The sample water suspensions were dusted on the holey carbon-coated copper grids (Lacey Carbon, 300 mesh; Ted Pella, Inc.) for subsequent microanalysis. The TEM investigation was performed in the FEI Titan 80-300 Environmental TEM microscope with an objective lens corrector and the FEI Titan 80-300 S/TEM microscope at 300 kV. The S/TEM microscope was equipped with a probe spherical aberration corrector that enabled subangstrom imaging using STEM-HAADF detectors and a Bruker energy dispersive X-ray spectrometer for element analysis. For STEM-HAADF imaging, the inner and outer collection angles of the annular dark-field detector were set at 55 and 220 mrad, respectively. The STEM-HAADF images for 3D tomography were collected every 2° from −70° to +70°. The 3D reconstruction was performed using TomViz.
Titan 80 300 s tem microscope
The Titan 80-300 S/TEM microscope is an advanced electron microscope designed for high-resolution imaging, analysis, and characterization of materials. It combines scanning transmission electron microscopy (STEM) and transmission electron microscopy (TEM) capabilities in a single instrument, providing users with a versatile tool for their research and analysis needs.
Lab products found in correlation
2 protocols using titan 80 300 s tem microscope
Comprehensive Characterization of Nanomaterials
The sample water suspensions were dusted on the holey carbon-coated copper grids (Lacey Carbon, 300 mesh; Ted Pella, Inc.) for subsequent microanalysis. The TEM investigation was performed in the FEI Titan 80-300 Environmental TEM microscope with an objective lens corrector and the FEI Titan 80-300 S/TEM microscope at 300 kV. The S/TEM microscope was equipped with a probe spherical aberration corrector that enabled subangstrom imaging using STEM-HAADF detectors and a Bruker energy dispersive X-ray spectrometer for element analysis. For STEM-HAADF imaging, the inner and outer collection angles of the annular dark-field detector were set at 55 and 220 mrad, respectively. The STEM-HAADF images for 3D tomography were collected every 2° from −70° to +70°. The 3D reconstruction was performed using TomViz.
TEM Analysis of Nanopowder Morphology
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