Discs, before and after seven days of SBF immersion, were dehydrated, mounted on aluminium stubs, and coated with gold. Specimens were examined using a scanning electron microscope (Jeol JSM-IT300LV, JEOL USA Inc., USA) connected to an energy dispersive x-ray detector for elemental analysis with computer-controlled software, the Aztec EDS system (Oxford Instruments, Abingdon, UK). Micrographs of the material surface at 500x and 2000x magnifications were captured, and EDX quantitative chemical analyses were performed of BD, 1%nBG/BD, and 2%nBG/BD samples after seven days of SBF immersion at 2000x augmentation, representative areas for each material were analysed, and Ca/P ratio was calculated.
Aztec eds system
The Aztec EDS system is an energy-dispersive X-ray spectroscopy (EDS) solution developed by Oxford Instruments. The system is designed to provide elemental analysis capabilities for material characterization in a variety of applications.
6 protocols using aztec eds system
Characterization of Biomineralized Cement
Discs, before and after seven days of SBF immersion, were dehydrated, mounted on aluminium stubs, and coated with gold. Specimens were examined using a scanning electron microscope (Jeol JSM-IT300LV, JEOL USA Inc., USA) connected to an energy dispersive x-ray detector for elemental analysis with computer-controlled software, the Aztec EDS system (Oxford Instruments, Abingdon, UK). Micrographs of the material surface at 500x and 2000x magnifications were captured, and EDX quantitative chemical analyses were performed of BD, 1%nBG/BD, and 2%nBG/BD samples after seven days of SBF immersion at 2000x augmentation, representative areas for each material were analysed, and Ca/P ratio was calculated.
Mineral Analysis of Bracket Adhesion
After drying, the samples were mounted on aluminum stubs using double-sided carbon-coated adhesive tape. Then, using an EMS-350 sputter coater (Electron Microscopy Sciences, Hatfield, PA, USA) set at 20 Ma for 90 s, samples were coated with gold–palladium.
At the National Research Centre in Cairo, the samples were examined using SEM (TESCAN VEGA 3, JEOL USA Inc., USA) at an accelerating voltage of 10 kV and a working distance of 5–10 mm. The Aztec EDS system (Oxford Instruments, Abingdon, UK) with computer-controlled software was used to analyze the samples using an energy-dispersive X-ray detector.
Micrographs of the material surface were taken at magnifications of 1000x. Samples were then subjected to EDX quantitative chemical analyses at the same magnification. Representative regions for each stage were analyzed, and the mineral atom mass % was computed.
Transmission Kikuchi Diffraction Analysis
Characterizing Cu/Ag Bilayer Cross-Sections
Scanning Electron Microscopy of Algal Biomass
Characterization of Copper-Chitosan Nanoparticles
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