Jcm 5000 sem

The morphologies of PDA-SS/PVA film and AgNPs modified PDA-SS/PVA film were imaged on a JCM-5000 SEM instrument (JEOL, Tokyo, Japan). At the same time, energy-dispersive X-ray spectroscopy (EDS) (INCA X-Max 250, Oxford, England) were collected to analyze the chemical elements in these samples. The modified and unmodified AgNPs SS/PVA films were measured on an X’Pert Powder XRD with a 2θ range of 10° to 80° (PANalytical, Almelo, The Netherlands). FT-IR measurements were performed in the wavenumber of 4000–800 cm⁻¹ with 2 cm⁻¹ resolution on a Nicolet iz10 FT-IR spectrometer (ThermoFisher Scientific Corp, Waltham, MA, USA).

Mechanical testing was conducted using single silk fiber spun by the bimolters and the control trimolters. The cocoons were harvested and degummed as described in Section 2.6. The degummed silks were used as samples for characterization of the mechanical properties of the silk fibers. In this case, two fibroin brins were completely separated [23 (link),25 (link),34 (link)]. A single brin was used to test the mechanical properties. To ensure the accuracy of the data, we also used the remainder of the same brin for SEM to calculate the diameter for mechanical testing. A minimum of 25 tensile deformation tests were performed for each silk type on fibers from five separate cocoons. The tensile properties of individual brins were measured using a DMA-Q800 dynamic mechanical analyzer (TA, New Castle, DE, USA). Mechanical tests were performed according to a previously reported method [9 (link)]. For each tensile test, the fiber diameter was measured using JCM-5000 SEM (JEOL, Shoshima, Japan). The experimental data obtained relating to the mechanical properties were analyzed using the TA Universal Analysis software. Subsequently, the raw data were used to calculate the mechanical performance parameters using the ORIGIN8.0 software (OriginLab, Northampton, MA, USA).

The morphologies of the films were characterized by a JCM-5000 SEM (JEOL, Tokyo, Japan). The particle size (diameter) of about 1000 particles were measured from the SEM images using the Nano Measurer software. Meanwhile, the energy dispersive spectra (EDS) were recorded on an Oxford INCA X-Max 250 (High Wycombe, UK). XRD was measured on a PANalytical X’Pert X-ray diffractometer (Almelo, The Netherlands). 2θ was set from 10° to 80°. The FT-IR spectra were collected on a Thermofisher Nicolet iz10 spectrometer (Framingham, MA, USA). The wavenumber was from 4000 cm⁻¹ to 800 cm⁻¹ and the resolution was 2 cm⁻¹.