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Titan 80 300 s tem microscope

Manufactured by Thermo Fisher Scientific

The Titan 80-300 S/TEM microscope is an advanced electron microscope designed for high-resolution imaging, analysis, and characterization of materials. It combines scanning transmission electron microscopy (STEM) and transmission electron microscopy (TEM) capabilities in a single instrument, providing users with a versatile tool for their research and analysis needs.

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2 protocols using titan 80 300 s tem microscope

1

Comprehensive Characterization of Nanomaterials

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Powder XRD of all as-prepared samples was performed on a Philips X’pert Multi-Purpose Diffractometer (MPD) (PANAlytical) equipped with Cu Kα radiation operating at 50 kV and 40 mA within the 2θ range from 5° to 75°. SEM imaging was conducted on the FEI Helios NanoLab 600i dual-beam focused ion beam precision manufacturing instrument operating at 5 kV. Before SEM imaging, a thin carbon layer (about 5 nm) was deposited on the particle surface by using a carbon coater (208C; Ted Pella, Inc.) to improve the electronic conductivity of the samples.
The sample water suspensions were dusted on the holey carbon-coated copper grids (Lacey Carbon, 300 mesh; Ted Pella, Inc.) for subsequent microanalysis. The TEM investigation was performed in the FEI Titan 80-300 Environmental TEM microscope with an objective lens corrector and the FEI Titan 80-300 S/TEM microscope at 300 kV. The S/TEM microscope was equipped with a probe spherical aberration corrector that enabled subangstrom imaging using STEM-HAADF detectors and a Bruker energy dispersive X-ray spectrometer for element analysis. For STEM-HAADF imaging, the inner and outer collection angles of the annular dark-field detector were set at 55 and 220 mrad, respectively. The STEM-HAADF images for 3D tomography were collected every 2° from −70° to +70°. The 3D reconstruction was performed using TomViz.
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2

TEM Analysis of Nanopowder Morphology

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TEM: The morphology of the materials was analyzed by transmission electron microscopy using a FEI Titan 80–300 S/TEM microscope at 300 kV accelerating voltage and a 21.5 mrad beam convergence angle. Before the measurements, the nanopowders were dispersed in ethanol, sonicated at a bath sonicator and then deposited as single droplet of suspension on a copper TEM grid covered with a thin carbon layer. Selected area electron diffraction patterns were acquired with the same instrument in TEM mode, under parallel electron beam illumination.
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