Surface plasmon resonance of silver nanoparticles was characterized using a UV-visible spectrophotometer (Shimadzu 3600 Spectrophotometer) at the resolution of 1 nm from 200 to 700 nm as given by Krishnaraj et al. [14 (link)]. After complete reduction of AgNO3 ions by the cell extract, the solution was centrifuged at 14,000 rpm for 30 minutes (SIGMA 3K30, GERMANY) to isolate Ag nanoparticle free from proteins or other bioorganic compounds present in solution. The Ag nanoparticles pellet obtained was redispersed in water and washed (centrifugation and redispersion) with distilled water for 2 times and then air-dried for characterization [15 (link)].
3600 spectrophotometer
Manufactured by Shimadzu
Sourced in United States
The Shimadzu 3600 spectrophotometer is a versatile instrument designed for the accurate measurement of absorption, transmission, and reflectance spectra. It covers a wide wavelength range from 185 to 3300 nm, allowing for analysis of a variety of samples. The 3600 model features high-resolution optics and a high-speed scanning system to provide precise and efficient data collection.
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Lab products found in correlation
Jem 2100f, by JEOL (2 mentions)
Ls 55 luminescence spectrometer, by PerkinElmer (1 mentions)
Spectrum 400, by PerkinElmer (1 mentions)
Labram hr evolution, by Horiba (1 mentions)
Cr 400, by Konica Minolta (1 mentions)
L301 printer, by Epson (1 mentions)
D5200 camera, by Nikon (1 mentions)
Vector 22 ftir spectrometer, by Bruker (1 mentions)
Avance 3 400 nmr spectrometer, by Bruker (1 mentions)
Axs system, by Bruker (1 mentions)
Jed 2300, by JEOL (1 mentions)
10 protocols using 3600 spectrophotometer
1
Characterization of Silver Nanoparticles by SPR
2
Characterization of Prepared Materials
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In order to determine the optical properties of the prepared materials, the diffuse reflectance technique has been used through UV/VIS/NIR Shimadzu 3600 spectrophotometer (Shimadzu, Columbia, MD, USA) which attached with an integrating sphere ISR-603 for measuring the solid materials. The magnetic properties of the prepared materials were measured through Vibrating Sample Magnetometer (VSM) (Micro Sense, East Lowell, MA, USA). These measurements were carried out at 300 K with vibrating sample magnetometer mode lEV9.
3
Purification and Characterization of Organic Compounds
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The required chemicals were obtained from Sigma Aldrich and Alfa Aesar. Chemicals were utilized in the reaction without further purification. Solvents used for synthesis were LR-grade solvents and were used without further purification. Solvents used in spectroscopy were of HPLC grade. Silica gel 100–200 mesh was used for column chromatography. 1H NMR and 13C NMR spectra were taken in BrukerAscent-400 spectrometer at 25 °C. 1H NMR and 13C were recorded in CDCl3 and DMSO-d6. Chemical shifts (δ) are given in ppm relative to TMS internal standard. Absorption spectra were recorded on a Shimadzu 3600 spectrophotometer. Emission spectra were recorded on a PerkinElmer LS-55 luminescence spectrometer. Samples for absorption and emission were taken in a quartz cuvette (4 ml volume).
4
Comprehensive Nanomaterial Characterization Protocol
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Imaging of the prepared samples at the nanoscale was achieved by using TEM with JEM 2100F instrument. EDX spectroscopy was performed by using an Electron Probe Micro analyzer JED 2300 instrument. XRD analysis was carried out by using a Bruker‐AXS instrument (Karlsruhe, Germany; CuKα radiation, λ=0.154 nm). FTIR spectroscopy was performed as KBr discs in the range of 425–4000 cm−1 by using a Perkin–Elmer Spectrum 400 instrument. DSC and TG analyses were carried out under nitrogen gas by using TA series Q 500 and Q 600 instruments, respectively. Raman spectroscopy measurements were performed by using a Lab RAM HR Evolution instrument (Horiba–Jobin–Yvon) equipped with a 633 ULF laser and a grating groove density of 300 grooves mm−1. UV/Vis absorption spectroscopy was performed by using the diffuse reflectance technique to measure the optical parameters of the nanomaterials by using a UV/VIS/NIR Shimadzu 3600 spectrophotometer. The spectrophotometer was equipped with an integrating sphere attachment (ISR‐603) to measure solid materials, and the thickness of the sample was 3 mm. Barium sulfate was used as the reflectance standard.
