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Jsm 5600lv scanning electron microscope

Manufactured by JEOL
Sourced in Japan, United States, United Kingdom

The JSM-5600LV is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-quality imaging and analysis of samples at the micro and nanoscale levels. The JSM-5600LV utilizes an electron beam to scan the surface of a sample, generating detailed images and data about its topography and composition.

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25 protocols using jsm 5600lv scanning electron microscope

1

Bacterial Imaging Using SEM

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Twenty milliliters of culture from different conditions was centrifuged at 5000 g for 10 min at 25 °C. The pellets were then washed thrice in 10 ml ice-cold PBS and centrifuged at 5000 rpm for 5 min at 25 °C. Pellets were dissolved in 1 ml Dubos Difco broth and later vortexed vigorously to disperse bacterial clumps. Suspensions with an OD (600 nm) of 0.15 were prepared in fresh Dubos broth. Three hundred microliters from each sample was then loaded onto polylysine-coated cover slips that were prepared according to manufacturer’s guidelines (Sigma-Aldrich St. Louis MO USA). Bacteria were allowed to settle for 30 min before gently decanting the medium. One milliliter of 2.5% glutaraldehyde in PBS (pH 7.4) was added to the bacterial film on the coverslip and incubated overnight at 4 °C. A series of dehydration steps were performed for 10 minutes each in 50%, 70%, 95% and 100% ethanol and the coverslips were dried at room temperature. Samples were gold-sputtered using JEOL-1200 (Peabody, MA, USA) and imaged using a JEOL-JSM-5600 LV scanning electron microscope.
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2

Crystal Characterization Protocol

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Crystal size, morphology, and topography were intensively studied with SEM. Samples were prepared for imaging by first placing them on conductive carbon paper and then coating with ~10 nm of Gold/Palladium (Au/Pd) using a Hummer® 6.2 Sputter Coater System. Coated samples were imaged using the JEOL-JSM-5600LV Scanning Electron Microscope with 2.0–15.0 KV acceleration voltage. For analysis purposes, three samples of each crystal preparation were studied as the following: three images were collected per sample and ten random measurements were applied per image.
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3

Multimodal Characterization of Cementitious Composites

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The visual macrostructural analysis of cementitious composites was initially conducted without optical magnification equipment to assess the uniformity of aggregate distribution in the cementitious binder matrix. Subsequently, a LEICA SAPO optical microscope (Leica Microsystems, GmbH, Wetzlar, Germany) was used for microscopic analysis to examine the distribution at the macroporosity level.
A JEOL/JSM 5600—LV scanning electron microscope (JEOL Ltd., Tokyo, Japan) operating in the secondary electron imaging (SEI) mode at 15 kV acceleration voltage was used to take SEM and EDS images. As part of the preparation process, the samples were gold coated by plasma sputtering to improve the electrical conductivity for electron microscopy analysis. Phase identification in the samples was carried out using X-ray diffraction (XRD) in the angular range 2θ = 20−85°. An INEL Equinox 3000 diffractometer (Thermo Fisher Scientific S.p.A., Milan, Italy) using Co-Kα radiation (λ = 1.7903 Å) was used.
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4

Scanning Electron Microscopy of Intestinal Microvilli

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In order to determine the differentiation status of intestinal epithelial cells, the presence of microvilli was assessed by scanning electron microscopy (SEM). The protocol for SEM was performed as described by Glorieux and colleagues54 (link). Tissue samples (ileum and colon from 3-day-old piglet) and cell samples (porcine enterocytes 3 days post co-cultivation) were fixed in HEPES-buffered glutaric aldehyde for 24 hours. Then, the samples were treated with 1% osmiumtetroxide for 2 hours at RT, followed by ascending grades of alcohol dehydration. In order to avoid the water vaporization obstructing the electron beam and interfering with image clarity, the dehydrated samples were transferred to a critical point drier (CPD, Bal-tec, Balzers, Liechtenstein) for complete drying. Finally, the dried samples were mounted on a metal stub and sputter-coated with platinum. The microvilli of all the samples were acquired with a JEOL JSM 5600 LV scanning electron microscope (JEOL Ltd., Tokyo, Japan).
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5

