Lambda 950 spectrometer

Differential scanning calorimetry (DSC) and thermogravimetric analysis (TGA) of the suspension (OPD) and the self-nanoemulsifying system of saponin D (an SND) were conducted using the TA Instruments Q600 system (New Castle, USA) at a 10°C/min heating rate from room temperature up to 300°C in a nitrogen atmosphere (30 (link)). Fourier-transform infrared (FTIR) spectroscopy absorption data were obtained using a Lambda 950 spectrometer (Perkin Elmer, Boston, USA) with a resolution of 4 cm⁻¹ for 64 scans in the spectral range of 400–4000 cm⁻¹.

Absorbance spectra of Au₃₂-NC in solutions (0.5 mM in hexane) were acquired with an UV-vis-NIR spectrometer (Cary 5000, Agilent Technologies). For thin films spin-coated on glass slides (as described above), a Perkin Elmer Lambda 950 spectrometer was used. For individual microcrystals on glass slides, an inverted microscope (Nikon Eclipse Ti-S) with a spectrometer was used. The sample was illuminated with unpolarized white light by a 100 W halogen lamp. The transmitted light was collected by a ×60 objective (Nikon, CFI S Plan Fluor ELWD, NA = 0.7). The collected light was passed to a grating spectrograph (Andor Technology, Shamrock SR-303i) and detected with a camera (Andor Technology, iDusCCD). All absorbance spectra were energy-corrected using the expression I(E) = I(λ) × λ^{2 37 (link),57 (link)}. Photoluminescence images and emission spectra of individual Au₃₂-NC microcrystals were acquired with a home-built confocal laser scanning microscope. The diode laser (iBeam smart, Toptica Photonics) was operated in continuous wave Gaussian mode at an excitation wavelength of λ_ex = 488 nm. Luminescence images were obtained with a photon-counting module (SPCM-AQR-14, Perkin Elmer) and spectra were acquired with an UV-VIS spectrometer (Acton SpectraPro 2300, Princeton Instruments). The background was subsequently subtracted from the emission spectra.

The measurement of the backward light scattering with directed reflection took place using a Lambda 950 spectrometer (Perkin Elmer). This device is suitable for measurements in the UV/VIS/NIR range from about 200 nm to 2500 nm. The measurement of each colored paper was conducted at discrete wavelengths in this range with a distance of 1 nm (Supplementary Figure 4C), which allows for the more discrete characterization of each color used (i.e., green reflected light between 480 and 580 nm, and was well within the expected range for this color).

Powder X-ray diffraction patterns were performed on an AXS D8 Advance diffractometer (Cu Kα radiation, λ = 1.5406 Å; receiving slit, 0.2 mm; scintillation counter, 40 mA; 40 kV) from Bruker Inc. Ex-situ XRD diffraction patterns of cathode electrodes at various charge/discharge states were collected on a Bruker D8 diffractometer operating in Bragg-Brentano geometry with Cu Kα radiation. The morphology of particles was observed by a Hitachi S-4800 field emission scanning-electron microscope at an accelerating voltage of 8 kV. The UV-Vis diffusivereflectancespectra were obtained by Perkin Elmer Lambda 950 spectrometer. Thermal gravimetric analysis was performed on a Pyris Diamond thermogravimetric/differential thermal analyzer (Perkin-Elmer) to analyze the water content in three polyhedral ZnHCFs powders. The K: Zn: Fe ratios of shape-controlled RZnHCFs were determined by inductively coupled plasma optical emission spectrometer (Perkin Elmer Optima 2100 DV). The chemical formulas of C-RZnHCF, T-RZnHCF and O-RZnHCF was found to be K_0.07Zn[Fe(CN)₆]_0.69, K_0.08Zn[Fe(CN)₆]_0.67 and K_0.07Zn[Fe(CN)₆]_0.68, respectively.

¹H and ¹³C NMR spectra were recorded at 298 K on a Bruker AVANCEIII 400-MHz instrument at room temperature. Chemical shifts were referenced to tetramethylsilane. Powder X-ray diffraction (PXRD) measurements were collected on a PANalytical B.V. Empyrean powder diffractometer operating at 40 kV/30 mA using the Cu Kα line (λ = 1.5418 Å), and data were measured over the range 5° to 40° in 5°/min steps over 7 min. Single-crystal X-ray diffraction data were collected by a Bruker D8 Venture diffractometer equipped with a PHOTON 100 CMOS detector, using Ga-Kα radiation (λ = 1.34139 Å) and Mo-Kα radiation (λ = 0.71073 Å). Thermogravimetric analysis (TGA) and differential scanning calorimetry (DSC) experiment were carried out using a simultaneous thermal analyzer 449 F3 analyzer (NETZSCH Instruments) with an automated vertical overhead thermobalance. The samples were heated at 10 °C/min using N₂ as the protective gas. Fluorescent titration experiments were performed on a Shimadzu RF- 5301PC spectrometer. UV-vis spectra in solution were collected on a Shimadzu UV-2550 spectrometer. Solid-state UV-vis spectra were measured by a reflectance mode on a PerkinElmer Lambda950 spectrometer from 200 to 800 nm with BaSO₄ as a reference.

The structural characterization was performed with a Hitachi S-4800 field emission SEM (Hitachi Ltd., Tokyo, Japan) and an FEI Tecnai G2 F20 S-Twin TEM (FEI Corp., Hillsboro, USA). CL and PL were applied with a Gatan Mono CL3 system (Gatan Inc., Pleasanton, USA) and PI-PLE-2355/2558 + PIXIS-256E system (Princeton Instruments, Trenton, USA). A Bruker AXS D8 Advance XRD system (Bruker Corp., Karlsruhe, Germany) and an Oxford EDX detector (Oxford Instruments, Concord, USA) were also used to analyze the hybrid structure. The photocatalysis was performed with a CEL-GPPC continuous flow gas-phase reactor (Beijing CHN EDU AuLight Co. Ltd., Beijing, China) which contained a 300 W Xe lamp. The UV-vis absorption spectra were recorded in a Perkin-Elmer Lambda 950 spectrometer (PerkinElmer Inc., Waltham, USA). The gas concentrations were determined with an online gas chromatograph (SP7800, Keruida Technology Co. Ltd., Beijing, China). All of the photocatalyst samples were sized into 3.5–3.6 cm². A mixture of air and CH₃CHO was injected into a tubular vessel reactor. The flow rate of air and CH₃CHO were 12.5 and 5 ml min⁻¹, respectively. The gas pressure inside the vessel was 0.08 MPa.