X-ray diffraction (XRD) patterns were obtained using the Bruker AXS D8 diffractometer at the scanning speed of 15° min−1. Raman spectroscopy was conducted using Thermo DXR with a 532 nm laser excitation. X-ray photoelectron spectroscopy (XPS) results were obtained using the PHI-5500 spectrometer with Al Kα X-ray radiation as the X-ray excitation source. Transmission electron microscopy (TEM) was conducted using JEM-2100F, and scanning electron microscopy (SEM) was performed using JSM-5610LV. Inductively coupled plasma atomic emission spectroscopy (ICP-AES) measurements were conducted using the Thermo Scientific iCAP 6300 instrument. Infrared spectra results were obtained using the NEXUS 670 Fourier transform infrared (FTIR) spectrometer. The N2 adsorption–desorption isotherms were acquired using the Micromeritics Tristar 3000 analyzer. The specific surface areas and pore size distributions of the catalysts were calculated by the Brunauer–Emmett–Teller (BET) and Barrett–Joyner–Halenda (BJH) methods, respectively. Elemental compositions were obtained via the CHN elemental analysis (Elementar Vario EL III).
Tristar 3000 analyzer
Manufactured by Micromeritics
Sourced in United States
The Tristar 3000 analyzer is a versatile instrument designed for the measurement of surface area, pore volume, and pore size distribution of solid materials. It utilizes the principles of gas adsorption to provide accurate and reliable data on the physical characteristics of a wide range of samples.
Automatically generated - may contain errors
Lab products found in correlation
Nicolet 6700, by Thermo Fisher Scientific (3 mentions)
Nicolet nexus 670 spectrometer, by Thermo Fisher Scientific (2 mentions)
Uv 3600 spectrophotometer, by Shimadzu (2 mentions)
Optima 2000 dv, by PerkinElmer (2 mentions)
Jem 2100f, by JEOL (2 mentions)
S 4800, by Hitachi (2 mentions)
Escalab 250xi, by Thermo Fisher Scientific (2 mentions)
Axs d8 diffractometer, by Bruker (1 mentions)
El 3, by Elementar (1 mentions)
Icap 6300, by Thermo Fisher Scientific (1 mentions)
Vevo 2100 system, by Fujifilm (1 mentions)
Ls55 spectrofluorometer, by PerkinElmer (1 mentions)
X pert pro, by Malvern Panalytical (1 mentions)
Lambda 25, by PerkinElmer (1 mentions)
Ab204 n analytical balance, by Mettler Toledo (1 mentions)
D4 x ray diffractometer, by Bruker (1 mentions)
Bi 200sm, by Brookhaven Instruments (1 mentions)
Ultra 55, by Zeiss (1 mentions)
D8 focus, by Bruker (1 mentions)
Xsam800 spectrometer, by Shimadzu (1 mentions)
16 protocols using tristar 3000 analyzer
1
Comprehensive Material Characterization Techniques
2
Characterization of Multifunctional Theranostic Nanoparticles
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The entrapment efficiency (EE) of TSSI and MnCO was calculated in compliance with the formula below: EE (%) = (mass of loading content/mass of drug in-put) × 100%. The amount of loaded TSSI and MnCO was obtained by the established calibration absorption curve. The hydrodynamic size and zeta potential of MTHMS were measured via Zetasizer (Malvern, U.K.) using Zetasizer software 7.01. Scanning electron microscope (SEM) imaging was obtained through a SU-70 electron microscope. EDS element mapping and transmission electron microscope (TEM) imaging were performed by Talos F200 electron microscope. Pore-size distribution and nitrogen adsorption-desorption isotherm were recorded via the Micromeritics Tristar 3000 analyzer. UV-vis-NIR absorption spectrum was monitored using a UV-3600 spectrometer. Fluorescence spectra were determined utilizing Perkin-Elmer LS 55 spectrofluorometer. NIR photoacoustic imaging was recorded on VisualSonics Vevo-2100 system. The photothermal effect of MTHMS was detected through Fotric 226 thermal imaging system. The solution of MTHMS was incubated in PBS or PBS + 10% FBS. At designated time points (0, 2, 4, 6, 8, 12, and 24 h), an aliquot of the solution was taken and monitored through DLS to examine the in vitro stability.
