X-ray diffraction (XRD) was carried out on a Rigaku Ultima IV fully automatic high-resolution X-ray diffractometer system, with an X-ray generator operating at 40 kV and 40 mA at a 2θ step of 0.01° at room temperature. FTIR spectra were measured in the 4000–400 cm−1 range on a PerkinElmer Spectrum-I spectrometer with samples prepared as KBr pellets. Scanning electron microscopic (SEM) measurements were carried out with a JEOL (JSM-7600F) instrument equipped with an energy dispersive analysis of X-ray (EDAX) attachment. Raman spectroscopy was performed by a Raman spectrometer with microscope (Seki Technotron Corporation, Tokyo) with 532 nm laser equipped with X-ray photoelectron spectroscopy (XPS).
Spectrum 1 spectrometer
Manufactured by PerkinElmer
The Spectrum-I spectrometer is a versatile laboratory instrument designed for spectroscopic analysis. It is capable of measuring the absorption or emission spectra of various samples across a wide range of wavelengths. The core function of the Spectrum-I is to provide accurate and reliable spectroscopic data for scientific research and analysis.
Automatically generated - may contain errors
Lab products found in correlation
Ultima 4, by Rigaku (3 mentions)
Jsm 7600f, by JEOL (1 mentions)
Arx400 spectrometer, by Bruker (1 mentions)
Chirascan spectropolarimeter, by Applied Photophysics (1 mentions)
Rf 5301pc fluorescence spectrophotometer, by Shimadzu (1 mentions)
Cary5000 uv, by Agilent Technologies (1 mentions)
Truspec chns analyzer, by Leco (1 mentions)
Dtg 60h, by Shimadzu (1 mentions)
Jem 2100, by JEOL (1 mentions)
Chi660e potentiostat, by CH Instruments (1 mentions)
Escalab xi instrument, by Thermo Fisher Scientific (1 mentions)
V 750 spectrometer, by Jasco (1 mentions)
Fe sem, by JEOL (1 mentions)
4 protocols using spectrum 1 spectrometer
1
Comprehensive Materials Characterization Protocol
2
Comprehensive Characterization of Na2hissal Ligand
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The 1H NMR spectrum
of the Na2hissal ligand was recorded in D2O
solution at 25 °C on a Bruker ARX-400 spectrometer (chemical
shifts are referenced to the residual solvent signals). Elemental
analysis (C, H, N) of all compounds was done using a Leco TruSpec
CHNS analyzer. For all samples, thermogravimetric analysis was carried
out using Shimadzu DTG-60H from 25 to 500 °C (heating rate of
10 °C min–1) under a dinitrogen atmosphere.
IR spectra of samples prepared as KBr pellets were recorded in the
4000–400 cm–1 range on a Perkin-Elmer spectrum
I spectrometer. The UV–vis spectrum of a methanolic solution
of each compound (typical concentration: 1 mM) was recorded in a Cary
60 UV–Vis spectrophotometer using a cuvette of path length
1 cm. Solid-state diffuse reflectance spectra were measured in a Cary
5000 UV–vis–NIR spectrophotometer by Agilent Technology.
Optical rotations were measured using a glass cell with 50 mm path
length in an Anton Paar modular circular polarimeter (MCP 300). Using
a 2 mm path length quartz cuvette, CD spectra of all compounds were
recorded on a Chirascan spectropolarimeter (Applied Photophysics,
Leatherhead, Surrey, U.K.). Fluorescence spectra were recorded using
a Shimadzu RF5301PC fluorescence spectrophotometer.
of the Na2hissal ligand was recorded in D2O
solution at 25 °C on a Bruker ARX-400 spectrometer (chemical
shifts are referenced to the residual solvent signals). Elemental
analysis (C, H, N) of all compounds was done using a Leco TruSpec
CHNS analyzer. For all samples, thermogravimetric analysis was carried
out using Shimadzu DTG-60H from 25 to 500 °C (heating rate of
10 °C min–1) under a dinitrogen atmosphere.
IR spectra of samples prepared as KBr pellets were recorded in the
4000–400 cm–1 range on a Perkin-Elmer spectrum
I spectrometer. The UV–vis spectrum of a methanolic solution
of each compound (typical concentration: 1 mM) was recorded in a Cary
60 UV–Vis spectrophotometer using a cuvette of path length
1 cm. Solid-state diffuse reflectance spectra were measured in a Cary
5000 UV–vis–NIR spectrophotometer by Agilent Technology.
Optical rotations were measured using a glass cell with 50 mm path
length in an Anton Paar modular circular polarimeter (MCP 300). Using
a 2 mm path length quartz cuvette, CD spectra of all compounds were
recorded on a Chirascan spectropolarimeter (Applied Photophysics,
Leatherhead, Surrey, U.K.). Fluorescence spectra were recorded using
a Shimadzu RF5301PC fluorescence spectrophotometer.
3
Comprehensive Material Characterization
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X-ray diffraction (XRD) was carried out using a Rigaku Ultima IV fully automatic high-resolution X-ray diffractometer, with the X-ray generator operating at 40 kV and 40 mA at a step of 0.01(2θ) at room temperature. FTIR spectra were measured in the 4,000–400 cm−1 range on a Perkin-Elmer Spectrum-I spectrometer with samples prepared as KBr pellets. Raman spectroscopy was performed using a microscope with Raman optics (Seki Technetronic Corporation, Tokyo) with a 532 nm LASER.
4
Comprehensive Characterization of Electrocatalysts
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X-ray diffraction (XRD) patterns of the materials were obtained using a Rigaku-Ultima IV fully automatic high-resolution X-ray diffractometer equipped with an X-ray generator operating at 40 kV and 40 mA. The measurements were performed in a step of 0.01° (2θ) at room temperature. The as-prepared electrocatalysts were characterized by FE-SEM (JEOL-Japan) equipped with an energy dispersive X-ray analysis (EDAX) attachment. High-resolution transmission electron microscopy (HR-TEM) was performed using a JEOL JEM 2100 instrument. Fourier transform infrared (FTIR) spectroscopy was recorded in the range of 4000–500 cm−1 on a PerkinElmer Spectrum-I spectrometer. Field emission scanning electron microscopy and Raman spectroscopy were performed using a Raman spectrometer with a microscope (Seki Technotron Corp., Tokyo) with a 532 nm laser. UV-visible spectroscopy of the samples was done using a Jasco V-750 spectrometer. X-ray photoelectron spectroscopy (XPS) was analyzed by a Thermo Fischer Scientific ESCALAB Xi+ instrument. All electrochemical studies were performed using a CHI-660E potentiostat (CH-instrument, USA) and a three-electrode cell comprising a saturated calomel (SCE) reference electrode, a Pt wire counter electrode, and a working electrode.
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