To prepare the FE-SEM (field-emission scanning electron microscopy, S-4800, Hitachi) characterization, the sample is glued to the metal table with conductive glue. In addition, a TEM (transmission electron microscopy, FEI, Tecnai G2 F20) with EDX (energy dispersive X-ray) spectroscope was applied to acquire the detailed microstructure and composition. During the sample preparation, the sample was first put into an alcohol solution and ultrasonicated for about 10 min. Next, a dropper was used to draw a small amount of supernatant onto the micro-grid. Finally, the micro-grid with the sample was dried for a few minutes to evaporate alcohol.
Tecnai g2 f20
The Tecnai G2 F20 is a high-performance transmission electron microscope (TEM) designed for advanced materials characterization. It features a field-emission gun (FEG) source and offers high resolution, high contrast, and exceptional imaging capabilities.
Lab products found in correlation
520 protocols using tecnai g2 f20
Comprehensive Microstructural Analysis of Nanofibers
To prepare the FE-SEM (field-emission scanning electron microscopy, S-4800, Hitachi) characterization, the sample is glued to the metal table with conductive glue. In addition, a TEM (transmission electron microscopy, FEI, Tecnai G2 F20) with EDX (energy dispersive X-ray) spectroscope was applied to acquire the detailed microstructure and composition. During the sample preparation, the sample was first put into an alcohol solution and ultrasonicated for about 10 min. Next, a dropper was used to draw a small amount of supernatant onto the micro-grid. Finally, the micro-grid with the sample was dried for a few minutes to evaporate alcohol.
Multimodal Analysis of Extracellular Vesicles
Transmission electron microscopy (TEM) analysis was performed by fixing EV pellets with 4% paraformaldehyde (PFA) and then by negative-staining them with 1% uranyl acetate. The equipment used for analyzing EVs mounted on the grid was Tecnai™ G2-F20 (FEI, OR, USA).
Thin Film Microstructural Analysis Protocol
The 10% perchloric acid alcohol solution was used for electrolytic polishing of scanning electron microscope (SEM, JEOL, Tokyo, Japan) samples, with voltage of 26 V, current of 0.6 A, and polishing time of 25–30 s. The boundary properties were examined by electron back-scattered diffraction (EBSD) using a JEOL JEM-7800F field emission scanning electron microscope equipped (Tokyo, Japan) with an Oxford BESD detector (Oxford, UK). The EBSD data were analyzed using CHANNL 5 software (HKL, Danbury, CT, USA).
Comprehensive Characterization of Material Properties
Quantifying Carbon Nanotube Content
Detailed Characterization of Novel Compounds
Cryo-EM Imaging of Assembled Proteins
Comprehensive Characterization of Perovskite Oxides
Characterization of ZnO Nanocrystals
Characterization of 2D MoS2 and GQDs
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