3
Comprehensive Characterization of Composite Microstructure
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The microstructure of composites was observed using a transmission electron microscope (TEM; TecnaiG2 (link) F20 S-Twin; FEI, Hillsboro, OR, USA) at 200 kV, and the samples were dispersed in ethanol and dropped onto a holey carbon film supported on a Cu grid. Nitrogen isotherm adsorption/desorption was measured at −196°C with a TriStar 3000 analyzer (Micromeritics, Atlanta, GA, USA). The mean size and crystal lattice properties of nanoparticles were analyzed by X-ray powder diffraction (XRD; X’pert PRO; PANalytical B.V., Almelo, the Netherlands) with a scanning range from 20° to 80°. Magnetic characterization was carried out with a vibrating sample magnetometer (VSM) on a model 6000 physical property measurement system (Quantum, San Jose, CA, USA) at 300 K. Photosensitizer content, pH responsiveness and amount of 1O2 of RB−MMSNs were characterized by ultraviolet–visible (UV/VIS) spectra (Lambda 25; PerkinElmer, Waltham, MA, USA). Additionally, process of fabrication was validated in the range of 400–4,000cm−1 by the Fourier transform infrared spectroscopy (FTIR) analysis (Nexus Model 470; GMI, Ramsey, MN, USA).
4
Nanomaterial Characterization by Comprehensive Analytical Techniques
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Transmission electron microscopy (TEM) images were taken with a JEOL 2011 microscope (Japan) at 200 kV. Fourier transform infrared (FT-IR) spectra were collected on a Nicolet Nexus 470 Fourier spectrophotometer (USA) using KBr pellets. The nitrogen sorption isotherms, pore size distribution and Brunauer–Emmett–Teller (BET) surface area were measured at 250 °C with a Micromeritics TriStar 3000 analyzer (USA). Powder X-ray diffraction (XRD) measurements were performed with a Bruker D4 X-ray diffractometer with Ni-filtered Cu Kα radiation (40 kV, 40 mA). For all of the chemicals and reagents, an AB204-N analytical balance (Mettler Toledo, Switzerland) was used for weighing. Stirring was performed by an HD2004W constant speed mechanical stirrer (Sile, China).
5
Advanced Materials Characterization
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
A JEM 1200EX instrument (JEOL, Tokyo, Japan) was employed to collect transmission electron microscopy (TEM) images. IR spectra were obtained on a Nicolet Nexus 670 spectrometer (Thermo Fisher, Waltham, MA, USA), and UV-vis spectra on a UV-3600 spectrophotometer (Shimadzu, Tokyo, Japan). Dynamic light scattering (DLS) data were obtained with the aid of a Brookhaven Instruments BI-200 SM instrument (Holtsville, NY, USA). A Tristar 3000 analyzer (Micromeritics, Atlanta, GA, USA) was employed to collect N2 adsorption/desorption isotherms.
6
Structural and Compositional Analysis of LDH
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Powder X-ray diffraction measurements were performed by a MSAL-XD2 X-ray diffractometer (Cu Kα, 36 kV, 20 mA, λ = 1.5406 Å). The morphologies of LDH samples were examined by field-emission scanning electron microscope (SEM) (FSEM, ZEISS Ultra 55) and high resolution transmission electron microscope (TEM) (HRTEM, JEOL JEM-2100F) with an accelerating voltage of 200 kV. The FT-IR spectra were collected by a Nicolet 6700 FT-IR spectrometer. Nitrogen sorption isotherms of samples were collected by a Micromeritics TriStar 3000 Analyzer at 77 K. Elemental analysis was performed by the inductively coupled plasma optical emission spectrometer (Perkin Elmer, optima 2000DV), indicating the Ni/Co atom ratio of LDH.