Electron Microscopy of Gill Samples

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For SEM, the gill samples were preserved in a HEPES-glutaraldehyde solution. Tissue samples were postfixed in 1% buffered osmium tetroxide for 2 h and dehydrated in an increasing alcohol series followed by increasing ethanol–acetone series up to 100% acetone. The samples were then dried to the critical point with a Balzers CPD 030 critical point drier (Sercolab bvba, Merksem, Belgium) and further mounted on metal bases and sputtered with platinum using the JEOL JFC 1300 Auto Fine Coater (Jeol Ltd, Zaventem, Belgium). The samples were examined with a JEOL JSM 5600 LV scanning electron microscope (Jeol Ltd). For TEM processing, a protocol as described by De Spiegelaere et al. [24 (link)] was used. For examination of the TEM-samples, a JEM-1400 plus Jeol electron microscope (Jeol Ltd) operating at 80 kV was used. Micrographs were taken digitally.
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6

Crystal Characterization Protocol

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Crystal size, morphology, and topography were intensively studied with SEM. Samples were prepared for imaging by first placing them on conductive carbon paper and then coating with ~10 nm of Gold/Palladium (Au/Pd) using a Hummer® 6.2 Sputter Coater System. Coated samples were imaged using the JEOL-JSM-5600LV Scanning Electron Microscope with 2.0–15.0 KV acceleration voltage. For analysis purposes, three samples of each crystal preparation were studied as the following: three images were collected per sample and ten random measurements were applied per image.
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7

Multi-modal Microscopy Imaging Protocol

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Brightfield images were captured using a Leica M165FC microscope with a DFC450 C color camera (Leica Microsystems, Wetzlar, Germany). Fluorescent imaging was performed using a Zeiss Axio Zoom.V16 microscope with an Axiocam 305 color camera (Carl Zeiss Microscopy, Jena, Germany). Zstack recordings were reconstructed to a single in-focus image using the complex wavelet-based Extended Depth of Field plugin in ImageJ (FIJI distribution, version 1.52n, NIH) (Forster, Van De Ville, Berent, Sage & Unser, 2004 (link), Schindelin, Arganda-Carreras, Frise, Kaynig, Longair et al., 2012) (link). For scanning electron microscopy (SEM), the sample was mounted on an aluminium base and sputtered with platinum using the JEOL JFC 1300 Auto Fine Coater (Jeol Ltd., Tokyo, Japan). The sample was examined with a JEOL JSM 5600 LV scanning electron microscope (Jeol ltd.). Multiple images were stitched together using the ImageJ plugin developed by (Preibisch, Saalfeld & Tomancak, 2009) (link).
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8

SEM Analysis of Resin Specimen Surface

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The surface of the resin specimens after the wear test was coated with an evaporated gold layer using an ion coater (Quick Auto Coater SC-701AT, Sanyu Electron Co., Ltd., Tokyo, Japan). The morphology of the treated surface was then observed using a scanning electron microscope (SEM; JEOL JSM-5600LV Scanning Electron Microscope, JEOL Ltd., Tokyo, Japan) with 15 kV acceleration voltage and 500-fold magnification.
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9

Surface Analysis of C-steel Corrosion Mitigation

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For the surface analysis, C-steel specimens were immersed in 1.0 M HCl solution without and with the optimum concentration of PyODT at 298 K. After 1 h and 12 h of exposure, the metallic samples were carefully removed from the electrolyte, gently washed with distilled water, dried at room temperature, and characterized without any further treatment by scanning electron microscopy (SEM). SEM measurements were carried out using a JSM 5600 LV scanning electron microscope (JEOL, Akishima, Tokyo, Japan), operated at an accelerating voltage of 15 kV. The elemental analysis of the corrosion products formed on the C-steel surface was performed by the energy-dispersive X-ray spectroscopy (EDX) using an Oxford Instruments spectrometer (UltimMAx65 (High Wycombe, UK).
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10

Arachidonic Acid Induced Tau Aggregation

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The aggregation of Tau244–372 (8 μM) was induced by 150 μM of arachidonic acid (Sigma) in buffer containing 10 mM Hepes (pH 7.6), 100 mM NaCl, 5 mM dithiothreitol for 24 h incubation at room temperature without stirring16 (link). To detect a direct effect of mCRP on Tau aggregation, Tau was incubated with mCRP (10 μg/ml) in the same buffer (minus arachidonic acid) for 24 h (4 h-5 days pilot study estimates were carried out to optimise this-data not included) at room temperature. The protein samples were fixed with 2% glutaraldehyde (Sigma), ultracentrifuged at 100,000 g for 30 minutes then spread on glass coverslips and allowed to dry in air. The samples were then sputter coated with gold and examined in a Jeol JSM-5600LV scanning electron microscope at an accelerating voltage of 12 kV and 10,000× magnification. Experiments were carried out at least twice and a representative example is shown.
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