Multimode quadrax mm scanning probe microscope

Surface morphology and roughness of the films were obtained in tapping mode in ambient atmosphere at room temperature by a Veeco Multimode Quadrax MM scanning probe microscope (Bruker; Billerica, MA, USA) and by a Tosca TM 400 atomic force microscope (Anton Paar, Graz, Austria) using Si-cantilevers (NCH-VS1-W from NanoWorld AG, Neuchatel, Switzerland) with a resonance frequency of 320 kHz respectively 285 kHz and a force constant of 42 N·m⁻¹. Root mean square (RMS) roughness calculation and image processing was performed with the Nanoscope software (V7.30r1sr3, Veeco, Plainview, NY, USA) and Gwyddion 2.53 (28.02.2019).

Surface morphology and roughness of the films on Si, glass, Cu, Ni and Al were determined on a Veeco Multimode Quadrax MM scanning probe microscope (Bruker, Billerica, MA, USA) using Si cantilevers (NCH-VS1-W from NanoWorld AG, Neuchatel, Switzerland) with a resonance frequency of 320 kHz and a force constant of 42 N·m⁻¹. On the polymer substrates, the films were analyzed using a FastScanBio AFM using a FastScan-A cantilever (both from Bruker NANO) with typical resonance frequencies and force constants around 1.4 MHz and 18 N·m⁻¹, respectively. All samples were analyzed in tapping mode in an ambient atmosphere at room temperature at the lowest possible force load and scan rates were adapted to obtain reliable surface data. Root mean square (RMS; R_q) roughness calculation and image processing was performed with the Nanoscope software (V7.30r1sr3, Veeco, Plainview, NY, USA).