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Aztec eds system

Manufactured by Oxford Instruments
Sourced in United Kingdom

The Aztec EDS system is an energy-dispersive X-ray spectroscopy (EDS) solution developed by Oxford Instruments. The system is designed to provide elemental analysis capabilities for material characterization in a variety of applications.

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6 protocols using aztec eds system

1

Characterization of Biomineralized Cement

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Structures of the set cement materials and surface deposits formed in the SBF assays were examined by X-ray diffraction analysis (XRD) on a D 5000 X-Ray Diffractometer (Siemens, Karlsruhe, Germany), using CuKα radiation within a 2θ range of 5 – 40° at a scanning speed of 1.2° min-1. In addition, attenuated total reflectance with Fourier transform infrared spectroscopy (ATR-FTIR) analysis was performed using a Cary 630 Agilent Technologies FTIR-ATR (Agilent Technologies Inc., Santa Clara, CA, USA) spectrometer in the 400-4000 cm-1 wavenumber range.
Discs, before and after seven days of SBF immersion, were dehydrated, mounted on aluminium stubs, and coated with gold. Specimens were examined using a scanning electron microscope (Jeol JSM-IT300LV, JEOL USA Inc., USA) connected to an energy dispersive x-ray detector for elemental analysis with computer-controlled software, the Aztec EDS system (Oxford Instruments, Abingdon, UK). Micrographs of the material surface at 500x and 2000x magnifications were captured, and EDX quantitative chemical analyses were performed of BD, 1%nBG/BD, and 2%nBG/BD samples after seven days of SBF immersion at 2000x augmentation, representative areas for each material were analysed, and Ca/P ratio was calculated.
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2

Mineral Analysis of Bracket Adhesion

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SEM and EDX examined the prepared samples to evaluate calcium and phosphate percentages at three time intervals: before bonding of the bracket system, after the debonding process, and after the remineralization stage.
After drying, the samples were mounted on aluminum stubs using double-sided carbon-coated adhesive tape. Then, using an EMS-350 sputter coater (Electron Microscopy Sciences, Hatfield, PA, USA) set at 20 Ma for 90 s, samples were coated with gold–palladium.
At the National Research Centre in Cairo, the samples were examined using SEM (TESCAN VEGA 3, JEOL USA Inc., USA) at an accelerating voltage of 10 kV and a working distance of 5–10 mm. The Aztec EDS system (Oxford Instruments, Abingdon, UK) with computer-controlled software was used to analyze the samples using an energy-dispersive X-ray detector.
Micrographs of the material surface were taken at magnifications of 1000x. Samples were then subjected to EDX quantitative chemical analyses at the same magnification. Representative regions for each stage were analyzed, and the mineral atom mass % was computed.
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3

Transmission Kikuchi Diffraction Analysis

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Transmission Kikuchi Analysis (TKD) analysis was performed using a Zeiss Ultra Plus FEG SEM, equipped with an Oxford Instruments Channel 5 EBSD system and a Nordlys-S EBSD detector at the Australian Centre for Microscopy and Microanalysis, The University of Sydney, operated at 1–10 nA and 30 kV at high vacuum. Phase composition was determined using an Oxford Instruments AZtec EDS system with an X-Max 20 mm2 silicon drift detector. The TEM foil was mounted using custom-made clamps attached to a standard 70° tilted EBSD sample holder. The SEM stage was tilted toward the EBSD detector by 20° at a working distance of typically 5 mm from the pole piece13 (link). After positioning of the SEM stage the EBSD detector including phosphorous screen and forescatter detectors was fully inserted.
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4

Characterizing Cu/Ag Bilayer Cross-Sections

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SEM images and EDS were acquired using FEI Quanta 250 FE‐SEM equipped Oxfords X–Max 80 and corrected by FEI Quanta‐FEG 250 SEM equipped with an Oxford Instruments Aztec EDS system. For cross‐section analysis, bilayer Cu/Ag samples were vacuum‐embedded into epoxy (EpoxySet 145‐20005, Allied High Tech Products), with addition of 5 % of iodoform, then cured overnight at room temperature. The cured samples were polished through 1 μm diamond slurry for characterization. For cross‐section analysis, CuSus/AgNaf sample was embedded into iodine‐epoxy and cured overnight followed by polishing with sandpaper. The static contact angles were measured by placing carbon paper‐based catalysts on a flat electrode surface using a contact angle meter (MCA‐4, Kyowa Interface Science Co., Ltd). One drop of 6 μL deionized (DI) water was dropped on each surface region, and the pictures were taken within 30 s. Each sample was measured at five different regions and the average was calculated.
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5

Scanning Electron Microscopy of Algal Biomass

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After biosorption, dried algal biomass was mounted onto specimen stubs and coated in carbon (BTT-IV carbon evaporation coater, Denton Vacuum, USA). Samples were visualised using a scanning electron microscope (Zeiss SIGMA HD VP FE-SEM, Carl Zeiss Microscopy, UK) at the School of GeoSciences, University of Edinburgh (Manning et al., 2017) . Images were recorded using the backscattered electrons technique (BSE). SEM energy-dispersive X-ray (EDX) analysis (Aztec EDS system, Oxford Instruments) was performed on samples utilising an accelerating voltage of 20 kV, an aperture size of 30 µm, and a working distance of 7 ± 1 mm.
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6

Characterization of Copper-Chitosan Nanoparticles

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NPs were analyzed by scanning electron microscopy (SEM, Jeol JSM-IT300LV, JEOL USA, Peabody, MA, USA) equipped with energy dispersive X-ray detector (Aztec EDS system, Oxford Instruments, Abingdon, UK). Particle size distribution was estimated by using the analysis tools of the microscope software. CuChNP were also characterized by attenuated total reflectance with Fourier transform infrared spectroscopy (ATR-FTIR) on an Agilent Cary 630 Agilent Technologies FTIR-ATR (Agilent Technologies, Santa Clara, CA, USA). Thermogravimetric (TG) analysis (from 10-900°C) of CuChNP was done in a Netzsch TG 209F1 Libra ® (Netzsch Group, Selb, Germany) at a heating rate of 10°C/min in air.
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