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520 protocols using tecnai g2 f20

1

Comprehensive Microstructural Analysis of Nanofibers

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The crystalline microstructures of the samples were examined by XRD (X-ray diffraction, Rigaku D/Max-2400 diffractometer, Cu Kα radiation, λ = 0.15406 nm) in the range of 10–80° with a scanning speed of 2° min−1. The applied tube voltage and current were 40 kV and 30 mA, respectively. The element types, valence states and detailed chemical bonding energy were investigated by X-ray photoelectron spectroscopy (XPS, Kratos AXIS Ultra DLD, Al Kα probe beam, the applied photoelectron energy hv = 1486.6 eV), and the nanofiber sample was pressed into a film by a tablet press and evacuated for 1 day before testing. The fitting software of the high-resolution spectra was XPS Peak.
To prepare the FE-SEM (field-emission scanning electron microscopy, S-4800, Hitachi) characterization, the sample is glued to the metal table with conductive glue. In addition, a TEM (transmission electron microscopy, FEI, Tecnai G2 F20) with EDX (energy dispersive X-ray) spectroscope was applied to acquire the detailed microstructure and composition. During the sample preparation, the sample was first put into an alcohol solution and ultrasonicated for about 10 min. Next, a dropper was used to draw a small amount of supernatant onto the micro-grid. Finally, the micro-grid with the sample was dried for a few minutes to evaporate alcohol.
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2

Multimodal Analysis of Extracellular Vesicles

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EV samples were stained with fluorescein isothiocyanate (FITC) mouse antihuman CD9 (555371) and PerCP-Cy™5.5 mouse antihuman CD63 antibodies (565426) from BD Biosciences (San Jose, CA, USA) for 30 min at room temperature under dark lighting. EVs were acquired using an Accuri C6 flow cytometer (BD Biosciences), and analysis was performed using FlowJo software (Treestar, Inc., San Carlos, CA, USA). EVs stained in the same way were also analyzed using confocal microscopy with a Carl Zeiss microscope (LSM900, Zeiss, Oberkochen, Germany). Image analysis was performed using ZEN3.0 (blue edition) software.
Transmission electron microscopy (TEM) analysis was performed by fixing EV pellets with 4% paraformaldehyde (PFA) and then by negative-staining them with 1% uranyl acetate. The equipment used for analyzing EVs mounted on the grid was Tecnai™ G2-F20 (FEI, OR, USA).
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3

Thin Film Microstructural Analysis Protocol

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A thin film with a thickness of about 0.60 mm was fabricated from the steel sheet. Thin foil specimens for transmission electron microscopy (TEM, FEI, Hillsboro, OR, USA) and electron energy loss spectroscopy (EELS, JEOL, Tokyo, Japan) analysis were mechanically polished to about 50 μm thickness, punched to disks of 3 mm diameter, and then electropolished in the solution that contains 10% perchloric acid and 90% glacial acetic acid. At a temperature of −30 °C and a current of 35–160 mA, electrolytic double spray was used for 2 to 3 min. TEM observation was performed in a FEI Tecnai G2 F20 (Hillsboro, OR, USA) field emission transmission electron microscope operated at an accelerating voltage of 200 kV.
The 10% perchloric acid alcohol solution was used for electrolytic polishing of scanning electron microscope (SEM, JEOL, Tokyo, Japan) samples, with voltage of 26 V, current of 0.6 A, and polishing time of 25–30 s. The boundary properties were examined by electron back-scattered diffraction (EBSD) using a JEOL JEM-7800F field emission scanning electron microscope equipped (Tokyo, Japan) with an Oxford BESD detector (Oxford, UK). The EBSD data were analyzed using CHANNL 5 software (HKL, Danbury, CT, USA).
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4

Comprehensive Characterization of Material Properties

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Transmission electron microscopy (TEM) was conducted using a Tecnai G2 F20 (FEI, Eindhoven, The Netherlands) at 200 kV. The Brunauer–Emmett–Teller (BET) method was utilized to calculate the specific surface area (SBET). Nitrogen adsorption isotherms (T = 77 K) were obtained using an ASAP 2020 adsorption analyzer (Micromeritics, Norcross, GA, USA). Total pore volume (Vtp) and average pore diameter (Dp) were obtained using Barrett–Joyner–Halenda (BJH) method. A D/max-2500 X-ray diffraction analyzer (Cu Kα λ = 0.154 nm, 100 mA, 40 kV, 6° min−1, Rigaku, Tokyo, Japan) was used to collect X-ray diffraction (XRD) patterns. Fourier transform infrared spectroscopy (FTIR) was recorded by Tensor 27 (Bruker Optics, Ettlingen, Germany). X-ray photoelectron spectroscopy (XPS) was performed on an ESCALAB 250XI (Thermo Fisher, Waltham, MA, USA) for surface analysis. C element content was measured by TOC-VCPH (Shimadzu, Kyoto, Japan) and those of Si, Al and Fe elements were detected using inductively coupled plasma optical emission spectrometry (ICP-OES) iCAP 7400 (Thermo Fisher, Waltham, MA, USA). The content of Cr(VI) was determined using 1,5-diphenylcarbazide by a U-3010 UV-vis spectrophotometer (Hitachi, Tokyo, Japan) (λ = 540 nm) [32 ]. The concentration of aniline in samples was measured using a U-3010 UV-vis spectrophotometer (Hitachi, Tokyo, Japan) (λ = 230 nm) [33 (link)].
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5

