X max 20 mm 2 detector
The X-Max 20 mm 2 detector is a compact and versatile energy-dispersive X-ray (EDX) detector designed for use in scanning electron microscopes (SEMs) and other analytical instruments. The detector features a 20 mm2 active area and is capable of providing high-quality elemental analysis and mapping data.
Lab products found in correlation
4 protocols using x max 20 mm 2 detector
Starch Granule Morphology Analysis
SEM Imaging and EDX Analysis of Diatom Biofilms
After fixation, dehydration and Au/Pd-sputtering, the biofilm-covered Thermanox disks were imaged with a Zeiss “AURIGA” scanning electron microscope, controlled with the “SmartSEM” software v05.04.05.00. The elemental composition of samples was analysed by energy-dispersive X-ray (EDX) spectroscopy. Samples were excited with the AURIGA’s electron beam at 10 kV and the emitted X-rays (of specific energy levels due to the elemental electron configuration) were recorded with an Oxford Instruments “X-Max 20 mm2” detector (Oxford Instruments, Scotts Valley, California, USA) and the “INCA” software v4.15.
FIB-SEM and APT Sample Preparation
Morphological Analysis of Adhesive Modifications
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