Jsm 7500fa microscope

Manufactured by JEOL

Sourced in Japan

The JSM-7500FA is a high-performance field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analytical capabilities for a wide range of applications. The JSM-7500FA features a field emission electron gun, which allows for the generation of a stable, high-brightness electron beam. This enables the microscope to achieve a high resolution down to 1.0 nm at 15 kV. The instrument is equipped with various detectors, including a secondary electron detector and a backscattered electron detector, which can be used to obtain topographical and compositional information from samples. The JSM-7500FA is suitable for the analysis of a wide range of materials, such as metals, semiconductors, ceramics, and biological samples.

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Lab products found in correlation

Axis ultra dld, by Shimadzu (1 mentions) Dm6000 optical microscope, by Leica (1 mentions) Nanowizard atomic force microscope, by Bruker (1 mentions) Jem 2011, by JEOL (1 mentions)

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JSM-7500FA (47 citations)

3 protocols using jsm 7500fa microscope

Scanning Electron Microscope EDS Analysis

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A JEOL JSM-7500FA microscope
(Jeol, Tokyo, Japan) in a high-vacuum
mode, with an acceleration voltage of 5 kV and backscattered electrons
was used for the EDS analysis.

Imran M., Ramade J., Di Stasio F., De Franco M., Buha J., Van Aert S., Goldoni L., Lauciello S., Prato M., Infante I., Bals S, & Manna L. (2020). Alloy CsCdxPb1–xBr3 Perovskite Nanocrystals: The Role of Surface Passivation in Preserving Composition and Blue Emission. Chemistry of Materials, 32(24), 10641-10652.

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Pt Nanozymes Characterization by SEM and XPS

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SEM characterization of glassy carbon substrate surface covered by Pt nanozymes was performed by using JEOL JSM-7500FA microscope.
XPS analysis was performed using an AXIS ULTRA DLD (Kratos Analytical) photoelectron spectrometer equipped with a monochromatic AlKα source (1486.6 eV) operated at 150 W (10 kV, 15 mA), as already described in a previous report [41 (link)]. Further details are reported in the supporting info.

Mazzotta E., Di Giulio T., Mastronardi V., Brescia R., Pompa P.P., Moglianetti M, & Malitesta C. (2023). Nanozymes based on octahedral platinum nanocrystals with {111} surface facets: glucose oxidase mimicking activity in electrochemical sensors. Mikrochimica Acta, 190(10), 425.

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Characterization of Printed Galinstan Patterns

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Optical microscope observations were performed using Leica DM6000 Optical microscope. Field emission scanning electron microscope (FE-SEM) observations were performed using a JEOL JSM-7500FA microscope with an EDX solid-state X-ray detector. Transmission electron microscope (TEM) images, selected area electron diffraction (SAED) patterns were obtained using a JEOL JEM-2011. The surface roughness of the sample together with the thickness was analyzed using a JPK Nanowizard atomic force microscope (AFM) in the tapping mode. The crystal structure of printed galinstan pattern was evaluated by X-ray diffraction (XRD) (GBC MMA diffractometer) using Cu Kα radiation. The UV-vis absorption spectra were measured by the means of the diffuse reflection mode using a Shimadzu 2550 UV-vis spectrometer equipped with an integrating sphere.

Wang Y., Li Y., Zhang J., Zhuang J., Ren L, & Du Y. (2019). Native Surface Oxides Featured Liquid Metals for Printable Self-Powered Photoelectrochemical Device. Frontiers in Chemistry, 7, 356.

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