5
Evaluating Opacity and Color in Film Formulations
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Besides the important role in consumer acceptability, the opacity of the films gives information about the homogeneity of the particles dispersed in film and for any pores formed [47 (link)]. A high opacity of the films could indicate an increased number of pores filled with dispersed ingredients which reduces the light pathway. The opacity of each sample (cut in rectangular 1 cm 4 cm pieces) was obtained at 600 nm by dividing the absorbance to the film thickness described previously by [48 (link)] and follows the equation:
where is the absorbance at 600 nm, and L is the film thickness (mm).
The absorbance was read on an UV-VIS-NIR Shimadzu 3600 spectrophotometer (Tokyo, Japan).
The color profile analysis of films, lightness (L), redness (a*), yellowness (b*) were measured using a chromameter CR-400 (Konica Minolta, Tokyo, Japan).
where is the absorbance at 600 nm, and L is the film thickness (mm).
The absorbance was read on an UV-VIS-NIR Shimadzu 3600 spectrophotometer (Tokyo, Japan).
The color profile analysis of films, lightness (L), redness (a*), yellowness (b*) were measured using a chromameter CR-400 (Konica Minolta, Tokyo, Japan).
6
Multimodal Spectroscopic Analysis
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FT-IR spectra were obtained on a Nicolet 5700 spectrometer. UV-Vis absorption spectra were carried out using a Shimadzu 3600 spectrophotometer. The fluorescent spectra was recorded on a Hitachi F-4600 5J2-0004 spectrophotometer with an additional CNI (2 W) 980 nm laser. 1H and 13C nuclear magnetic resonance (NMR) spectra were recorded on a 400 MHz Bruker Advance. Electrospray ionization mass spectrometry (MS) was used on a Finnigan LCQ advantage ESI-MS. Multicolour images under sunlight and UV irradiation were taken by using a Nikon D5200 camera with an UV-IR-cut filter. The ink-jet printing was performed with an EPSON L301 printer. The excitation light source for obtaining the fluorescence images was a ZF-20D UV analyser with three types of light (254 nm, 365 nm and white light).
7
Characterization of ZnNPMIC Nanoparticles
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TEM was performed
with a Hitachi Model
H-7560 microscope. High-resolution transmission electron microscopy
was conducted on a JEM-2100F microscope. FTIR spectra were recorded
by a Bruker VECTOR-22 FTIR spectrometer over potassium bromide pellet.
NMR spectra of the samples were recorded on a Bruker AVANCE III 400
NMR spectrometer. PXRD of the product were obtained on a Japan Rigaku
DMax-γA rotation anode X-ray diffractometer equipped with graphite
monochromatized Cu Kα radiation (λ = 1.54178 Å).
UV–vis absorption spectra were obtained using a Shimadzu 3600
spectrophotometer. DLS spectra were recorded on a NanoBrook 90PLUS
PALS particle size analyzer. MS spectra were recorded on a 2DlC-MS
(Thermo Fisher Scientific LTQ) after exposing the ZnNPMIC particles
to UV light. UV light (365 nm) was provided by a ZF-7A portable UV
analyzer.
with a Hitachi Model
H-7560 microscope. High-resolution transmission electron microscopy
was conducted on a JEM-2100F microscope. FTIR spectra were recorded
by a Bruker VECTOR-22 FTIR spectrometer over potassium bromide pellet.
