Jsm 5600lv scanning electron microscope
The JSM-5600LV is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-quality imaging and analysis of samples at the micro and nanoscale levels. The JSM-5600LV utilizes an electron beam to scan the surface of a sample, generating detailed images and data about its topography and composition.
Lab products found in correlation
25 protocols using jsm 5600lv scanning electron microscope
Bacterial Imaging Using SEM
Crystal Characterization Protocol
Multimodal Characterization of Cementitious Composites
A JEOL/JSM 5600—LV scanning electron microscope (JEOL Ltd., Tokyo, Japan) operating in the secondary electron imaging (SEI) mode at 15 kV acceleration voltage was used to take SEM and EDS images. As part of the preparation process, the samples were gold coated by plasma sputtering to improve the electrical conductivity for electron microscopy analysis. Phase identification in the samples was carried out using X-ray diffraction (XRD) in the angular range 2θ = 20−85°. An INEL Equinox 3000 diffractometer (Thermo Fisher Scientific S.p.A., Milan, Italy) using Co-Kα radiation (λ = 1.7903 Å) was used.
Scanning Electron Microscopy of Intestinal Microvilli
Electron Microscopy of Gill Samples
Crystal Characterization Protocol
Multi-modal Microscopy Imaging Protocol
SEM Analysis of Resin Specimen Surface
Surface Analysis of C-steel Corrosion Mitigation
Arachidonic Acid Induced Tau Aggregation
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