron Microscope (Carl Zeiss Microscopy, Munchen, Germany) at the Electron Microbeam Unit. A Zeiss Inlens Secondary Electron (SE) Detector, Zeiss Backscatter Electron (BSE) Detectors and Zeiss Smart SEM software were used to generate images, while the samples were chemically quantified by quantitative Energy Dispersive X-Ray Spectrometry (EDS) using an Oxford Instrument® X-Max 20 mm2 detector and Oxford Aztec software (Oxford Instruments, Oxfordshire OX13 5QX, United Kingdom). The starch samples were examined at 3 kV.
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2

SEM Imaging and EDX Analysis of Diatom Biofilms

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Diatom cells were fixed on Thermanox disks by incubation in a mixture of 2% glutaraldehyde, 10 mM CaCl2 and 10 mM MgCl2 in 0.1 M sodium cacodylate buffer at pH 7 and room temperature (RT) for 2 h. Dehydration was conducted first with 30% and 50% EtOH, at RT for 2 h each, followed by 70% EtOH at 4 °C over night, 90% EtOH at RT for 2 h and finally with 96% and 100% EtOH twice for 1 h each. Critical point drying in CO2 followed (Balzers CPD030; Oerlikon Balzers, Balzers, Liechtenstein) and samples were finally sputtered with gold (Au) and palladium (Pd) to a thickness of 5 nm (Balzers SCD030; Oerlikon Balzers, Balzers, Liechtenstein).
After fixation, dehydration and Au/Pd-sputtering, the biofilm-covered Thermanox disks were imaged with a Zeiss “AURIGA” scanning electron microscope, controlled with the “SmartSEM” software v05.04.05.00. The elemental composition of samples was analysed by energy-dispersive X-ray (EDX) spectroscopy. Samples were excited with the AURIGA’s electron beam at 10 kV and the emitted X-rays (of specific energy levels due to the elemental electron configuration) were recorded with an Oxford Instruments “X-Max 20 mm2” detector (Oxford Instruments, Scotts Valley, California, USA) and the “INCA” software v4.15.
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3

FIB-SEM and APT Sample Preparation

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ToF-SIMS ion imaging and APT sample preparation was conducted using a Tescan Lyra3 FIB-SEM with a Ga + ion source and platinum mono gas injection system (GIS) located in the John de Laeter Centre (JdLC) at Curtin University, Australia. The FIB-SEM was also fitted with an Oxford Instruments X-Max 20 mm 2 detector which was used for EDS analysis. EDS analysis was performed at 20 kV and the data was analysed using Oxford Instruments AZtec version 3.4 software. EBSD was performed using an Oxford Instruments Nordlys Nano high-resolution EBSD detector and Oxford Instruments AZtec version 3.4 software acquisition system at 20 kV and a step size of 80 nm.
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4

Morphological Analysis of Adhesive Modifications

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SEM analysis of unmodified and modified adhesives was conducted to study the effect of modifications on the morphological features of the adhesives. The freeze-dried powder samples were mounted on aluminium stubs using double-sided conductive carbon tape, and conductivity was enhanced using carbon evaporation (Quorum Technologies Q150T ES). The micrographs of the unmodified and modified samples were examined using a Zeiss Merlin FE-SEM (Carl Zeiss Microscopy, Germany) operated at 5 kV and 200 pA beam current, using inLens secondary electron (SE) and SE2 detection. The SEM was equipped with an energy dispersive X-ray spectrometer (EDS). EDS elemental analysis was done at 20 kV using a Zeiss EVO MA15 SEM and Oxford Instruments X-Max 20 mm 2 detector with Oxford INCA software (Oxford Instruments, Oxfordshire, UK).
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