Scanning electron microscopy (SEM) was performed with Hitachi S-4800 at 5.0 kV for examining the morphologies and thicknesses of different sensors. The tapping mode AFM (Veeco Digital Instruments by Bruker Dimension D3100) was used to acquire images of GNP-CNT hybrid nanomaterials deposited on silicon wafer for thickness measurement. Structural and morphological characterization of the material was performed on a FEI Tecnai G2 F20 TEM operated at 200 kV of accelerating voltage. The two ends of the sensor were mounted on a customized micrometer moving stage, and the sensing film can be bent and stretched by moving the stage closer. Electrical properties of the sensor were collected by a source measurement unit (SMU) instrument (Keithley 2400).
Dimension d3100
Manufactured by Bruker
Sourced in United States
The Dimension D3100 is an atomic force microscope (AFM) designed for high-resolution imaging and sample characterization. It provides nanoscale surface topography and material property data. The core function of the Dimension D3100 is to enable the acquisition of detailed surface information without interpretation or extrapolation.
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Lab products found in correlation
2 protocols using dimension d3100
1
Morphology and Thickness Analysis of Hybrid Sensors
2
Nanoindentation with AFM Methodology
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Nanoindentation (NI) experiments were performed using a Hysitron Triboscope (Hysitron, Minneapolis, USA), an add-on instrument mounted on the scanner unit of a Dimension D3100 (Bruker Inc., Billerica, USA) AFM. The tests were performed in load-controlled mode. Data acquisition was done using the Triboscope 4.1.0 software package. All tests were performed using a conical diamond tip with an average tip radius of 4.81 mm and an opening angle of 601.
The load schedule was adapted for NI so that the indentation depths would scale with the tip radius of the AFM-NI tests. The loading times were the same, but the forces were increased accordingly, leading to a maximum force of 3.8 mN and the constant force to determine the viscoelastic properties was 1 mN. The part with the maximum force, to induce plasticity, was performed in open loop, while the constant force regime was done in closed loop. The evaluation was performed in the same manner as described in Sections 2.4 and 2.6 for AFM-NI.
The load schedule was adapted for NI so that the indentation depths would scale with the tip radius of the AFM-NI tests. The loading times were the same, but the forces were increased accordingly, leading to a maximum force of 3.8 mN and the constant force to determine the viscoelastic properties was 1 mN. The part with the maximum force, to induce plasticity, was performed in open loop, while the constant force regime was done in closed loop. The evaluation was performed in the same manner as described in Sections 2.4 and 2.6 for AFM-NI.
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