Nchr probe
The NCHR probe is a non-contact, high-resolution atomic force microscopy (AFM) probe designed for the NanoWorld product line. The probe features a cantilever with a silicon-based tip, optimized for non-contact AFM imaging of surfaces.
Lab products found in correlation
2 protocols using nchr probe
Atomic Force Microscopy of Aqueous Samples
Atomic Force Microscopy Imaging of Nano-Structures
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