7
Comprehensive Characterization of Nanomaterials
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
TEM was performed on a JEOL JEM 2100F electron microscope operating at 200 kV. The photoluminescence (PL) spectrum was performed on a Hitachi F-4600 fluorescence spectrophotometer. Crystalline structures were evaluated by XRD analysis using a Bruker D8 Focus operating at 40 kV and 40 mA equipped with nickel-filtered Cu Kα radiation (λ = 1.54056 Å). The BET surface area and pore structure of catalysts were measured using a Micromeritics Tristar 3000 analyzer by nitrogen adsorption at 77 K. The specific surface areas were calculated from the isotherms using the BET method. The pore distribution and the cumulative volumes of pores were obtained by the BJH method from the desorption branch of the adsorption isotherms. XPS was performed under ultrahigh vacuum (<10–6 Pa) on a Kratos XSAM 800 spectrometer with Mg Kα X-ray source (E = 1253.6 eV).
8
Nano-Encapsulation and Characterization of Pirfenidone
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Transmission electron microscope (TEM) images were obtained using a JEOL JEM-2010 unit at an acceleration voltage of 200 kV (JEOL USA, Inc., Peabody, MA, USA). The Fourier transform infrared (FTIR) spectra were analyzed by a Nicolet Nexus 870 spectrometer (Nicolet Instruments Inc. Madison, WI, USA). The zeta potential and dynamic light scattering (DLS) measurements were performed on a Malvern ZS90 Zetasizer Nano ZS instrument (Malvern, UK). N2 adsorption/desorption isotherms were determined by a Micromeritics Tristar 3000 analyzer (Micromeritics Instruments Corporation, Atlanta, GA, USA). The UV-vis-NIR absorption spectra were obtained on a UV-1800 spectrophotometer (Shimadzu, Japan). The drug loading (DL) ratio of PFD was calculated through the formula below (Equation 1):
where, PFDt is the total quantity of PFD used in the synthesis of NPs and PFDf is the quantity of unencapsulated PFD present in the supernatant.
where, PFDt is the total quantity of PFD used in the synthesis of NPs and PFDf is the quantity of unencapsulated PFD present in the supernatant.
9
Porous Material Characterization via N2 Adsorption
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
These measurements were performed with an automatic physisorption instrument (TriStar 3000 analyzer; Micromeritics Instrument Corporation, Norcross, GA, USA). Pore-structure characterization was obtained using low-temperature nitrogen adsorption. SBA-15 was activated for 4 hours at 573 K and 0.2–1.0 kPa to remove physically absorbed water, and the adsorption–desorption isotherms were measured. The specific surface area was calculated by the Brunauer–Emmett–Teller method, and the average pore size, pore volume, and pore distribution were obtained by the Barrett–Joyner–Halenda method.
10
Comprehensive Materials Characterization Protocol
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The X-ray diffraction (XRD) analysis was recorded by a MSAL-XD2 X-ray diffractometer using Cu Kα radiation (λ = 1.5406 Å). The inductively coupled plasma optical emission spectrometer (ICP-OES) was tested by Perkin Elmer Optima 2000DV. The scanning electron microscopy (SEM) observations were performed on Philips SEM-XL30S microscope operated at 15 kV. Transmission electron microscopy (TEM), high-resolution transmission electron microscope (HRTEM) and energy dispersive X-ray spectroscopy (EDS) were characterized using a JEOL JEM-2100F instrument at 200 kV. Nitrogen adsorption isotherms were recorded on a Micromeritics TriStar 3000 Analyzer at −196 °C. The Brunauer-Emmett-Teller (BET) surface area was determined by adsorption data. The X-ray photoelectron spectroscopy (XPS) measurements were carried out by using a model of ESCALab250 with an Alumina Ka (1486.6 eV) source.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!