Quantifying Carbon Nanotube Content

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Powder X-ray diffraction (XRD) measurements were performed on PIXcel3D X-ray diffractometer using Cu Kα radiation source to identify the crystal structure of the materials. The morphology of the products was analyzed by field emission scanning electron microscopy (FESEM, Hitachi SU-70, Hitachi High-Technologies Corporation, Tokyo, Japan). Transmission electron microscopy (TEM) and high-resolution TEM (HRTEM) images were recorded by using a transmission electron microscope (Tecnai G2 F20, FEI Company, Hillsboro, Oregon, USA). The content of the CNTs was evaluated by an acid dissolution method. Typically, 3.0 g nanocomposites were dissolved in 50 mL concentrated hydrochloric acid (6 M). The CNTs were collected by centrifugation and washed several times with deionized water and ethanol, and then dried in a vacuum oven at 90 °C for 24 h. The content was determined according to the weight of residual CNTs.
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6

Detailed Characterization of Novel Compounds

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All reagents and solvents were commercially available and used without any further purification. The crystallographic diffraction data of 1 and 2 were collected with an Agilent Technologies Gemini A Ultra diffractometer equipped with graphite-monochromated Mo-Kα radiation at room temperature. The elemental analyses were performed on a PerkinElmer 2400 elemental analyzer. The FT-IR absorption spectra were recorded on a Nicolet Impact 410 FTIR in the range of 4000–400 cm−1 using the KBr pellets. Powder X-ray diffraction (PXRD) measurements were performed on a Bruker D8 Advance X-ray diffractometer using Mo-Kα radiation in the ambient environment. To determine the specific surface area, adsorption–desorption of N2 gas at 77 K measurements were obtained by a Micromeritics ASAP 2000 gas sorption analyzer. The morphology and structure of the prepared samples were examined by electron microscopy (SEM, Zeiss merlin; TEM, FEI Tecnai G2 F20).
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7

Cryo-EM Imaging of Assembled Proteins

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Five μL of the assembled protein was pipetted onto glow-discharged Quantifoil holey carbon TEM grids (Electron Microscopy Sciences). Excess fluid was removed before the sample was flash frozen hydrated by plunging into a bath of liquid ethane slush using the FEI Vitrobot Mark IV [56 (link)]. The grids were stored in liquid nitrogen until imaged with the Tecnai G2 F20, operated at an accelerating voltage of 200 kV or Titan Krios cryo-STEM (FEI) at an accelerating voltage of 300 kV. Images were recorded under low dose conditions with a Gatan Ultrascan 4000 CCD camera at a nominal magnification of 50,000 X corresponding to a pixel size of 0.22 nm and a defocus level ranging from − 1.5 to − 2.5 μm.
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8

Comprehensive Characterization of Perovskite Oxides

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All the obtain perovskite oxides were characterized by X-ray diffraction (XRD, Siemens-Bruker D5000) with Cu Kα radiation. Transmission electron microscope (TEM) images, energy dispersive spectrometer, EDS mapping, were carried out on FEI Tecnai G2 F20 transmission electron microscope operated at 200 kV. X-ray photoelectron spectroscopy (XPS) analyses were performed using a PHI Quantum 2000 scanning ESCA Microprobe spectrometer, and scanning electron microscope (SEM) images were performed by a field emission scanning electron microscope model S-4800. Brunauer-Emmett-Teller (BET) surface area and pore size distribution was measured by N2 adsorption-desorption analysis using Quantachrome Autosorb-IQ.
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9

Characterization of ZnO Nanocrystals

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UV–vis–NIR absorption spectra were collected in a 1 cm air-free quartz cuvette using a Cary 500 spectrometer, with typical nanocrystal concentrations of 5–20 µM. The radii of small nanocrystals (r ≤ 2.8 nm) were determined from the empirical correlation between radii and absorption spectra.13 ,19 The radii of larger nanocrystals (r = 3.7 nm) were determined by statistical analysis of transmission electron microscopy (TEM) images collected using a FEI Tecnai G2 F20 instrument. ZnO nanocrystal concentrations were determined analytically. First, 200 µL of the nanocrystal suspension was dried and digested in 200 µL of ultrapure nitric acid (TraceSELECT, Fluka). The resulting solution was diluted with a known amount of ultrapure water (10.00 g, measured to two decimal places on a balance), and the Zn2+ concentration was measured using inductively coupled plasma atomic emission spectroscopy (PerkinElmer 8300 instrument). The nanocrystal concentration was then calculated using the known dilution factors and nanocrystal radii to convert from Zn2+ concentration to nanocrystal concentration.
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10

Characterization of 2D MoS2 and GQDs

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The MoS2 films were wet-transferred onto a quartz substrate by etching away the SiO2 in a potassium hydroxide solution for subsequent UV-visible spectral measurements on a UV-visible-infrared spectrometer (PerkinElmer, Lambda750). Raman and PL spectra were measured on a micro-Raman system (Horiba Jobin Yvon, LabRAM HR 800) with a 514 nm excitation laser. The Raman and PL images were obtained with a confocal micro-Raman system (WITec, Alpha 300a) with a 532 nm laser. The spatial resolution is approximately 250 nm with a focused laser by a 100× objective lens. The time-resolved PL decay transients were measured with a transient state fluorescence spectrometer (HORIBA Jobin Yvon, FL-TCSPC). Chemical composition analysis was performed using XPS (KRATOS Analytical, AXIS Ultra DLD). The surface morphology of the samples was examined by SEM (FEI, Quanta 200FEG) and AFM (Bruker, Dimension Icon). The microstructures of MoS2 and GQDs were investigated using HRTEM (FEI, Tecnai G2 F20). For the preparation of the TEM samples, the MoS2 film was also wet-transferred onto TEM grids.
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