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Verios 460l xhr

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Verios 460L XHR is a high-resolution scanning electron microscope (SEM) designed for advanced imaging and analysis. It features a large specimen chamber and a high-resolution electron beam, enabling the capture of detailed images of a wide range of samples.

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4 protocols using verios 460l xhr

1

Electrochemical Characterization of N-Doped Porous Carbon

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We purchased almonds from the local market and obtained the shells. By mixing the stock solutions of 0.1 M NaAc and HAc, 0.1 M acetate buffer solution (HAc–NaAc) was prepared. Standard Pb(ii) solution (1000 mg L−1) was received from NCS Testing Technology Co. Ltd. (Beijing, China), and 5% Nafion stock solution was bought from Sigma-Aldrich (Shanghai, China). All chemical reagents received were of analytical grade. For all electrochemical tests, solutions were prepared in ultrapure water (≥18.2 MΩ cm).
A RST 5000C workstation (Zhengzhou Shiruisi Technology Co., Ltd. Zhengzhou, China) was used for electrochemical analysis. For carbonization and activation, we used a pipe furnace (GSL-1500X, Hefei Kejing Material Co., Ltd. Hefei, China). For the characterization of N-NPC samples, various techniques such as X-ray diffraction (X-ray D/max-2200vpc, Rigaku Corporation, Japan), Raman spectroscopy (confocal microprobe Raman system, HR800, Jobin Yvon, France), X-ray photoelectron spectroscopy (XPS, Thermo Scientific Escalab 250Xi, China), nitrogen sorption (NOVA 2000e, USA) and scanning electron microscopy (SEM, FEI Verios 460 L XHR Germany) were used.
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2

Elemental Analysis via SEM-EDS

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Elemental analysis was performed by using a scanning electron microscope (SEM), FEI Verios 460L XHR (extreme high resolution, Hillsboro, OR, USA), equipped with energy-dispersive X-ray spectroscopy (Thermo Fischer Scientific, Gloucester, UK).
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3

Scanning Electron Microscopy and Elemental Analysis of Palladium Complex

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Scanning electronic microscopy (SEM) and elemental analysis of ι-Pd(OAc)2(TPPTS)2 were performed with lyophilized samples that were previously coated with gold, using FEI Verios 460L XHR (extreme high resolution, Hillsboro, OR, USA) scanning electron microscope, equipped with energy-dispersive X-ray spectroscopy (EDS, Oxford Instruments). The acceleration voltage was 20 kW.
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4

Elemental Analysis of i-PdCl2(TPPTS)2 by SEM-EDS

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Elemental analysis of i-PdCl2(TPPTS)2 was performed using scanning electron microscope (SEM), FEI Verios 460L XHR (extreme high resolution, Hillsboro, OR, USA), equipped with energy-dispersive X-ray spectroscopy (EDS, Oxford Instruments, Oxford, UK).
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