NMR spectra of the samples were recorded on a Bruker AVANCE III 400
NMR spectrometer. PXRD of the product were obtained on a Japan Rigaku
DMax-γA rotation anode X-ray diffractometer equipped with graphite
monochromatized Cu Kα radiation (λ = 1.54178 Å).
UV–vis absorption spectra were obtained using a Shimadzu 3600
spectrophotometer. DLS spectra were recorded on a NanoBrook 90PLUS
PALS particle size analyzer. MS spectra were recorded on a 2DlC-MS
(Thermo Fisher Scientific LTQ) after exposing the ZnNPMIC particles
to UV light. UV light (365 nm) was provided by a ZF-7A portable UV
analyzer.
8
Detailed Protocol for Compound Characterization
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All the required chemical reagents were purchased from Alfa Aesar and sigma Aldrich, and they were utilized directly without further purification. Especially, Solvents (analytical grade) were purchased from Pure chem. NMR (Nuclear Magnetic Resonance) spectra were recorded on Bruker Ascent-400 spectrometer. Chemical shifts (δ) are represented in the measure of ppm and TMS has been fixed as an internal standard. To identify the exact mass of the compound, High-Resolution Mass Spectral (HRMS) measurements were carried out in Waters – Xevo G2 – XS – Q ToF High Resolution Mass spectrometer instrument. Furthermore, fluorescence emission and absorption spectrum were recorded by PerkinElmer LS-55 luminescence spectrometer and Shimadzu 3600 spectrophotometer respectively. To evaluate the biological interaction of PDBT with CN− ions in the living cells, fluorescent live cell images were recorded in WEXWOX fluorescence microscope 3000.
9
Comprehensive Physicochemical Analysis of Materials
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To determine the crystalline structures of the prepared materials, powder X-ray diffraction technique was performed by Bruker-AXS, Karlsruhe, Germany with Cu-Kα radiation (λ = 0.154 nm). Electron Probe Micro analyzer JED 2300 (JEOL Company, Tokyo, Japan) was used to determine the different elements in the prepared materials through energy-dispersive X-ray spectroscopy technique. Thermogravimetric analyses were carried out by series Q500 of TA thermogravimetric analyzer (TA company, New Castle, PA, USA). Transmission Electron Microscopy with model JEM 2100F (JEOL Company, Tokyo, Japan) was used for imaging the prepared materials at the Nano scale. In order to identify the different kinds of the carbon species, Raman spectra were measured by Horiba-Jobin-Yvon instrument (Horiba Company, Montpellier, France) with a model Lab RAM HR Evolution equipped with a 633 ULF laser. The optical parameters of the prepared materials were measured by UV/VIS/NIR Shimadzu 3600 spectrophotometer (Shimadzu, Columbia, MD, USA) through the diffuse reflectance technique. To measure solid materials, an integrating sphere (ISR-603) was attached to the used spectrophotometer.
10
Characterization of Nanolayered Structures
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Nanolayered structures and crystalline structures of the prepared samples were identified by a Bruker-AXS system (Bruker Company, Karlsruhe, Germany) with Cu-Kα radiation for X-ray diffraction analysis (XRD). An electron probe microanalyzer JED 2300 (JEOL Company, Tokyo, Japan) was used for detecting the elements in the prepared samples through energy dispersive X-ray spectroscopy (EDX). For studying the thermal behavior of the prepared samples, thermogravimetric analyzer TA series Q500 and differential scanning calorimeter (DSC) TA series Q600 (TA company, New Castle, PA, USA) were used under the flow of nitrogen. For imaging the nanosize and morphology of the prepared materials, a transmission electron microscope (TEM) JEM 2100F (JEOL Company, Tokyo, Japan) was used with different magnifications. The optical properties were measured for the prepared samples through the diffuse reflectance technique. A UV/VIS/NIR Shimadzu 3600 spectrophotometer (Shimadzu, Columbia, MD, USA) was used for measuring the absorbance of the liquid and solid samples.
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