Rfs 100 s
The RFS 100/S is a laboratory instrument designed for high-performance Raman spectroscopy. It features an advanced optical system and a high-sensitivity detector to capture Raman scattering signals with precision. The core function of the RFS 100/S is to enable researchers and analysts to conduct Raman spectroscopic analysis of various materials and substances.
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12 protocols using rfs 100 s
Quantifying Enamel Chemical Changes After Bleaching
Raman Spectroscopic Analysis of Dentin
The samples were positioned in the sample holder compartment and an IR352 lens collected radiation scattered through 90° on the dentin surface. For each sample, one spectrum was collected at a central point on the cervical dentin root. In order to obtain a good signal to noise ratio, 100 scans were co-added for each spectra. Five spectra were obtained in each group.
The changes in the organic dentin components were analyzed by comparing the integrated areas of the Raman peak centered at 2940 cm1 . The integrated areas of the peaks were calculated with the software Microcal Origin 6.0 (Microcal Software, Inc., Northampton, MA, USA).
Polymer Characterization and Measurement Techniques
1H and 13C NMR spectra were recorded on Bruker Avance 500 and Bruker Avance 400 spectrometers. Absorption spectra were measured using a Jasco V-570 UV-Vis spectrophotometer. IR and Raman spectra were measured using TENSOR 27 (Bruker) and RFS 100/S (Bruker), respectively. ESR spectra were recorded on ESP 300 (Bruker). AFM images were recorded on a Nanoscope III AFM in trapping mode. GIWAXS measurements were conducted at the 8-ID-E beamline (56 (link)) at the Advanced Photon Source, Argonne National Laboratory, using x-rays with a wavelength of λ = 1.6868 Å and a beam size of ~200 μm (h) and 20 μm (v). PDS was performed as reported before (53 (link)). Thin film thicknesses were measured using a profilometer (Ambios Technology XP-2). The x-ray photoelectron spectroscopy (XPS) measurements were performed on the ESCALAB 250Xi XPS system. Capacitance at different frequencies (1 to 2000 Hz) was measured on NF ZM2371 LCR meter.
Multimodal Spectroscopic Characterization
Comprehensive Material Characterization Protocol
Raman Spectroscopy of Trypomastigotes
To investigate the presence of AA directly in LBs, purified LBs from untreated and 7.5 μM AA-treated groups were placed over 20 mm CaF2 windows (cat. number 63207; Edmund Optics, Barrington, NJ, USA) and the data collected with a laser power of 20 mW, 50 s integration time and 5 co-additions, without any labeling. The Raman spectra were obtained in a Senterra Raman spectrometer (Bruker) based in a 180° backscattering configuration and using a 50x objective and the 632.8 nm wavelength of He-Ne laser output as excitation. A spectral resolution of 3–5 cm-1 and slit width of 50x1000 μm were chosen.
Pre-resonant Raman Spectroscopy of OCP
Raman Spectroscopy of Chitosan-Alginate Hydrogels
Characterization of WO3-based Catalysts
X-ray diffraction (XRD) patterns were obtained using a D8 (FOCUS) X-ray diffractometer with a Cu Kα radiation source operating at 40 kV and 40 mA. The XRD profiles were collected between 2θ: 10° and 60°. Raman spectra were obtained using an RFS100/S (Bruker) FT-Raman spectrometer with excitation at 1064 nm from an Nd:YAG laser. Diffuse reflectance spectra were measured on a Cary 50Scan (Varian) spectrometer using a reflectance accessory coupled optical fiber (Pike).
X-ray photoelectron spectra were obtained through a K-alpha XPS, Thermo Fisher Scientific, aiming to identify the composition of sample compounds. It used an Al Kα emission with applied vacuum <10−8 mbar. The experiments were performed with 1400 and 50 eV energy, with 1.0 and 0.1 eV resolutions, respectively.
Electrochemical and Spectroscopic Characterization
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